Light-emitting semiconductor chip
View Patent ↗A semiconductor chip includes a semiconductor body with a semiconductor layer sequence. An active region intended for generating radiation is arranged between an n-conductive multilayer structure and a p-conductive semiconductor layer. A doping profile is formed in the n-conductive multilayer structure which includes at least one doping peak.
1. A semiconductor chip comprising a semiconductor body with a semiconductor layer sequence, the semiconductor layer sequence comprising:
an n-conductive multilayer structure, wherein a doping profile is formed in the n-conductive multilayer structure, the doping profile comprising at least one doping peak;
a p-conductive semiconductor layer; and
an active region provided for generating radiation, the active region arranged between the n-conductive multilayer structure and the p-conductive semiconductor layer
wherein the n-conducting multilayer structure comprises a quantum structure with a plurality of quantum layers, the quantum layers being arranged between barrier layers;
wherein a doping profile is formed in the n-conductive multilayer structure, the doping profile comprising at least a first doping peak and a second doping peak;
wherein at least one of the plurality of quantum layers of the n-conductive multilayer structure is arranged between the first doping peak and the second doping peak;
wherein the n-conducting multilayer structure comprises a region that is adjacent to the first doping peak, the quantum layers and the barrier layers adjacent to the quantum layers having a low doping concentration in said region, wherein the low doping concentration is at least 1*10 16 cm −3 and at most 1*10 18 cm −3 ; and
wherein a sub-region of the quantum structure of the n-conductive multilayer structure comprises a high doping concentration by way of the second doping peak.
2. The semiconductor chip according to claim 1 , wherein a doping concentration in at least one of the first doping peak and the second doping peak is at least five times as high as a doping concentration in a region of low n-conductive doping of the n-conductive multilayer structure.
3. The semiconductor chip according to claim 2 , wherein the doping concentration in at least one of the first doping peak and the second doping peak is at least 4*10 18 cm −3 and wherein the doping concentration in the region of low n-conductive doping is at most 8*10 17 cm −3 .
4. The semiconductor chip according to claim 1 , wherein at least one of the first doping peak and the second doping peak exhibits a vertical extent of between 1nm and 30nm inclusive.
5. The semiconductor chip according to claim 4 , wherein at least one of the first doping peak and the second doping peak exhibits a vertical extent of between 5 nm and 20 nm inclusive.
6. The semiconductor chip according to claim 1 , wherein at least one of the first doping peak and the second doping peak exhibits a distance from the active region of between 2 nm and 20 nm inclusive.
7. The semiconductor chip according to claim 1 , wherein the active region comprises a plurality of quantum layers, wherein the first doping peak is arranged between the quantum layer of the n-conductive multilayer structure closest to the active region and the quantum layer of the active region closest to the n-conductive multilayer structure.
8. The semiconductor chip according to claim 7 , wherein a band gap of the quantum layer of the n-conductive multilayer structure is at least as large as a band gap of the quantum layer of the active region.
9. The semiconductor chip according to claim 1 , wherein the semiconductor body has a recess that extends through the p-conductive semiconductor layer and the active region into the n-conductive multilayer structure, wherein the recess penetrates the quantum layers of the n-conductive multilayer structure.
10. The semiconductor chip according to claim 1 , wherein the active region is based on a nitride compound semiconductor material.
11. The semiconductor chip according to claim 1 , wherein a growth substrate for the semiconductor layer sequence is removed from the semiconductor body.
12. The semiconductor chip according to claim 1 , wherein:
a doping concentration in at least one of the first doping peak and the second doping peak is at least five times as high as in a region of the n-conductive multilayer structure adjoining the respective one of the first doping peak and the second doping peak;
wherein the active region comprises a quantum structure with at least one quantum layer; and
wherein the n-conducting multilayer structure comprises a quantum structure with a plurality of quantum layers, wherein a band gap of at least one of the plurality of quantum layers of the n-conductive multilayer structure is larger than a band gap of at least one of the plurality of the quantum layer of the active region.
13. The semiconductor chip according to claim 1 , wherein the region having the low doping concentration is arranged on a side of the first doping peak that is remote from the active region.
14. The semiconductor chip according to claim 1 , wherein first doping peak is disposed between the second doping peak and the active region; and
wherein the second doping peak has a larger vertical extent than a vertical extent of the first doping peak.
15. The semiconductor chip according to claim 1 , wherein the doping peak extends over at least two adjacent quantum layers of the plurality of quantum layers and over a barrier layer disposed between the at least two adjacent quantum layers.