IP Library Granted Patent US 9,214,283
Granted Patent B2
US 9,214,283 · App. 13/488,999 · Granted Dec 15, 2015

Multilayer capacitor and method of manufacturing same

Inventor: Masaaki Togashi (Tokyo, JP)
Assignee: TDK CORPORATION
H01G4/30H01G4/012H01G4/232Y10T29/417
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Quick Facts
Patent No.
US 9,214,283
App. No.
13/488,999
Granted
Dec 15, 2015
Kind
B2
Abstract

In a multilayer capacitor 1 , burned layers 17 A, 17 B are formed so as to cover all of lead conductors 12 A, 12 B drawn from inner electrodes 6 A, 6 B to end faces of a multilayer body 2 . This can keep a plating solution from infiltrating onto the inner electrodes 6 A, 6 B when forming plating layers 18 A, 18 B and prevent insulation failures from occurring. Since the burned layers 17 A, 17 B cover a part of dummy electrodes 13 C, 13 F, 13 G, 13 H, the area of the burned layers 17 A, 17 B can be suppressed. This can inhibit excessive stresses from occurring in the burned layers 17 A, 17 B and thus can prevent cracks from being generated by stresses in the burned layers 17 A, 17 B.

Claims (39)

1. A multilayer capacitor comprising:

a multilayer body constructed by stacking a plurality of dielectric layers formed with an inner electrode;

a terminal electrode formed on a surface of the multilayer body;

a lead conductor drawn from the inner electrode to the surface of the multilayer body and connected to the terminal electrode; and

a dummy electrode separated from the inner electrode and connected to the terminal electrode;

wherein the terminal electrode has a burned layer and a plating layer each formed on the surface of the multilayer body;

wherein the burned layer covers the whole of the lead conductor and a part of the dummy electrode, in a direction along a periphery of the dielectric layer, and does not cover the rest of the dummy electrode;

wherein the plating layer covers the rest of the dummy electrode and the burned layer; and

wherein the dummy electrode is disposed on the same dielectric layer with the inner electrode corresponding thereto.

2. A multilayer capacitor according to claim 1 , wherein one side of the multilayer body is a mount surface to a substrate; and

wherein the inner electrode in the multilayer body is lopsided to the side opposite from the mount surface in the multilayer body.

3. A multilayer capacitor according to claim 2 , wherein the inner electrode is arranged substantially orthogonal to the mount surface.

4. A multilayer capacitor according to claim 1 , wherein dummy electrodes are disposed on both sides of the lead conductor interposed therebetween; and

wherein the burned layer is disposed so as to connect the dummy electrodes to each other.

5. A multilayer capacitor according to claim 2 , wherein dummy electrodes are disposed on both sides of the lead conductor interposed therebetween; and

wherein the burned layer is disposed so as to connect the dummy electrodes to each other.

6. A multilayer capacitor according to claim 3 , wherein dummy electrodes are disposed on both sides of the lead conductor interposed therebetween; and

wherein the burned layer is disposed so as to connect the dummy electrodes to each other.

7. A multilayer capacitor according to claim 4 , wherein the dummy electrodes are disposed on the same layer with the inner electrode corresponding thereto.

8. A multilayer capacitor according to claim 5 , wherein the dummy electrodes are disposed on the same layer with the inner electrode corresponding thereto.

9. A multilayer capacitor according to claim 6 , wherein the dummy electrodes are disposed on the same layer with the inner electrode corresponding thereto.

10. A multilayer capacitor according to claim 1 , wherein the dummy electrode is exposed at a region of the multilayer body excluding a corner thereof.

11. A multilayer capacitor according to claim 2 , wherein the dummy electrode is exposed at a region of the multilayer body excluding a corner thereof.

12. A multilayer capacitor according to claim 3 , wherein the dummy electrode is exposed at a region of the multilayer body excluding a corner thereof.

13. A multilayer capacitor according to claim 4 , wherein the dummy electrodes are exposed at a region of the multilayer body excluding a corner thereof.

14. A multilayer capacitor according to claim 5 , wherein the dummy electrodes are exposed at a region of the multilayer body excluding a corner thereof.

15. A multilayer capacitor according to claim 6 , wherein the dummy electrodes are exposed at a region of the multilayer body excluding a corner thereof.

16. A multilayer capacitor according to claim 1 , wherein the dummy electrode is exposed at a region of the multilayer body excluding a corner thereof.

17. A multilayer capacitor according to claim 7 , wherein the dummy electrodes are exposed at a region of the multilayer body excluding a corner thereof.

18. A multilayer capacitor according to claim 8 , wherein the dummy electrodes are exposed at a region of the multilayer body excluding a corner thereof.

19. A multilayer capacitor according to claim 9 , wherein the dummy electrodes are exposed at a region of the multilayer body excluding a corner thereof.

20. A method of manufacturing a multilayer capacitor comprising:

a multilayer body constructed by stacking a plurality of dielectric layers formed with an inner electrode;

a terminal electrode formed on a surface of the multilayer body;

a lead conductor drawn from the inner electrode to the surface of the multilayer body and connected to the terminal electrode; and

a dummy electrode separated from the inner electrode and connected to the terminal electrode, the dummy electrode being disposed on the same dielectric layer with the inner electrode corresponding thereto;

the method comprising the steps of:

forming a burned layer by burning a conductive paste applied so as to cover the whole of the lead conductor and a part of the dummy electrode, in a direction along a periphery of the dielectric layer, and not covering the rest of the dummy electrode; and

forming a plating layer on the surface of the multilayer body so as to cover the rest of the dummy electrode and the burned layer.

Assignments (2)
CHANGE OF ADDRESS Recorded Jun 12, 2013
From: TDK CORPORATION
To: TDK CORPORATION
Reel/Frame 030651/0687 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 5, 2012
From: TOGASHI, MASAAKI
To: TDK CORPORATION
Reel/Frame 028352/0851 →
Priority Claims (1)
JP 2011-131163 · Jun 13, 2011 · national
Continuity (1)
Related Publication 20120314338A1 · Dec 13, 2012