IP Library Granted Patent US 8,912,569
Granted Patent B2
US 8,912,569 · App. 13/560,533 · Granted Dec 16, 2014

Hybrid transistor

Inventor: Vishal P. Trivedi (Chandler, AZ)
Assignee: Freescale Semiconductor, Inc.
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Quick Facts
Patent No.
US 8,912,569
App. No.
13/560,533
Granted
Dec 16, 2014
Kind
B2
Abstract

A hybrid transistor ( 58 ) has a substrate ( 42 ) with a first (e.g., P type) well region ( 46 ) and a second (e.g., N type) well region ( 44 ) with an NP or PN junction ( 43 ) therebetween. A MOS portion ( 70 - 3 ) of the hybrid transistor ( 58 ) has an (e.g., N type) source region ( 48 ) in the first well region ( 46 ) and a gate conductor ( 52 ) overlying and insulated from the well regions ( 46, 44 ) that extends laterally at least to the junction ( 43 ). A drain or anode (D/A) portion ( 71 - 3 ) in the second well region ( 44 ) collects current 56 from the source region ( 48 ), and includes a bipolar transistor ( 78 ) having an (e.g., N+) emitter region ( 64 ), a (e.g., P type) base region ( 59 ) and a (e.g., N type) collector region ( 62 ) laterally separated from the junction ( 43 ). Different LDMOS-like or IGBT-like properties are obtained depending on whether the current 56 is extracted from the hybrid transistor ( 58 ) via the bipolar transistor ( 78 ) base ( 59 ) or emitter ( 64 ) or both. The bipolar transistor ( 78 ) is desirably a vertical hetero-junction transistor.

Claims (25)

1. A hybrid transistor, comprising:

a substrate having therein a first well region of a first conductivity type, a second well region of a second, opposite, conductivity type, extending substantially to a first surface of the substrate, the first and second well regions forming an NP or PN junction therebetween;

a MOS portion having a source region of the second conductivity type extending to the first surface in the first well region, and having a gate conductor overlying and insulated from the first surface at least over the first well region with a first lateral end proximate the source region and a second lateral end extending at least to the NP or PN junction; and

a drain or anode (D/A) portion in the second well region, the D/A portion comprising a bipolar transistor having an emitter region of the second conductivity type, a base region of the first conductivity type communicating with the emitter region, and a collector region of the second conductivity type communicating with the base region, wherein the collector region is located in the second well region laterally separated from the NP or PN junction.

2. The hybrid transistor of claim 1 , having a principal terminal thereof coupled to the base region but not connected to the emitter region.

3. The hybrid transistor of claim 1 , having a principal terminal thereof coupled to the emitter region but not connected to the base region.

4. The hybrid transistor of claim 1 , having a principal terminal thereof coupled to both the emitter region and the base region.

5. The hybrid transistor of claim 1 , further comprising dielectric filled shallow trench isolation (STI) region laterally located in the second well region between the NP or PN junction and the collector region of the bipolar transistor.

6. The hybrid transistor of claim 5 , further comprising a sub-isolation-buried-layer (SIBL) region beneath the STI region in the second well region, and having a dopant concentration larger than the second well region.

7. The hybrid transistor of claim 1 , wherein the bipolar transistor is a hetero-junction bipolar transistor.

8. The hybrid transistor of claim 7 , wherein the base region of the bipolar transistor is formed of a different semiconductor material than the collector region.

9. The hybrid transistor of claim 1 , wherein the bipolar transistor is substantially a vertical transistor with the emitter region, the base region and the collector region arranged substantially one above the other.

10. A multifunction transistor, comprising:

a first well region of a first conductivity type;

a second well region of a second conductivity type, the second well region forming a lateral NP or PN junction with the first well region;

a MOS portion formed in at least one of the first and second well regions, the MOS portion comprising:

a source region in the first well region; and

a first well contact region in the first well region;

a common electrode shared by the source region and the first well contact region;

a drain or anode (D/A) portion formed in at least one of the first and second well regions; and

a substantially vertical hetero junction bipolar transistor in the DA portion, the substantially vertical hetero-junction bipolar transistor having a base connection and an emitter connection that may be used separately or together as a principal electrode of the multifunction transistor.

11. A multifunction transistor of claim 10 , wherein the principal electrode of the multifunction transistor is coupled to the emitter connection.

12. A multifunction transistor of claim 10 , wherein the principal electrode of the multifunction transistor is coupled to the base connection.

13. A multifunction transistor of claim 10 , wherein the principal electrode of the multifunction transistor is coupled to both the base connection and the emitter connection.

14. The multifunction transistor of claim 10 , further comprising in the MOS portion a gate conductor insulated at least from the first well region and extending laterally substantially from the source region to at least the NP or PN junction.

Assignments (31)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0241. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 5, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041260/0850 →
MERGER Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040652/0241 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0652 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0614 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0633 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030256/0625 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 27, 2012
From: TRIVEDI, VISHAL P.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 028660/0331 →
Continuity (1)
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