IP Library Granted Patent US 9,241,678
Granted Patent B2
US 9,241,678 · App. 13/467,090 · Granted Jan 26, 2016

Random estimation in positron emission tomography with tangential time-of-flight mask

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,241,678
App. No.
13/467,090
Granted
Jan 26, 2016
Kind
B2
Abstract

A method of estimating random events in positron emission tomography list mode data, including obtaining time-of-flight (TOF) list mode count data that includes TOF information; converting the obtained TOF list mode count data into four-dimensional (4D) raw sinogram count data, without using the TOF information, wherein the 4D raw sinogram count data includes random count values; interpolating the 4D raw sinogram count data to generate 4D interpolated sinogram count data; low-pass filtering the 4D interpolated sinogram count data to remove noise; converting the low-pass filtered 4D interpolated sinogram count data into filtered 4D raw sinogram count data; and generating, by a processor, five-dimensional (5D) TOF raw sinogram count data from the filtered 4D raw sinogram count data by effectively applying a TOF mask filter to the filtered 4D raw sinogram count data.

Claims (106)

1. A method of estimating random events in positron emission tomography (PET) list mode data for improved reconstruction of a PET image, the method comprising:

obtaining time-of-flight (TOF) list mode count data that includes TOF information;

converting the obtained TOF list mode count data into four-dimensional (4D) non-TOF raw sinogram count data, without using the TOF information, wherein the 4D non-TOF raw sinogram count data includes random count values;

interpolating the 4D non-TOF raw sinogram count data to generate 4D non-TOF interpolated sinogram count data;

low-pass filtering the 4D non-TOF interpolated sinogram count data to remove noise;

converting the low-pass filtered 4D non-TOF interpolated sinogram count data into filtered 4D non-TOF raw sinogram count data;

generating, by a processing circuit, five-dimensional (5D) TOF raw sinogram count data from the filtered 4D non-TOF raw sinogram count data; and

reconstructing, by the processing circuit, the PET image using the 5D TOF raw sinogram count data.

2. The method of claim 1 , wherein the generating step comprises:

generating the 5D TOF raw sinogram count data {circumflex over (r)}(rad, phi, slice, t) at each TOF bin t according to the following equation:

r

^

(

ra

d

,

phi

,

slice

,

t

)

=

t

binsz

t

coin

cos

θ

r

(

ra

d

,

phi

,

slice

)

wherein t coin is a size of a coincidence window in mm, t binsz a TOF bin size in mm, {circumflex over (r)}(rad, phi, slice) is filtered 4D non-TOF raw sinogram random count data, (rad,phi,slice) are coordinates of a line-of-response (LOR) in the raw sinogram space, and θ is an oblique angle of the LOR.

3. The method of claim 1 , wherein the obtaining step comprises:

obtaining the TOF list mode data, which for each coincident event, has a format {x a , z a , x b , z b , e a , e b , tof}, wherein x a , x b are incident transverse crystal numbers of events a and b, respectively; z a , z b are incident axial crystal numbers of events a and b, respectively; and e a , e b are energy levels of events a and b, respectively, and tof is an arrival time difference of events a and b.

4. The method of claim 1 , further comprising:

estimating the random count values within the 4D non-TOF raw sinogram count data using a delayed coincidence window method.

5. An apparatus for estimating random events in positron emission tomography (PET) list mode data for improved reconstruction of a PET image, the apparatus comprising:

a memory storing time-of-flight (TOF) list mode count data that includes TOF information; and

a processor configured to

convert the stored TOF list mode count data into four-dimensional (4D) non-TOF raw sinogram count data, without using the TOF information, wherein the 4D non-TOF raw sinogram count data includes random count values;

interpolate the 4D non-TOF raw sinogram count data to generate 4D non-TOF interpolated sinogram count data;

low-pass filter the 4D non-TOF interpolated sinogram count data to remove noise;

convert the low-pass filtered 4D non-TOF interpolated sinogram count data into filtered 4D non-TOF raw sinogram count data;

generate five-dimensional (5D) TOF raw sinogram count data from the filtered 4D non-TOF raw sinogram count data; and

reconstruct the PET image using the 5D TOF raw sinogram count data.

6. The apparatus of claim 5 , wherein the processor is further configured to:

generate the 5D TOF raw sinogram count data {circumflex over (r)}(rad, phi, slice, t) at each TOF bin t according to the following equation:

r

^

(

ra

d

,

phi

,

slice

,

t

)

=

t

binsz

t

coin

cos

θ

r

(

ra

d

,

phi

,

slice

)

wherein t coin is a size of a coincidence window in mm, t binsz is a TOF bin size in mm, {circumflex over (r)}(rad, phi, slice) is filtered 4D non-TOF raw sinogram random count data, (rad,phi,slice) are coordinates of a line-of-response (LOR) in the raw sinogram space, and θ is an oblique angle of the LOR.

7. The method of claim 5 , wherein the memory stores the TOF list mode data, which for each coincident event, has a format {x a , z a , x b , z b , e a , e b , tof}, wherein x a , x b are incident transverse crystal numbers of events a and b, respectively; z a , z b are incident axial crystal numbers of events a and b, respectively; and e a , e b are energy levels of events a and b, respectively, and tof is an arrival time difference of events a and b.

8. The method of claim 5 , wherein the processor is further configured to:

estimate the random count values within the 4D non-TOF raw sinogram count data using a delayed coincidence window method.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 31, 2016
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEDICAL SYSTEMS CORPORATION
Reel/Frame 038891/0693 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 9, 2012
From: NIU, XIAOFENG; WANG, WENLI
To: KABUSHIKI KAISHA TOSHIBA; TOSHIBA MEDICAL SYSTEMS CORPORATION
Reel/Frame 028178/0731 →