Method and device for measurement with an IR imaging device

1. An arrangement configured to analyze an object by measuring at least two properties of said object, said arrangement comprising:

an infrared system configured to measure at least one thermal property of said object, and

a measuring device configured to measure at least one physical property of said object, said physical property being represented by an electrical signal, wherein,

said arrangement further comprises a synchronizing system that is arranged to synchronize an operation of said infrared system and said measuring device in such a way that said measuring device and said infrared system each perform a measurement of a property of said object at a time determined by said synchronizing system, wherein one of the infrared system and the measuring device is configured to operate as a master unit and the other of the infrared system and the measuring device is configured to operate as a slave unit, and wherein the master unit controls the measurements performed by the slave unit through the synchronizing system.

2. The arrangement of claim 1 , wherein said infrared system is arranged to transmit a control signal to the synchronizing system, whereby the synchronization system controls the frequency and/or timing of measurements to be performed by the measuring unit based on said control signal.

3. The arrangement according to claim 2 , wherein said synchronizing system is arranged to use a frame rate of an infrared imaging device comprised in said infrared system for obtaining a measurement from said measuring device and said infrared imaging device.

4. The arrangement of claim 1 , wherein said measuring device is arranged to transmit a control signal to the synchronizing system, whereby the synchronization system controls the frequency and/or timing of measurements to be performed by the infrared system based on said control signal.

5. The arrangement according to claim 4 , wherein said synchronizing system is arranged to use a periodic signal of said measuring device for periodically obtaining a measurement from said measuring device and said infrared system.

6. The arrangement according to claim 5 , wherein said periodic signal is adapted to a frame rate of an infrared imaging device comprised in said infrared system.

7. The arrangement according to claim 1 , wherein said electrical signal is arranged to be transferred from a sensor/detector to said measuring device by means of a probe.

8. The arrangement according to claim 1 , wherein said physical property is a selection of any of the following:

electrical property,

pressure,

speed, and/or

rotational velocity.

9. The arrangement according to claim 1 , wherein said measuring device is an oscilloscope.

10. The arrangement according to claim 1 , wherein said arrangement is arranged to receive measurements at suitable rates from said measuring device and said infrared system, and wherein said measurements from said measuring device and said infrared system are time stamped to display a correlation between the measurements of the measuring device and the measurements of the infrared system.

11. The arrangement according to claim 1 , further comprising a memory unit for storing measurements from said measuring device and said infrared system together with information allowing measurements taken simultaneously to be identified.

12. A method for analyzing an object by measuring at least two properties of said object, the method comprising:

measuring a thermal property of said object using an infrared system,

measuring at least one physical property of said object using a measuring device, said physical property being represented as an electrical signal,

wherein the method further comprises:

synchronizing the measurements of said measuring steps using a synchronizing system in such a way that said measuring device and said infrared system each perform a measurement of a property of said object at a time determined by said synchronizing system,

wherein said synchronizing comprises receiving in said synchronizing system a control signal from a master unit, the master unit being one of the infrared system and the measuring device, and controlling the measurements performed by a slave unit, the slave unit being the other of the infrared system and the measuring device, based on said control signal.

13. The method of claim 12 , wherein said synchronizing comprises receiving in said synchronizing system a control signal from said infrared system, whereby the synchronization system controls the frequency and/or timing of measurements to be performed by the measuring unit based on said control signal.

14. The method of claim 13 , further comprising selecting said periodic signal to correspond to a suitable frame rate of an infrared imaging device comprised in said infrared system.

15. The method of claim 13 , wherein said control signal is based on a frame rate of an infrared imaging device comprised in said infrared system.

16. The method of claim 12 , wherein said synchronizing comprises receiving in said synchronizing system a control signal from said measuring device whereby the synchronization system controls the frequency and/or timing of measurements to be performed by the infrared system based on said control signal.

17. The method of claim 16 , wherein said control signal is based on a periodic signal of said measuring device.

18. The method of claim 12 , wherein said electrical signal is transferred from a sensor or detector to said measuring device by means of a probe.

19. The method of claim 12 , further comprising receiving measurements at suitable rates from said measuring device and said infrared systems, and time stamping said measurements to display a correlation between the measurements of the measuring device and the measurements of the infrared system.

20. An infrared imaging device configured to measure at least one thermal property of an object, the infrared imaging device comprising:

said infrared imaging device being coupled to a measuring device configured to measure at least one physical property of said object, said physical property being represented by an electrical signal,

said measurements from the infrared imaging device and the measuring device being used for analyzing the object, wherein,

said infrared imaging device further comprises or is coupled to a synchronizing system that is arranged to synchronize an operation of said infrared imaging device and said measuring device in such a way that said measuring device and said infrared imaging device each perform a measurement of a property of said object at a time determined by said synchronizing system, and

wherein said synchronizing system is configured to receive a control signal from a master unit, the master unit being one of the infrared imaging device and the measuring device, and controlling the measurements performed by a slave unit, the slave unit being the other of the infrared imaging device and the measuring device, based on said control signal.

21. The infrared imaging device of claim 20 , wherein said infrared imaging device is arranged to transmit a control signal to the synchronizing system, whereby the synchronization system controls the frequency and/or timing of measurements to be performed by the measuring device based on said control signal.

22. The infrared imaging device of claim 20 , wherein said infrared imaging device is configured to be controlled by said synchronizing system with regards to the frequency and/or timing of measurements to be performed by the infrared imaging device.

23. A measuring device configured to measure at least one physical property of an object, said physical property being represented by an electrical signal, the measuring device comprising:

said measuring device being coupled to an infrared system configured to measure at least one thermal property of said object,

said measurements from the infrared system and the measuring device being used for analyzing the object, wherein,

said measuring device further comprises or is coupled to a synchronizing system that is arranged to synchronize an operation of said infrared system and said measuring device in such a way that said measuring device and said infrared system each perform a measurement of a property of said object at a time determined by said synchronizing system,

wherein said synchronizing system is configured to receive a control signal from a master unit, the master unit being one of the infrared system and the measuring device, and controlling the measurements performed by a slave unit, the slave unit being the other of the infrared system and the measuring device, based on said control signal.

24. The measuring device of claim 23 , wherein said measuring device is arranged to transmit a control signal to the synchronizing system, whereby the synchronization system controls the frequency and/or timing of measurements to be performed by the infrared system based on said control signal.

25. The measuring device of claim 23 , wherein said measuring device is configured to be controlled by said synchronizing system with regards to the frequency and/or timing of measurements to be performed by the measurement device.

26. The measuring device according to claim 23 , wherein said measuring device is further configured to receive said electrical signal from a sensor/detector by means of a probe.

27. The measuring device according to claim 23 , wherein said measuring device is an oscilloscope.

28. A synchronization system configured to synchronize an operation of an infrared system configured to measure at least one thermal property of an object, and a measuring device configured to measure at least one physical property of said object, said physical property being represented by an electrical signal, wherein the measurements from the infrared system and the measuring device are used for analyzing the object, the synchronization system comprising:

said synchronizing system being configured to synchronize the operation of said measuring device and said infrared system in such a way that said measuring device and said infrared system each perform a measurement of a property of said object at a time determined by said synchronizing system, and

wherein said synchronizing system is further configured to receive a control signal from a master unit, the master unit being one of the infrared system and the measuring device, and to control the measurements performed by a slave unit, the slave unit being the other of the infrared system and the measuring device.

29. The synchronizing system of claim 28 , wherein said synchronizing system is configured to receive a control signal from said infrared system, and further to control the frequency and/or timing of measurements to be performed by the measuring unit based on said control signal.

30. The synchronizing system of claim 28 , wherein said synchronizing system is configured to receive a control signal from said measuring device, and further to control the frequency and/or timing of measurements to be performed by the infrared system based on said control signal.