Dual source system and method
A dual source system and method includes a high power laser used to determine elemental concentrations in a sample and a lower power device used to determine compounds present in the sample. A detector subsystem receives photons from the sample after laser energy from the high power laser strikes the sample and provides a first signal. The detector subsystem then receives photons from the sample after energy from the lower power device strikes the sample and provides a second signal. The high power laser is pulsed and the first signal is processed to determine elemental concentrations present in the sample. The lower power device is energized and the second signal is processed to determine compounds present in the signal. Based on the elemental concentrations and the compounds present, the compounds present in the sample are quantified.
1. A dual source system comprising:
a high power laser used to determine elemental concentrations in a sample;
a lower power device used to determine compounds present in the sample;
a detector subsystem configured to:
receive photons from the sample after laser energy from the high power laser strikes the sample and providing a first signal, and
receive photons from the sample after energy from the lower power device strikes the sample and providing a second signal; and
a controller subsystem configured to:
pulse the high power laser and process the first signal to determine one or more elements and their concentrations present in the sample using stored calibration coefficients,
energize the lower power device and process the second signal to determine one or more compounds present in the signal using data concerning one or more elements determined to be present in the sample,
based on the compounds determined to be present in the sample, adjusting the calibration coefficients to recalculate the one or more elemental concentrations, and
based on the recalculated elemental concentrations, calculating the concentration of one or more compounds determined to be resent in the sample.
2. The system of claim 1 in which the high power laser source is configured for LIBS spectroscopy.
3. The system of claim 1 in which the lower power device is a laser configured for Raman spectroscopy.
4. The system of claim 1 in which the lower power device is a near infrared source for near infra-red absorption measurements.
5. The system of claim 1 in which quantifying a compound in the sample includes using a concentration of an element unique to said compound to determine the concentration of said compound.
6. The system of claim 1 in which the controller subsystem is further configured to compare the determined elemental concentrations with elemental concentrations of the defined compound concentrations.
7. The system of claim 6 in which the comparison includes using mass/balance equations.
8. The system of claim 6 in which the controller subsystem is configured to quantify concentrations using elements shared among two or more compounds.
9. The system of claim 1 in which the controller subsystem is configured to report one or more additional compounds present in the sample based on the elemental concentrations and the one or more determined compounds.
10. A computer implemented method comprising:
analyzing, using a spectrometer, emission spectra from a sample to determine one or more elemental intensities at different wavelengths;
calculating the concentration of one or more elements present in the sample using stored calibration data;
employing a molecular measurement technique to determine one or more compounds present in the sample using data concerning one or more elements determined to be present in the sample;
based on the compounds determined to be present in the sample, adjusting the calibration coefficients to recalculate the one or more elemental concentrations, and
based on the recalculated elemental concentrations, calculating the concentration of one or more compounds determined to be present in the sample.
11. The method of claim 10 in which analyzing includes LIBS spectroscopy.
12. The method of claim 10 in which employing includes Raman spectroscopy.
13. The method of claim 10 in which quantifying compounds in the sample includes using a concentration of an element unique to said compound to determine the concentration of said compound.
14. The method of claim 10 further including comparing the determined elemental concentrations with elemental concentrations of the defined compound concentrations.
15. The method of claim 14 in which comparing includes using mass/balance equations.
16. The method of claim 10 in which quantifying includes using elements shared among two or more compounds.
17. The method of claim 10 further including determining one or more additional compounds present in the sample based on the elemental concentrations and the one or more determined compounds.
18. A computer implemented method comprising:
analyzing, using a spectrometer, emission spectra from a sample to determine one or more elemental intensities at different wavelengths;
calculating the concentration of one or more elements present in the sample using a first set of stored calibration data;
employing a molecular measurement technique to determine one or more compounds present in the sample using the one or more elements determined to be in the sample;
based on the compounds determined to be present in the sample, adjusting the calibration data to recalculate the one or more elemental concentrations, and
based on the recalculated elemental concentrations, calculating the concentration of one or more compounds determined to be present in the sample.
19. The method of claim 18 further including using mass balance equations to recalculate the concentration of said one or more elements and said one or more compounds.
20. The method of claim 18 further including reporting one or more additional compounds based on one or more elements determined to be in the sample and the compounds determined to be in the sample.