Test device for testing depth of chamfer
View Patent ↗A test device includes a base rested on an object, an inserting member slidably mounted to the base and contacts a slanted surface of a chamfer of the object, and a test member slidably rested on the base. The base includes a positioning bar abutting a bottom end of the chamfer. A first cutout and a second cutout communicating with the first cutout and positioned in front of the first cutout are defined in a bottom surface of the testing member. A depth of the second cutout equals the tolerance of a standard depth of the chamfer. If a top surface of the inserting member can be received in the second cutout, the depth of the chamfer is qualified. If the top surface of the inserting member cannot be received in the second cutout, the depth of the chamfer is unqualified.
1. A test device for testing whether a depth of a chamfer of a hole of an object is qualified or not, the test device comprising:
a base comprising a block to be rested on the object and a positioning bar extending down from the block to abut a bottom end of the chamfer;
an inserting member slidably mounted to the block along a direction parallel to an extension direction of the positioning bar, wherein a bottom end of the inserting member is operable to contact a slanted surface of the chamfer; and
a test member slidably rested on the block, a bottom of the test member defining a first cutout extending through a front end surface of the test member, a front portion of a top wall bounding the first cutout defining a second cutout communicating with the first cutout and extending through the front end surface of the test member, wherein a depth of the second cutout equals a tolerance of the standard depth of the chamfer of the object, wherein the second cutout is operable of receiving an upper portion of the inserting member in response to the depth of the chamfer of the hole being qualified, the first cutout is operable of receiving the upper portion of the inserting member in response to the depth of the chamfer of the hole being greater than the maximal standard depth of the chamfer.
2. The test device of claim 1 , further comprising a pole, wherein the block defines a receiving hole extending through a top and a bottom of the block to receive the inserting member, and a slide slot extending through opposite sides of the block and communicating with the receiving hole, the pole is fixed to the inserting member and slidable in the slide slot in a direction parallel to the extension direction of the positioning bar.
3. The test device of claim 2 , wherein the positioning bar is rectangular, and the inserting member extends out of the receiving hole and abuts a rear surface of the positioning bar.
4. The test device of claim 1 , wherein an extension bar extends down from a front end of a bottom of the inserting member to contact the slanted surface of the chamfer.
5. The test device of claim 4 , wherein a front surface of the extension bar abuts a rear surface of the positioning bar.