IP Library Granted Patent US 9,214,617
Granted Patent B2
US 9,214,617 · App. 13/589,446 · Granted Dec 15, 2015

Electronic component module

Inventors: Hiromasa Kato (Fujisawa, JP); Takayuki Naba (Chigasaki, JP); Noritaka Nakayama (Yokohama, JP)
Assignees: KABUSHIKI KAISHA TOSHIBA; TOSHIBA MATERIALS CO., LTD.
H01L35/30H01L23/3735H01L24/29H01L24/83H05K1/0201H05K1/18H01L24/32H01L2224/29H01L2224/29101H01L2224/29124H01L2224/29139H01L2224/29298H01L2224/32225H01L2224/48091H01L2224/838H01L2224/83192H01L2224/83805H01L2924/00013H01L2924/014H01L2924/0104H01L2924/0105H01L2924/01006H01L2924/01013H01L2924/01019H01L2924/01029H01L2924/0132H01L2924/01033H01L2924/0133H01L2924/01047H01L2924/01057H01L2924/01072H01L2924/01074H01L2924/01078H01L2924/01082H01L2924/01105H01L2924/01322H01L2924/01327H01L2924/10253H01L2924/10272H01L2924/15787H01L2924/19041H01L2924/19043H01L2924/19107H01L2924/351H05K3/3463
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,214,617
App. No.
13/589,446
Granted
Dec 15, 2015
Kind
B2
Abstract

An electronic component module has a circuit board in which metal plates are bonded to both surfaces of a ceramic substrate, and an electronic component that is bonded to at least one surface of the metal plate and is operable at least 125° C. The electronic component is bonded to the metal plate via a brazing material layer having a higher melting point than a operating temperature of the electronic component.

Claims (21)

1. An electronic component module, comprising:

a circuit board including a silicon nitride substrate having a first principal surface and a second principal surface opposite to the first principal surface, a first metal plate bonded to the first principal surface of the silicon nitride substrate as a circuit, and a second metal plate bonded to the second principal surface of the silicon nitride substrate as a heatsink; and

an electronic component bonded to the first metal plate via a first brazing material layer, wherein the electronic component is a thermoelectric element of which an operation environmental temperature is 300° C. or more and 500° C. or less,

wherein the first brazing material layer is formed of a brazing material having a melting point in a range of 575° C. to 730° C., and the melting point is higher than the operation environmental temperature of the thermoelectric element, and

wherein a ratio of a thickness of the first metal plate to a thickness of the second metal plate is 50% or more and 200% or less.

2. The electronic component module according to claim 1 ,

wherein the electronic component comprises a plurality of the thermoelectric elements bonded to the first metal plate.

3. The electronic component module according to claim 1 ,

wherein a base plate is bonded to the second metal plate via a second brazing material layer.

4. The electronic component module according to claim 3

wherein the second brazing material layer is formed of the brazing material.

5. The electronic component module according to claim 1 ,

wherein the brazing material is an Ag—Cu based brazing material containing Ag and Cu in a range of 85% or more by mass in total.

6. The electronic component module according to claim 5 ,

wherein the Ag—Cu based brazing material further contains at least one element selected from Ti, Zr and Hf in a range of not less than 1% nor more than 5% by mass and the balance of at least one element selected from Sn and In.

7. The electronic component module according to claim 5 ,

wherein the Ag—Cu based brazing material has a composition of which a rate of Cu is in a range of 10 to 35 parts by mass when a total amount of Ag and Cu is set to be 100 parts by mass.

8. The electronic component module according to claim 1 ,

wherein the brazing material is an Al based brazing material containing Al at 90% or more by mass.

9. The electronic component module according to claim 8 ,

wherein the Al based brazing material further contains at least one element selected from rare-earth elements in a range of not less than 0.1% nor more than 3% by mass and the balance of Si.

Assignments (3)
NUNC PRO TUNC ASSIGNMENT Recorded Feb 19, 2026
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MATERIALS CO. LTD.
Reel/Frame 074940/0511 →
CHANGE OF NAME Recorded Feb 19, 2026
From: TOSHIBA MATERIALS CO. LTD.
To: NITERRA MATERIALS CO., LTD.
Reel/Frame 074941/0803 →
CHANGE OF ADDRESS Recorded Feb 19, 2026
From: KABUSHIKI KAISHA TOSHIBA
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 074941/0846 →
Priority Claims (1)
JP 2006-062706 · Mar 8, 2006 · national
Continuity (3)
Division 12281856
Continuation PCTJP2007000169 · Mar 5, 2007
Related Publication 20120305304A1 · Dec 6, 2012