Semiconductor integrated circuit and method of retrieving signal to semiconductor integrated circuit

1. A semiconductor integrated circuit configured so that a transition scan test can be performed thereon, comprising:

a plurality of logic circuit blocks having different operation frequencies;

a clock supply unit for supplying a plurality of clock signals having frequencies corresponding to the operation frequencies of the logic circuit blocks from a clock supply source;

a compression scan circuit including a plurality of scan chains formed of a plurality of flip-flop circuits, a pattern deployment circuit connected to the scan chains on an input side thereof, and a pattern compression circuit; and

a clock control unit for controlling the clock supply unit to stop supplying the clock signals to specific ones of the flip-flop circuits of the scan chains when a capture operation is performed during a transition scan test,

wherein said clock control unit includes a clock control flip-flop circuit so that the clock control unit controls the clock supply unit to stop supplying the clock signals to the specific ones of the flip-flop circuits according to a first specific value set to the clock control flip-flop circuit.

2. The semiconductor integrated circuit according to claim 1 , wherein said flip-flop circuits are configured to operate when the flip-flop circuits receive the clock signals corresponding to the operation frequencies of the logic circuit blocks from the clock supply unit.

3. The semiconductor integrated circuit according to claim 1 , wherein said flip-flop circuits include a first flip-flop circuit disposed at a front stage and a second flip-flop circuit disposed at a later stage, said first flip-flop circuit having a data output terminal connected to a scan data input terminal of the second flip-flop circuit so that it is possible to switch between the capture operation and a scan shift operation.

4. The semiconductor integrated circuit according to claim 1 , wherein said flip-flop circuits include a first flip-flop circuit having a data output terminal connected to a signal input terminal of one of the logic circuit blocks, and a second flip-flop circuit having a data input terminal connected to a signal output terminal of another of the logic circuit blocks.

5. The semiconductor integrated circuit according to claim 1 , wherein said clock control unit includes a clock gating unit for controlling the clock supply unit to stop supplying the clock signals to the specific ones of the flip-flop circuits when a logic sum of a scan enable signal for enabling the transition scan test and the first specific value has a second specific value.

6. The semiconductor integrated circuit according to claim 1 , wherein said clock supply unit is configured to supply a first clock signal to the specific ones of the flip-flop circuits and a second clock signal to other ones of the flip-flop circuits, said first clock signal having a first frequency lower than a second frequency of the second clock signal.

7. The semiconductor integrated circuit according to claim 1 , wherein said clock supply unit includes a frequency division circuit for generating one of the clock signals input from the clock supply unit.