Controlling AC disturbance while programming
View Patent ↗A system and methodology that can minimize disturbance during an AC operation associated with a memory, such as, program, read and/or erase, is provided. The system pre-charges all or a desired subset of the bit lines in a memory array to a specified voltage, during an AC operation to facilitate reducing AC disturbances between neighboring cells. A pre-charge voltage can be applied to all bit lines in a block in the memory array, or to bit lines associated with a selected memory cell and neighbor memory cells adjacent to the selected memory cell in the block. The system ensures that source and drain voltage levels can be set to desired levels at the same or substantially the same time, while selecting a memory cell. This can facilitate minimizing AC disturbances in the selected memory cell during the AC operation.
1. A system that facilitates operation of memory, comprising:
a memory array comprising multiple memory cells connected to respective ones of a set of bit lines;
a controller for implementing alternating current (AC) based operations on subsets of the multiple memory cells; and
an alternating current disturbance control component configured to pre-charge a target bit line of the set of bit lines connected to a selected memory cell of the memory and configured to pre-charge neighboring bit lines of the set of bit lines, in conjunction with the controller performing an AC operation on the selected memory cell.
2. The system of claim 1 , further comprising a timer component configured to concurrently change voltage at source and drain terminals of the selected memory cell to a desired voltage associated with the AC operation.
3. The system of claim 2 , wherein the timer component employs a timing sequence of voltage changes configured to compensate for capacitance or resistance effects on the selected memory cell in conjunction with concurrently changing voltage at source and drain terminals of the selected memory cell.
4. The system of claim 2 , wherein the timer component is further configured to return the source and drain terminals of the selected memory cell to a pre-charge voltage in response to completion of the AC operation.
5. The system of claim 2 , further comprising at least one of:
a pre-charge timer component configured to control timing of pre-charging of the target bit line and the set of neighboring bit lines to follow application of a gate voltage related to the AC operation;
a Vs timer component configured to maintain a timing sequence associated with changing voltage at the source terminal of the selected memory cell in conjunction with the AC operation; or
a Vd timer component configured to maintain a timing sequence associated with changing voltage at the drain terminal of the selected memory cell in conjunction with the AC operation.
6. The system of claim 2 , further comprising a Vcc generation component configured to supply a predetermined voltage to the target bit line or to the set of neighboring bit lines in conjunction with pre-charging the target bit line or pre-charging the set of neighboring bit lines, respectively.
7. The system of claim 1 , wherein at least one bit line of the neighboring bit lines is immediately adjacent to the target bit line.
8. The system of claim 2 , wherein at least two bit lines of the neighboring bit lines are immediately adjacent to the target bit line.
9. The system of claim 1 , wherein at least one bit line of the neighboring bit lines is not immediately adjacent to the target bit line.
10. The system of claim 3 , wherein at least a plurality of bit lines of the neighboring bit lines is not immediately adjacent to the target bit line.
11. A system that facilitates operation of memory, comprising:
an alternating current (AC) disturbance control component configured to pre-charge a target bit line connected to a selected memory cell of the memory and pre-charge a set of neighboring bit lines of the memory comprising at least one bit line adjacent to the target bit line, in conjunction with an AC-based operation directed at the selected memory cell; and
a bit line discharging component configured to discharge the target bit line following conclusion of the AC-based operation.
12. The system of claim 11 , wherein the AC-based operation comprises an access operation directed at the selected memory cell.
13. The system of claim 11 , wherein the AC-based operation comprises a write operation directed at the selected memory cell.
14. The system of claim 11 , wherein the AC-based operation comprises a clear operation directed at the selected memory cell.
15. The system of claim 11 , further comprising a timer component configured to contemporaneously update voltage levels for terminals of the selected memory cell based at least in part on a specified voltage sequence.
16. The system of claim 15 , wherein the timer component is configured to update a voltage on a source terminal or a drain terminal of the selected memory cell to a predetermined voltage level based at least in part on the specified voltage sequence; and further wherein the bit line discharging component is further configured to return the voltage to a pre-charge voltage or discharge the voltage to ground following conclusion of the AC-based operation.
17. A system that facilitates operation of memory, comprising:
an alternating current (AC) disturbance control component configured to pre-charge a target bit line connected to a selected memory cell of the memory and pre-charge a set of neighboring bit lines of the memory comprising at least one bit line adjacent to the target bit line, in conjunction with an AC-based operation targeting the selected memory cell; and
a bit line discharging component configured to discharge the set of neighboring bit lines following conclusion of the AC-based operation.
18. The system of claim 17 , further comprising a controller for implementing the AC-based operation on a subset of memory cells of the memory, wherein the AC-based operation comprises at least one of an access operation, a write operation or a clear operation.
19. The system of claim 17 , further comprising a timer component configured to concurrently change voltage at source and drain terminals of the selected memory cell to a desired voltage associated with the AC operation.
20. The system of claim 19 , wherein the timer component employs a timing sequence configured to compensate for capacitance or resistance effects on the selected memory associated with the concurrently changing voltage at source and drain terminals of the selected memory cell.