IP Library Granted Patent US 8,710,862
Granted Patent B2
US 8,710,862 · App. 13/455,691 · Granted Apr 29, 2014

Programming of DIMM termination resistance values

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Quick Facts
Patent No.
US 8,710,862
App. No.
13/455,691
Granted
Apr 29, 2014
Kind
B2
Abstract

Systems, methods, and apparatus, including computer program products, for providing termination resistance in a memory module are provided. An apparatus is provided that includes a plurality of memory circuits; an interface circuit operable to communicate with the plurality of memory circuits and to communicate with a memory controller; and a transmission line electrically coupling the interface circuit to a memory controller, wherein the interface circuit is operable to terminate the transmission line with a single termination resistance that is selected based on a plurality of resistance-setting commands received from the memory controller.

Claims (67)

1. A memory subsystem comprising:

a memory module comprising:

a first rank of memory circuits comprising a first plurality of memory circuits; and

a second rank of memory circuits comprising a second plurality of memory circuits;

an interface circuit;

a first transmission line electrically coupling the interface circuit to a first memory circuit of the first plurality of memory circuits of the first rank; and

a second transmission line electrically coupling the interface circuit to a second memory circuit of the second plurality of memory circuits of the second rank;

wherein the interface circuit is operable to:

present the first and the second ranks of memory circuits to a memory controller as a single rank of emulated memory circuits;

terminate one or more of the first transmission line with the first termination resistance or the second transmission line with the second termination resistance, wherein the first termination resistance and the second termination resistance are each selected based on at least a resistance-setting command for the single rank of emulated memory circuits received from the memory controller, and

wherein the first termination resistance or the second termination resistance is different from a termination resistance indicated by the resistance-setting command received from the memory controller.

2. The memory subsystem of claim 1 , further comprising:

a third transmission line electrically coupling the interface circuit to the memory controller;

the interface circuit further comprising a third termination resistor with a third termination resistance;

wherein the interface circuit is further operable to terminate the third transmission line with the third termination resistance, wherein the third termination resistance is selected based on one or more resistance-setting commands received from the memory controller.

3. The memory subsystem of claim 1 , wherein one or more of the first termination resistor or the second termination resistor is activated in response to one or more transmission line termination control signals issued by the interface circuit.

4. The memory subsystem of claim 1 , wherein the first and the second termination resistors are on-die termination (ODT) resistors.

5. The memory subsystem of claim 2 , wherein the third termination resistance is different from a termination resistance indicated by the plurality of resistance-setting commands received from the memory controller.

6. The memory subsystem of claim 1 , wherein the interface circuit selects the first termination resistance and the second termination resistance from one or more look-up tables.

7. The memory subsystem of claim 1 , wherein the resistance-setting command received from the memory controller comprises a mode register set (MRS) command.

8. The memory subsystem of claim 1 , wherein resistance values of the first and the second termination resistors during read operations are different from resistance values of the first and the second termination resistors during write operations.

9. The memory subsystem of claim 1 , wherein the interface circuit is located on the memory module.

10. A memory subsystem comprising:

a memory module comprising:

a first rank of memory circuits comprising a first plurality of memory circuits; and

a second rank of memory circuits comprising a second plurality of memory circuits;

an interface circuit;

a first transmission line electrically coupling the interface circuit to a first memory circuit of the first plurality of memory circuits of the first rank; and

a second transmission line electrically coupling the interface circuit to a second memory circuit of the second plurality of memory circuits of the second rank;

wherein the interface circuit is operable to:

present the first and the second ranks of memory circuits to a memory controller as a single rank of emulated memory circuits;

terminate one or more of the first transmission line with the first termination resistance or the second transmission line with the second termination resistance, wherein the first termination resistance and the second termination resistance are each selected based on at least a resistance-setting command for the single rank of emulated memory circuits received from the memory controller; and

select the first termination resistance and the second termination resistance from one or more look-up tables.

11. The memory subsystem of claim 10 , further comprising:

a third transmission line electrically coupling the interface circuit to the memory controller;

the interface circuit further comprising a third termination resistor with a third termination resistance;

wherein the interface circuit is further operable to terminate the third transmission line with the third termination resistance, wherein the third termination resistance is selected based on one or more resistance-setting commands received from the memory controller.

12. The memory subsystem of claim 11 , wherein the third termination resistance is different from a termination resistance indicated by the plurality of resistance-setting commands received from the memory controller.

13. The memory subsystem of claim 10 , wherein one or more of the first termination resistor or the second termination resistor is activated in response to one or more transmission line termination control signals issued by the interface circuit.

14. The memory subsystem of claim 10 , wherein the first and the second termination resistors are on-die termination (ODT) resistors.

15. The memory subsystem of claim 10 , wherein the resistance-setting command received from the memory controller comprises a mode register set (MRS) command.

16. The memory subsystem of claim 10 , wherein the interface circuit is located on the memory module.

17. The memory subsystem of claim 10 , wherein the first termination resistance or the second termination resistance is different from a termination resistance indicated by the resistance-setting command received from the memory controller.

18. The memory subsystem of claim 10 , wherein resistance values of the first and the second termination resistors during read operations are different from resistance values of the first and the second termination resistors during write operations.

19. A memory subsystem comprising:

a memory module comprising:

a first rank of memory circuits comprising a first plurality of memory circuits; and

a second rank of memory circuits comprising a second plurality of memory circuits;

an interface circuit;

a first transmission line electrically coupling the interface circuit to a first memory circuit of the first plurality of memory circuits of the first rank; and

a second transmission line electrically coupling the interface circuit to a second memory circuit of the second plurality of memory circuits of the second rank;

wherein the interface circuit is operable to:

present the first and the second ranks of memory circuits to a memory controller as a single rank of emulated memory circuits;

terminate one or more of the first transmission line with the first termination resistance or the second transmission line with the second termination resistance, wherein the first termination resistance and the second termination resistance are each selected based on at least a resistance-setting command for the single rank of emulated memory circuits received from the memory controller;

select first resistance values of the first and the second termination resistors for read operations; and

select second, different resistance values of the first and the second termination resistors for write operations.

20. The memory subsystem of claim 19 , further comprising:

a third transmission line electrically coupling the interface circuit to the memory controller;

the interface circuit further comprising a third termination resistor with a third termination resistance;

wherein the interface circuit is further operable to terminate the third transmission line with the third termination resistance, wherein the third termination resistance is selected based on one or more resistance-setting commands received from the memory controller.

21. The memory subsystem of claim 20 , wherein the third termination resistance is different from a termination resistance indicated by the plurality of resistance-setting commands received from the memory controller.

22. The memory subsystem of claim 19 , wherein one or more of the first termination resistor or the second termination resistor is activated in response to one or more transmission line termination control signals issued by the interface circuit.

23. The memory subsystem of claim 19 , wherein the first and the second termination resistors are on-die termination (ODT) resistors.

24. The memory subsystem of claim 19 , wherein the resistance-setting command received from the memory controller comprises a mode register set (MRS) command.

25. The memory subsystem of claim 19 , wherein the interface circuit is located on the memory module.

26. The memory subsystem of claim 19 , wherein the first termination resistance or the second termination resistance is different from a termination resistance indicated by the resistance-setting command received from the memory controller.

27. The memory subsystem of claim 19 , wherein the interface circuit selects the first termination resistance and the second termination resistance from one or more look-up tables.

Assignments (3)
CHANGE OF NAME Recorded Oct 6, 2017
From: GOOGLE INC.
To: GOOGLE LLC
Reel/Frame 044141/0827 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 27, 2012
From: FEROLITO, PHILIP ARNOLD; ROSENBAND, DANIEL L.; WANG, DAVID T.; SMITH, MICHAEL JOHN
To: METARAM, INC.
Reel/Frame 028453/0979 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 27, 2012
From: METARAM, INC.
To: GOOGLE INC.
Reel/Frame 028454/0027 →