IP Library Granted Patent US 8,888,558
Granted Patent B2
US 8,888,558 · App. 13/619,417 · Granted Nov 18, 2014

Probe pin and method of manufacturing the same

Inventor: Fumihiko Yoshimura (Yokosuka, JP)
Assignees: Kabushiki Kaisha Toshiba; Toshiba Materials Co., Ltd.
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Quick Facts
Patent No.
US 8,888,558
App. No.
13/619,417
Granted
Nov 18, 2014
Kind
B2
Abstract

A probe pin having a bent portion at its tip end portion is used for a probe card, the probe pin is configured such that an angle constituted by a direction of work groove generated at a time of machine-working of a tip end portion of the probe pin and a longitudinal direction of a metal wire is set to 45 degree or less, or both directions are set to be almost parallel to each other. Due to above configuration, even if the tip end portion of the probe pin is subjected to a bending work and a worked surface is formed with recessed portion, a breakage of the probe pin caused by the recessed portion existing on the worked surface and functioning as a starting point of the breakage can be effectively prevented whereby a lowering of a production yield of the probe pin can be greatly suppressed.

Claims (7)

1. A method of manufacturing a probe pin, comprising:

preparing a probe pin raw material by cutting a metal wire; and

forming a tapered portion by machine-working a tip end portion of the probe pin raw material while the probe pin raw material is continuously rotated around an axis thereof while forming an entirety of the tapered portion;

wherein said machine-working is a grinding work in which the tip end portion of the probe pin raw material abuts against a grinding surface of a rotary-type grinding wheel whereby the tip end portion is ground thereby to form the tapered portion having a frustum-shape, and an angle constituted by a traveling direction of the grinding surface of the grinding wheel and a longitudinal direction of the metal wire is set to 45 degree or less, and

wherein a rotation number of the grinding wheel is 500 to 5000 rpm, a cutting rate of the grinding surface with respect to the metal wire is within a range of 0.01 to 5 mm/sec, a mesh size of abrasive grains is 500 to 1500, and a tip end portion of the probe pin has a surface roughness Ra of 5 μm or less.

2. The method of manufacturing the probe pin according to claim 1 , wherein said traveling direction of the grinding surface of the rotary grinding wheel is substantially parallel with the longitudinal direction of the metal wire.

3. The method of manufacturing the probe pin according to claim 1 , wherein said grinding work is performed in a state where a grinding fluid is coated onto the grinding surface of the metal wire.

Assignments (3)
NUNC PRO TUNC ASSIGNMENT Recorded Feb 19, 2026
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MATERIALS CO. LTD.
Reel/Frame 074940/0511 →
CHANGE OF NAME Recorded Feb 19, 2026
From: TOSHIBA MATERIALS CO. LTD.
To: NITERRA MATERIALS CO., LTD.
Reel/Frame 074941/0803 →
CHANGE OF ADDRESS Recorded Feb 19, 2026
From: KABUSHIKI KAISHA TOSHIBA
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 074941/0846 →
Priority Claims (1)
JP 2008-026527 · Feb 6, 2008 · national
Continuity (2)
Division 12866397
Related Publication 20130029564A1 · Jan 31, 2013