IP Library Granted Patent US 8,491,322
Granted Patent B2
US 8,491,322 · App. 13/564,499 · Granted Jul 23, 2013

Electronic device connecting structure and function expansion device

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Quick Facts
Patent No.
US 8,491,322
App. No.
13/564,499
Granted
Jul 23, 2013
Kind
B2
Abstract

For connecting devices, an electromagnetic interference (EMI) connecting portion includes a conductor connected to a first EMI shield. An electrostatic discharge (ESD) contact portion electrically connects to a second EMI shield through a high-impedance element. The ESD contact portion electrically connects the EMI connecting portion to the second EMI shield through the high-impedance element as the ESD contact portion initially contacts the EMI connecting portion during hot docking. The ESD contact portion subsequently moves in response to the initial contact to contact a low-impedance element electrically connected to the second EMI shield and connect the EMI connecting portion to the second EMI shield through the low-impedance element.

Claims (33)

1. A connecting structure comprising:

an electromagnetic interference (EMI) connecting portion comprising a conductor connected to a first EMI shield; and

an electrostatic discharge (ESD) contact portion electrically connected to a second EMI shield through a high-impedance element, the ESD contact portion electrically connecting the EMI connecting portion to the second EMI shield through the high-impedance element as the ESD contact portion initially contacts the EMI connecting portion during hot docking, the EMI connection portion subsequently moving the ESD contact portion to rotate about a pivot and contact the second EMI shield and connect the EMI connecting portion to the second EMI shield in response to the initial contact of the EMI connecting portion and the ESD contact portion.

2. The connecting structure of claim 1 , further comprising a second signal line enclosed by the second EMI shield and connecting to a first signal line when hot docking with a first electronic device, the first signal line enclosed by the first EMI shield, a first signal earth line enclosed by the first EMI shield and connected to the first electronic device, and a second signal earth line enclosed by the second EMI shield and connected to a second electronic device.

3. The connecting structure of claim 2 , wherein in response to the first electronic device hot docking with the second electronic device, the first signal earth line and the second signal earth line are connected to each other if the ESD contact portion is in contact with the second EMI shield and the first signal line and the second signal line are connected to each other subsequent to the first signal earth line and the second signal earth line connecting to each other.

4. The connecting structure of claim 3 , wherein the first EMI shield and the second EMI shield apply reference potentials to the first electronic device and the second electronic device, respectively, and the first signal earth line is connected to the first EMI shield and the second signal earth line is connected to the second EMI shield.

5. The connecting structure of claim 2 , wherein the high-impedance element has an impedance value which does not allow aerial discharge if the ESD contact is brought closer to the EMI connecting portion in a condition where the first electronic device is electrically charged while a user is holding the first electronic device.

6. The connecting structure of claim 1 , wherein the high-impedance element has an inductive reactance.

7. The connecting structure of claim 2 , wherein

the first electronic device includes a first interface connector to which the first signal line and the first signal earth line are connected;

the second electronic device includes a second interface connector that connects to the first interface connector and to which the second signal line and the second signal earth line are connected; and

the EMI connecting portion is provided at a plurality of positions spaced apart from the second interface connector.

8. The connecting structure of claim 2 , wherein the ESD contact portion and the EMI connecting portion are disposed in a same location of the second electronic device.

9. The connection structure of claim 1 , wherein the ESD contact portion rotates and contacts the second EMI shield in response to the ESD contact portion contacting the EMI connecting portion.

10. A method for connecting comprising:

contacting an electrostatic discharge (ESD) contact portion to an electromagnetic interference (EMI) connecting portion, the EMI connecting portion comprising a conductor connected to a first EMI shield, the ESD contact portion electrically connected through a high-impedance element to a second EMI shield; and

moving with the EMI connecting portion the ESD contact portion to rotate about a pivot and to contact the second EMI shield and connect the EMI connecting portion to the second EMI shield in response to the initial contact of the EMI connecting portion and the ESD contact portion.

11. The method of claim 10 , further comprising:

connecting a second signal line enclosed by the second EMI shield and to a first signal line when hot docking with a first electronic device, the first signal line enclosed by the first EMI shield; and

connecting a first signal earth line enclosed by the first EMI shield and connected to the first electronic device to a second signal earth line enclosed by the second EMI shield and connected to a second electronic device.

12. The method of claim 11 , wherein in response to the first electronic device hot docking with the second electronic device, the first signal earth line and the second signal earth line are connected to each other if the ESD contact portion is in contact with the second EMI shield and the first signal line and the second signal line are connected to each other subsequent to the first signal earth line and the second signal earth line connecting to each other.

13. A function expansion device comprising:

a second EMI shield;

an electrostatic discharge (ESD) contact portion electrically connected to the second EMI shield through a high-impedance element, the ESD contact portion electrically connecting an EMI connecting portion to the second EMI shield through the high-impedance element as the ESD contact portion initially contacts the EMI connecting portion during hot docking and the EMI connecting portion subsequently moving the ESD contact portion to rotate about a pivot and contact the second EMI shield and connect the EMI connecting portion to the second EMI shield in response to the initial contact of the EMI connecting portion and the ESD portion.

14. The function expansion device of claim 13 , further comprising a second signal line enclosed by the second EMI shield and connecting to a first signal line when hot docking with a first electronic device, the first signal line enclosed by the first EMI shield, a first signal earth line enclosed by the first EMI shield and connected to the first electronic device, and a second signal earth line enclosed by the second EMI shield and connected to a second electronic device.

15. The function expansion device of claim 14 , wherein in response to the first electronic device hot docking with the second electronic device, the first signal earth line and the second signal earth line are connected to each other if the ESD contact portion is in contact with the second EMI shield and the first signal line and the second signal line are connected to each other subsequent to the first signal earth line and the second signal earth line connecting to each other.

16. The function expansion device of claim 15 , wherein the first EMI shield and the second EMI shield apply reference potentials to the first electronic device and the second electronic device, respectively, and the first signal earth line is connected to the first EMI shield and the second signal earth line is connected to the second EMI shield.

17. The function expansion device of claim 14 , wherein the high-impedance element has an impedance value which does not allow aerial discharge if the ESD contact is brought closer to the EMI connecting portion in a condition where the first electronic device is electrically charged while a user is holding the first electronic device.

18. The function expansion device of claim 13 , wherein the high-impedance element has an inductive reactance.

19. The function expansion device of claim 14 , wherein

the first electronic device includes a first interface connector to which the first signal line and the first signal earth line are connected;

the second electronic device includes a second interface connector that connects to the first interface connector and to which the second signal line and the second signal earth line are connected; and

the EMI connecting portion is provided at a plurality of positions spaced apart from the second interface connector.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 10, 2025
From: LENOVO PC INTERNATIONAL LIMITED
To: LENOVO SWITZERLAND INTERNATIONAL GMBH
Reel/Frame 069870/0670 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 3, 2019
From: LENOVO (SINGAPORE) PTE. LTD.
To: LENOVO PC INTERNATIONAL LIMITED
Reel/Frame 049678/0824 →
NUNC PRO TUNC ASSIGNMENT Recorded Dec 4, 2015
From: LENOVO (SINGAPORE) PTE LTD.
To: LENOVO PC INTERNATIONAL
Reel/Frame 037211/0173 →