IP Library Patent Application 13471519
Patent Application
App. No. 13/471,519

CHARACTERIZING A TEXTURE OF AN IMAGE

Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US None
App. No.
13/471,519
Abstract

Among other things, a texture of an image is characterized by deriving lacunarity measures from the image based on a wavelet analysis.

Claims (9)

1 . A machine-based method comprising:

deriving local densities of wavelet maxima based on a wavelet maxima representation for an image, the local densities being derived for multiple areas of image; and

using the local densities of the wavelet maxima in analyzing a texture of the image.

2 . A machine-based method comprising:

analyzing a probability distribution of a density of wavelet maxima based on a wavelet maxima representation of an image; and

using the probability distribution in analyzing a texture of the image.

3 . A machine-based method comprising:

deriving lacunarity measures based on an analysis of wavelet maxima in a wavelet maxima representation of an image; and

training a classifier based on the derived lacunarity measures, the classifier being trained for use in classifying images.

Assignments (3)
CHANGE OF NAME Recorded Jun 30, 2016
From: MELA SCIENCES, INC.
To: STRATA SKIN SCIENCES, INC.
Reel/Frame 039219/0505 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 1, 2012
From: BOGDAN, ALEXANDRU
To: ELECTRO-OPTICAL SCIENCES, INC.
Reel/Frame 029223/0664 →
CHANGE OF NAME Recorded Nov 1, 2012
From: ELECTRO-OPTICAL SCIENCES, INC.
To: MELA SCIENCES, INC.
Reel/Frame 029228/0196 →