IP Library Granted Patent US 9,102,119
Granted Patent B2
US 9,102,119 · App. 13/533,192 · Granted Aug 11, 2015

Encapsulated beam and method of forming

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Quick Facts
Patent No.
US 9,102,119
App. No.
13/533,192
Granted
Aug 11, 2015
Kind
B2
Abstract

A device including a protecting material encapsulated metallic beam and a method of encapsulating the metallic beam using the protecting material layer are presented. The device includes a cantilever beam that includes at least about 90 Wt % of a metallic beam material, and 10 Wt % or less of a protecting material. The method of forming an encapsulated metallic beam includes the steps of depositing a first layer of protecting material over a substrate, depositing a second layer of protecting material over the first layer, depositing a metallic beam material over the second layer of protecting material, and encapsulating the beam material with a coating of the protecting material.

Claims (15)

1. A method, comprising:

depositing a sacrificial layer over a substrate

depositing a first layer of protecting material over the sacrificial layer;

coating the first layer of protecting material with a dielectric layer;

depositing a photoresist layer over the dielectric layer;

patterning the photoresist layer;

etching the dielectric layer to form an exposed region of the first layer of protecting material;

depositing a second layer of the protecting material over the exposed region;

depositing a metallic beam material over the second layer of protecting material;

removing the photoresist layer to expose a lip of the second layer of protecting material;

encapsulating the beam material by depositing the protecting material over the beam material and the lip; and

removing at least a part of the sacrificial layer after encapsulating the beam material to release a coated beam.

2. The method of claim 1 , wherein the beam material comprises nickel, tin, platinum, silver, copper, gold, nickel tungsten alloy, nickel iron alloy, or any combinations of the foregoing.

3. The method of claim 1 , wherein the protecting material comprises gold, nickel, tin, platinum, silver, copper, or any combinations of the foregoing.

4. The method claim 1 , wherein etching the dielectric layer comprises undercutting the dielectric layer.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2025
From: GENERAL ELECTRIC COMPANY
To: GE INTELLECTUAL PROPERTY LICENSING, LLC
Reel/Frame 070636/0815 →
CHANGE OF NAME Recorded Mar 26, 2025
From: GE INTELLECTUAL PROPERTY LICENSING, LLC
To: DOLBY INTELLECTUAL PROPERTY LICENSING, LLC
Reel/Frame 070643/0907 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 20, 2025
From: DOLBY INTELLECTUAL PROPERTY LICENSING, LLC
To: EDISON INNOVATIONS, LLC
Reel/Frame 070293/0273 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 26, 2012
From: BOOMHOWER, OLIVER CHARLES
To: GENERAL ELECTRIC COMPANY
Reel/Frame 028444/0773 →