Microscope system and illumination intensity adjusting method
View Patent ↗A microscope system and an illumination intensity adjusting method that can automatically adjust an illumination intensity when a bright-field illumination system and a dark-field illumination system are simultaneously used are provided. The microscope system includes: a stage on which a specimen is placed; an objective lens that converges observation light from at least the specimen S on the stage; a bright-field illumination unit configured to emit bright-field illumination light that is illumination light aperture to the specimen for a bright-field observation; a dark-field illumination unit configured to emit dark-field illumination light that is illumination light aperture to the specimen for a dark-field observation; and an illumination intensity control unit configured to adjust an illumination intensity of at least one of the bright-field illumination light and the dark-field illumination light according to the illumination intensity of the other one.
1. A microscope system comprising:
a stage on which a specimen is placed;
an objective lens that converges observation light from at least the specimen on the stage;
a bright-field illumination unit configured to emit bright-field illumination light that is illumination light applied to the specimen for a bright-field observation;
a dark-field illumination unit configured to emit dark-field illumination light that is illumination light applied to the specimen for a dark-field observation;
an illumination intensity control unit configured to adjust an illumination intensity of one of the bright-field illumination light and the dark-field illumination light based on an illumination intensity of the other of the bright-field illumination light and the dark-field illumination light; and
a control unit configured to execute a simultaneous irradiation process by controlling the bright-field illumination unit and the dark-field illumination unit to simultaneously emit the adjusted bright-field illumination light and the adjusted dark-field illumination light, respectively, after the illumination intensity has been adjusted by the illumination intensity control unit.
2. The microscope system according to claim 1 , further comprising:
an imaging unit configured to capture an image of the specimen to which the bright-field illumination light and the dark-field illumination light are respectively applied,
wherein the illumination intensity control unit adjusts the illumination intensity based on a ratio of exposure times when the imaging unit captures the image of the specimen to which the bright-field illumination light is applied and when the imaging unit captures the image of the specimen to which the dark-field illumination light is applied.
3. The microscope system according to claim 2 , wherein the illumination intensity control unit adjusts the illumination intensity of the one of the bright-field illumination light and the dark-field illumination light which has a shorter exposure time than the other of the bright-field illumination light and the dark-field illumination light.
4. The microscope system according to claim 1 , further comprising an input unit configured to accept input of a ratio of the illumination intensity of the bright-field illumination light and the illumination intensity of the dark-field illumination light.
5. The microscope system according to claim 4 , wherein the input unit comprises a touch panel.
6. An illumination intensity adjusting method comprising:
irradiating a specimen placed on a stage with dark-field illumination light that is illumination light for a dark-field observation to capture a first image of the specimen;
irradiating the specimen with bright-field illumination light that is illumination light for a bright-field observation to capture a second image of the specimen;
adjusting an illumination intensity of one of the dark-field illumination light and the bright-field illumination light based on a ratio of exposure times when the first image of the specimen is captured in the dark-field imaging and when the second image of the specimen is captured in the bright-field imaging; and
after the adjusting the illumination intensity, executing a simultaneous irradiation process by simultaneously emitting the adjusted bright-field illumination light and the adjusted dark-field illumination light.