IP Library Granted Patent US 8,780,362
Granted Patent B2
US 8,780,362 · App. 13/448,429 · Granted Jul 15, 2014

Methods utilizing triangulation in metrology systems for in-situ surgical applications

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Quick Facts
Patent No.
US 8,780,362
App. No.
13/448,429
Granted
Jul 15, 2014
Kind
B2
Abstract

A first metrology method includes the steps of projecting a first image and a second image, aligning the first image and the second image to form an aligned image of a known size, and determining a dimension of a target object by comparing the aligned image to the target object. A second metrology method includes the steps of projecting a first image and a second image, aligning the first image and the second image to form an aligned image of a known size by synchronously adjusting a zoom factor for projecting the first image and an angle for projecting the second image, and determining a dimension of a target object by comparing the aligned image to the target object.

Claims (18)

1. A metrology method comprising:

projecting a first image and a second image on a target site;

aligning the first image and the second image to form an aligned image of a known size; and

determining a dimension of a target object by visually comparing the aligned image with the target object.

2. A method as in claim 1 , wherein the aligned image includes aligned circles.

3. A method as in claim 2 , wherein determining the dimension of the target object by visually comparing the aligned image with the target object includes counting a number of the aligned circles encompassed by the target object.

4. A method as in claim 1 , wherein the aligned image includes a single point aligned with a center point of a circle.

5. A method as in claim 1 , wherein at least one of the first image and the second image is projected on the target site by a point source projector.

6. A method as in claim 1 , wherein a single beam is split to project the first image and the second image.

7. A method as in claim 1 , wherein the first and second images are projected by two projectors.

8. A metrology method comprising:

projecting a first image and a second image on a target site;

aligning the first image and the second image to form an aligned image of a known size by synchronously adjusting a zoom factor for projecting the first image and an angle for projecting the second image; and

determining a dimension of a target object by counting uniformly spaced markings of the aligned image encompassed by the target object.

9. A method as in claim 8 , wherein the aligned image includes aligned circles.

10. A method as in claim 8 , wherein the aligned image includes a single point aligned with a center point of a circle.

11. A method as in claim 8 , wherein at least one of the first image and the second image is projected on the target site by a point source projector.

12. A method as in claim 8 , wherein a single beam is split to project the first image and the second image.

Assignments (2)
CHANGE OF NAME Recorded Oct 2, 2012
From: TYCO HEALTHCARE GROUP LP
To: COVIDIEN LP
Reel/Frame 029065/0448 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 17, 2012
From: SHARONOV, ALEXEY; PINTO, CANDIDO DIONISIO
To: TYCO HEALTHCARE GROUP LP
Reel/Frame 028055/0022 →