Methods, devices and systems for characterizing polarities of piezoelectric (PZT) elements of a two PZT element microactuator

1. A method for characterizing polarities of piezoelectric (PZT) elements of a two PZT element microactuator mechanically coupled to a structure, comprising:

calculating an impedance of the two PZT element microactuator over a predetermined frequency range; and

characterizing the polarity of each PZT element of the two PZT element microactuator based on the calculated impedance over the frequency range.

2. The method of claim 1 , further comprising determining a presence of a plurality of substantial peaks above a noise level in the calculated impedance over the frequency range, at least some of the plurality of substantial peaks occurring at frequencies corresponding to mechanical resonance modes of the structure.

3. The method of claim 2 , wherein characterizing comprises determining that the polarities of the PZT elements of the two PZT element microactuator are different if the plurality of substantial peaks is determined to be present.

4. The method of claim 2 , wherein characterizing comprises determining that the polarities of the PZT elements of the two PZT element microactuator are the same if the plurality of substantial peaks is determined not to be present.

5. The method of claim 1 , wherein the structure comprises a suspension of a head gimbal assembly of a disk drive.

6. The method of claim 1 , wherein the structure comprises a head gimbal assembly (HGA) of a disk drive.

7. The method of claim 1 , wherein the structure comprises a head stack assembly (HSA) of a disk drive.

8. A method for characterizing polarities of piezoelectric (PZT) elements of a two-PZT element microactuator mechanically coupled to a structure, comprising:

calculating an impedance of the two PZT element microactuator over a predetermined frequency range;

summing the calculated impedance over the predetermined frequency range;

characterizing the polarities of the PZT elements of the two PZT element microactuator as being different if the summed impedance is greater than a threshold value and as being the same if the summed impedance is less than or equal to the threshold value.

9. The method of claim 8 , wherein the structure comprises a suspension of a head gimbal assembly of a disk drive.

10. The method of claim 8 , wherein the structure comprises a head gimbal assembly (HGA) of a disk drive.

11. The method of claim 8 , wherein the structure comprises a head stack assembly (HSA) of a disk drive.

12. The method of claim 8 , wherein the threshold value is between a highest value of a distribution of summed impedances for two PZT element microactuators having been characterized as being of the same polarity and a lowest value of a distribution of summed impedances for two PZT element microactuators having been characterized as being of different polarities.

13. The method of claim 8 , wherein the threshold value is an average of a three standard deviations highest value of a distribution of summed impedances for two PZT element microactuators having been characterized as being of the same polarity and a three standard deviation lowest value of summed impedances for two PZT element microactuators having been characterized as being of different polarities.

14. A device to determine polarities of piezoelectric (PZT) elements of a two PZT element microactuator mechanically coupled to a structure, comprising:

a voltage applying module configured to apply a predetermined voltage to the two PZT element microactuator over a frequency range;

a current detecting module configured to detect a current flowing through the two PZT element microactuator as a result of the applied predetermined voltage; and

a processor, configured to:

calculate an impedance from the applied predetermined voltage and the detected current; and

characterize polarities of the PZT elements of the two PZT element microactuator based on the calculated impedance over the frequency range.

15. The device of claim 14 , wherein the structure comprises a suspension of a head gimbal assembly of a disk drive.

16. The device of claim 14 , wherein the structure comprises a head gimbal assembly (HGA) of a disk drive.

17. The device of claim 14 , wherein the structure comprises a head stack assembly (HSA) of a disk drive.

18. The device of claim 14 , wherein the processor is further configured to characterize the polarities by:

summing the calculated impedance over the predetermined frequency range; and

characterizing the polarities of the PZT elements of the two PZT element microactuator as being different if the summed impedance is greater than a threshold value and as being the same if the summed impedance is less than or equal to the threshold value.

19. The device of claim 18 , wherein the threshold value is between a highest value of a distribution of summed impedances for two PZT element microactuators having been characterized as being of the same polarity and a lowest value of a distribution of summed impedances for two PZT element microactuators having been characterized as being of different polarities.

20. The device of claim 18 , wherein the threshold value is an average of a three standard deviations highest value of a distribution of summed impedances for two PZT element microactuators having been characterized as being of the same polarity and a three standard deviation lowest value of summed impedances for two PZT element microactuators having been characterized as being of different polarities.