IP Library Granted Patent US 9,001,597
Granted Patent B2
US 9,001,597 · App. 13/589,838 · Granted Apr 7, 2015

Memory system, semiconductor memory device, and wiring substrate, the semiconductor memory device including termination resistance circuit or control circuit

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Quick Facts
Patent No.
US 9,001,597
App. No.
13/589,838
Granted
Apr 7, 2015
Kind
B2
Abstract

A semiconductor device includes a first input terminal receiving a termination resistance control signal, and a termination resistance circuit that is able to be controlled to be turned on or off by the termination resistance control signal. The termination resistance circuit is turned off, irrespective of a level of said termination resistance control signal when the semiconductor device outputs data in response to a read command.

Claims (29)

1. A semiconductor device comprising:

a first input terminal receiving a termination resistance control signal; and

a termination resistance circuit that is able to be controlled to be turned on or off by the termination resistance control signal,

wherein the termination resistance circuit is turned off, irrespective of a level of said termination resistance control signal when the semiconductor device outputs data in response to a read command, and

wherein the semiconductor device comprises a normal operation mode in which the read command and a write command are able to be executed and a power-down mode in which execution of the read command and the write command is stopped, and on/off timings of the termination resistance circuit by the termination resistance control signal in the normal operation mode and the power-down mode are substantially the same.

2. The device according to claim 1 , further comprising a termination resistance value specifying register to store a certain fixed value.

3. The device according to claim 1 , further comprising a selection circuit which is selecting an output of an output data control circuit in response to a read data read from a memory cell array when the read command is executed, and selecting an output of a termination resistance value determination circuit when the read command is not executed.

4. The device according to claim 3 , further comprising a prebuffer coupled between the selection circuit and an output buffer to control a termination resistance of the output buffer in response to the output of the termination resistance value determination circuit when the read command is not executed, and to control an output level in response to the output of the output data control circuit when the read command is executed.

5. The device according to claim 1 , wherein the termination resistance circuit controls a termination resistance of an input/output terminal thereon.

6. The device according to claim 1 , wherein the termination resistance control signal comprises an on die termination control signal.

7. A semiconductor device comprising:

a control circuit including a termination control unit that is able to output a termination resistance control signal to a semiconductor memory device so as to activate an on-die-termination control circuit in the semiconductor memory device, and is able to maintain the termination resistance control signal when a read command or a write command is outputted to the semiconductor memory device,

wherein the semiconductor device comprises a normal operation mode in which the read command and the write command are able to be executed and a power-down mode in which execution of the read command and the write command is stopped, and on/off timings of the termination resistance control si nal in the normal operation mode and the power-down mode are substantially the same.

8. The device according to claim 7 , further comprising a plurality of on die termination terminals, each of the plurality of on die termination terminals being able to output the on die termination control signal to corresponding one of a plurality of semiconductor memory devices.

9. The device according to claim 7 , wherein the semiconductor memory device includes a plurality of memory devices, the termination control unit being able to output the termination resistance control signal to the plurality of memory devices so as to deactivate the on-die-termination control circuit in the plurality of memory devices when none of a read and write command is outputted to the plurality of memory devices.

10. The device according to claim 8 , wherein the termination resistance control unit sets an initial resistance value of the on-die-termination control circuit.

11. A semiconductor device comprising:

an embedded termination resistance connected to a data input/output terminal;

a termination resistance control terminal that is configured to control turning on or off of said embedded termination resistance from an outside; and

a termination resistance control circuit that turns off said embedded termination resistance irrespective of a level of said termination resistance control terminal when the semiconductor device outputs read data to said data input/output terminal, in response to a read command,

wherein said semiconductor device comprises a normal operation mode in which the read command and a write command are able to be executed and a power-down mode in which execution of the read command and the write command is stopped, and on/off timings of said embedded termination resistance by the termination resistance control signal in the normal operation mode and the power-down mode are substantially the same.

12. The device according to claim 11 , wherein at least a portion of an output buffer circuit that outputs the read data serves as said embedded termination resistance as well.

13. The device according to claim 12 , wherein said output buffer circuit outputs the read data when the read command is executed, and functions as said embedded termination resistance except when the read command is executed.

14. The device according to claim 11 , wherein the read command is supplied in synchronization with a system clock,

said semiconductor device further comprises:

a synchronous circuit; and

a synchronous circuit selection circuit that performs switching between a synchronous circuit selection mode and a synchronous circuit non-selection mode,

wherein: when the read command is executed, the read data is output in synchronization with the system clock, using said synchronous circuit in the synchronous circuit selection mode, and the read data is output in synchronization with an internal clock generated from the system clock without using said synchronous circuit in the synchronous circuit non-selection mode, and

when said synchronous circuit selection circuit selects said synchronous circuit non-selection mode, said termination resistance control circuit turns off said embedded termination resistance irrespective of the level of said termination resistance control terminal when the read command is executed.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 21, 2018
From: LONGITUDE SEMICONDUCTOR S.A.R.L.
To: LONGITUDE LICENSING LIMITED
Reel/Frame 046865/0667 →
CHANGE OF NAME Recorded Aug 24, 2016
From: PS5 LUXCO S.A.R.L.
To: LONGITUDE SEMICONDUCTOR S.A.R.L.
Reel/Frame 039793/0880 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2016
From: PS4 LUXCO S.A.R.L.
To: PS5 LUXCO S.A.R.L.
Reel/Frame 039818/0506 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032897/0575 →
SECURITY AGREEMENT Recorded Jul 29, 2013
From: PS4 LUXCO S.A.R.L.
To: ELPIDA MEMORY INC.
Reel/Frame 032414/0261 →