Methods to perform backscatter inspection of complex targets in confined spaces
View Patent ↗Embodiments of backscatter inspection systems include features to enable inspection of irregular surfaces, tight spacer, and other hard-to-reach places. Some embodiments include arms that maneuver a scan head with at least three degrees of freedom, and some embodiments include arms that maneuver a scan head with at least seven degrees of freedom. Some embodiments include proximity detectors on a scan head or base, detect contact with an object being inspected, and to slow or stop the motion of the system accordingly. Some compact embodiments scan the interior of an object from within, and include a rotating, low-energy source of penetrating radiation, and at least one backscatter detector, which may be stationary, or may rotate with the source.
1. A movable backscatter inspection system for interrogating an object, the system comprising:
a movable base;
a source of a pencil beam of penetrating radiation, the source having an axis of emission and coupled to the base;
a scan head coupled to the base, the scan head comprising at least one detector at a location not on the axis of emission and oriented to receive penetrating radiation scattered by the object; and
a proximity sensor coupled to the base, and arranged to detect a predefined separation between the location and the object,the proximity sensor comprising:
one of an acoustic sensor, mechanical sensor, or other contact sensor; and
a bumper coupled to a mechanical sensor or other contact sensor.
2. The movable backscatter inspection system of claim 1 further comprising an indicator for alerting an operator when the predefined separation is detected, the indictor comprising at least one of a visual indicator and an audio indicator.
3. The movable backscatter inspection system of claim 1 further comprising brakes for slowing the motion of the base when the predefined separation is detected.
4. The movable backscatter inspection system of claim 1 further comprising brakes for stopping the motion of the base when the predefined separation is detected.
5. The movable backscatter inspection system of claim 1 , the proximity sensor comprising a plurality of acoustic sensors.
6. A movable backscatter inspection system for interrogating an object, the detector comprising:
a movable base;
a source of a pencil beam of penetrating radiation, the source having an axis of emission and coupled to the base;
a scan head coupled to the base, the scan head comprising at least one detector at a location not on the axis of emission and oriented to receive penetrating radiation scattered by the object; and
a proximity sensor coupled to the base, and arranged to detect a predefined separation between the location and the object, the at least one proximity sensor comprising a bumper coupled to a mechanical sensor or other contact sensor.
7. The movable backscatter inspection system of claim 6 , the proximity sensor comprising one of an acoustic sensor, mechanical sensor, or other contact sensor.
8. The movable backscatter inspection system of claim 6 , the proximity sensor comprising an infrared sensor.
9. The movable backscatter inspection system of claim 6 , the proximity sensor comprising an ultrasonic sensor.
10. The movable backscatter inspection system of claim 6 , the proximity sensor comprising a capacitive sensor.
11. The movable backscatter inspection system of claim 6 further comprising an indicator for alerting an operator when the predefined separation is detected, the indictor comprising at least one of a visual indicator and an audio indicator.
12. The movable backscatter inspection system of claim 6 further comprising brakes for slowing the motion of the base when the predefined separation is detected.
13. The movable backscatter inspection system of claim 6 further comprising brakes for stopping the motion of the base when the predefined separation is detected.
14. The movable backscatter inspection system of claim 6 , the proximity sensor comprising a plurality of acoustic sensors.