Display apparatus with reduced number of test lines for array test process and method of testing the same
A display apparatus includes a display panel including a plurality of pixels, a plurality of first lines and a plurality of second lines, a plurality of first pads electrically connected to the first lines, respectively, where the first pads are divided into a first group and a second group, a plurality of pads including a second pad, a third pad, a fourth pad and a fifth pad, a first shorting bar configured to be connected to the first group of the first pads and to be connected between the second pad and the fourth pad during a test process of the first lines, and a second shorting bar configured to be connected to the second group of the first pads and to be connected between the third pad and the fifth pad during the test process of the first lines.
1. A display apparatus comprising:
a display panel including a plurality of pixels, a plurality of first lines and a plurality of second lines;
a plurality of first pads electrically connected to the first lines, respectively, wherein the first pads are divided into a first group and a second group;
a plurality of pads including a second pad, a third pad, a fourth pad and a fifth pad;
a first shorting bar configured to be connected to the first group of the first pads and to be connected between the second pad and the fourth pad during an array test process of the first lines; and
a second shorting bar configured to be connected to the second group of the first pads and to be connected between the third pad and the fifth pad during the array test process of the first lines,
wherein the first and second shorting bars arranged in a driver integrated circuit area of the display panel, in which a driver integrated circuit is disposed.
2. The display apparatus of claim 1 , wherein the display panel includes a display area and a non-display area, and the pixels are arranged in the display area.
3. The display apparatus of claim 2 , wherein the first pads, the first and second shorting bars and the second to fifth pads are arranged in the non-display area of the display panel.
4. The display apparatus of claim 1 , further comprising:
a first probe pad configured to be electrically connected to the fourth pad during the test process for the first lines, wherein the first probe pad receives a first test signal; and
a second probe pad configured to be electrically connected to the fifth pad during the test process for the first lines, wherein the second probe pad receives a second test signal.
5. The display apparatus of claim 1 , further comprising:
the driver integrated circuit including a plurality of chip pads,
wherein the driver integrated circuit drives the first lines, and
wherein the first to fifth pads are connected to the chip pads of the driver integrated circuit.
6. The display apparatus of claim 1 ,
wherein the first pads, the second pad, the third pad, the fourth pad, the fifth pad are arranged in a same driver integrated circuit area of the display panel.
7. The display apparatus of claim 1 , wherein
the second and fourth pads are disconnected from the first shorting bar after the test process of the first lines, and
the third and fifth pads are disconnected from the second shorting bar after the test process of the first lines.
8. The display apparatus of claim 1 , wherein the first pads are disconnected from the first shorting bar and the second shorting bar after the test process of the first lines.
9. The display apparatus of claim 1 , wherein
the first lines are gate lines, and
the second lines are data lines.
10. The display apparatus of claim 1 , wherein
the second and fourth pads receive or transmit a vertical synchronization start signal, and
the third and fifth pads receive or transmit a clock signal.
11. A method of testing a display apparatus comprising a display panel including a plurality of pixels a plurality of gate lines and a plurality of data lines, the method comprising:
applying a first test signal to a first shorting bar of the display panel, wherein the first shorting bar is provided between a second pad and a fourth pad of the display panel and connected to a first group of a plurality of first pads, which is connected to the gate lines, respectively;
applying a second test signal to a second shorting bar of the display panel, wherein the second shorting bar is provided between a third pad and a fifth pad of the display panel and connected to a second group of the first pads;
determining whether a defect occurs in the gate lines through a first probe pad electrically connected to the fourth pad and through a second probe pad electrically connected to the fifth pad; and
electrically disconnecting the first and second shorting bars from the first to fifth pads,
wherein the first and second shorting bars are arranged in a driver integrated circuit area of the display panel, in which a driver integrated circuit is to be disposed.
12. The method of claim 11 , wherein the first to fifth pads are connected to chip pads in a gate driver integrated circuit which drives the gate lines.
13. The method of claim 12 , wherein
the second and fourth pads receive or transmit a vertical synchronization start signal, and
the third and fifth pads receive or transmit a clock signal.
14. The method of claim 11 , further comprising:
electrically disconnecting the first and second shorting bars from the first pads.