IP Library Granted Patent US 9,126,170
Granted Patent B2
US 9,126,170 · App. 13/456,448 · Granted Sep 8, 2015

Microwire-controlled autoclave and method

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,126,170
App. No.
13/456,448
Granted
Sep 8, 2015
Kind
B2
Abstract

Improved treatment apparatus ( 120, 152 ) is provided for the treatment (e.g., molding, heating and/or curing) of objects such as parts or part precursors ( 148, 170 ) including wireless detection of a temperature parameter related to the objects during treatment thereof. The objects include associated microwire-type sensors ( 150, 174 ) which have characteristic re-magnetization responses under the influence of applied, alternating magnetic fields. The apparatus ( 120, 152 ) have treatment chambers ( 122, 153 ) sized to hold the objects to be treated, with one or more antennas ( 132, 124, 166 ) proximal to such objects and operable to generate interrogating alternating magnetic fields and to detect the responses of the sensors ( 150, 174 ). The detected temperature parameter information is used by an apparatus controller ( 146 ) to maintain desired ambient conditions within the treatment chamber ( 122, 153 ).

Claims (9)

1. A method of measuring the temperature of an object using a temperature sensor operably coupled with said object, said sensor including a plurality of magnetically susceptible microwire temperature sensing elements each having a temperature-sensitive re-magnetization response under the influence of an applied magnetic field, wherein each re-magnetization response is defined by at least one short, detectible pulse of magnetic field perturbation of defined duration which is correlated with the temperature of said object and is different below and above at least one set point temperature below about 400° C., at least certain of the sensing elements having a different set point temperature than other of the sensing elements, and wherein said detectible pulses change in detectible properties through a range of temperatures below the respective Curie Temperatures of said sensing elements, said method comprising the steps of:

generating an alternating magnetic field in the region of the temperature sensor;

detecting a first re-magnetization response of a first sensing element from said plurality of sensing elements as a first voltage pulse, and detecting a second re-magnetization response of a second sensing element from said plurality of sensing elements, as a second voltage pulse, and integrating the first and second voltage pulses over the elapsed time thereof to generate first and second detected values, and

determining the temperature of said object by using said first and second detected values.

2. The method of claim 1 , said set point temperatures of said first and second sensing elements being the Curie of Temperatures thereof.

3. A method of measuring the temperature of an object using a temperature sensor operably coupled with said object, said sensor including first and second magnetically susceptible microwire temperature sensing elements each having a re-magnetization response under the influence of an applied magnetic field, wherein each re-magnetization response is defined by at least one short, detectible pulse of magnetic field perturbation of defined duration and being different below and above at least one set point temperature below about 400° C., and wherein said detectible pulses change in detectible properties through a range of temperatures below the Curie Temperatures of said sensing elements, said method comprising the steps of:

generating an alternating magnetic field in the region of said first and second temperature sensing elements;

detecting a first re-magnetization response of said first sensing element as a first voltage pulse, detecting a second re-magnetization response of said second sensing element as a second voltage pulse, and integrating said first and second voltage pulses over the elapsed times thereof to generate first and second detected values; and

determining the temperature of said object by using said first and second detected values.

Assignments (2)
SECURITY INTEREST Recorded Mar 10, 2016
From: TSI TECHNOLOGIES LLC
To: MICROWIRE, LLC
Reel/Frame 037949/0799 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 10, 2012
From: CLOTHIER, BRIAN L.
To: TSI TECHNOLOGIES LLC
Reel/Frame 028190/0778 →