IP Library Granted Patent US 8,603,593
Granted Patent B1
US 8,603,593 · App. 13/621,799 · Granted Dec 10, 2013

Method for providing an improved hard bias structure

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Quick Facts
Patent No.
US 8,603,593
App. No.
13/621,799
Granted
Dec 10, 2013
Kind
B1
Abstract

A method for providing a hard bias structure is provided. The method comprises providing a seed layer for a hard bias layer, the seed layer having a seed layer lattice constant and a natural growth texture. The method further comprises depositing the hard bias layer for the hard bias structure on the seed layer, the natural growth texture corresponding to a texture for the hard bias layer. The hard bias layer has a bulk lattice constant. The step of providing the seed layer includes forming a first plasma of a first deposition gas configured to expand the seed layer lattice constant if the bulk lattice constant is greater than the seed layer constant. The step of depositing the hard bias layer includes forming a second plasma of a second deposition gas configured to expand the bulk lattice constant if the seed layer lattice constant is greater than the bulk lattice constant.

Claims (31)

1. A method for providing a hard bias structure comprising:

providing a seed layer for a hard bias layer, the seed layer having a seed layer lattice constant and a natural growth texture;

depositing the hard bias layer for the hard bias structure on the seed layer, the natural growth texture corresponding to a texture for the hard bias layer, the hard bias layer having a bulk lattice constant;

wherein the step of providing the seed layer includes forming a first plasma of a first deposition gas configured to expand the seed layer lattice constant if the bulk lattice constant is greater than the seed layer constant; and

wherein the step of depositing the hard bias layer further includes forming a second plasma of a second deposition gas configured to expand the bulk lattice constant if the seed layer lattice constant is greater than the bulk lattice constant;

wherein the first deposition gas is lighter than the second deposition gas if the bulk lattice constant is greater than the seed layer lattice constant and wherein the second deposition gas is lighter than the first deposition gas if the seed layer lattice constant is greater than the bulk lattice constant.

2. The method of claim 1 wherein the seed layer includes a bilayer including an amorphous layer and a body-centered cubic layer on the amorphous layer.

3. The method of claim 2 wherein the amorphous layer includes at least one of Ta, TaZr, B, FeCoB, and ZrCuB.

4. The method of claim 1 wherein the seed layer includes a body-centered cubic material.

5. The method of claim 4 wherein the seed layer consists of the body-centered cubic material and the natural growth texture is (110).

6. The method of claim 1 wherein the seed layer includes at least one of CrTi, CrV, Cr, W, WCr, V, and NiAl.

7. The method of claim 1 wherein:

wherein if the bulk lattice constant is greater than the seed layer constant, the first deposition gas includes a first gas that is lighter than xenon and inert with respect to the seed layer; and

if the seed layer lattice constant is greater than the bulk lattice constant, the second deposition gas includes a second gas that is lighter than xenon and inert with respect to the hard bias layer.

8. The method of claim 7 wherein the first gas is a noble gas.

9. The method of claim 7 wherein the second gas is a noble gas.

10. The method of claim 1 wherein the hard bias layer includes at least one of CoPt, CoCrPt, and CoSm.

11. A method for providing a hard bias structure comprising:

providing a seed layer for a hard bias layer, the seed layer having a seed layer lattice constant and a natural growth texture;

depositing the hard bias layer for the hard bias structure on the seed layer, the natural growth texture corresponding to a texture for the hard bias layer, the hard bias layer having a bulk lattice constant; and

wherein the step of providing the seed layer includes forming a first plasma of a first deposition gas configured to expand the seed layer lattice constant if the bulk lattice constant is greater than the seed layer constant;

wherein the step of depositing the hard bias layer further includes forming a second plasma of a second deposition gas configured to expand the bulk lattice constant if the seed layer lattice constant is greater than the bulk lattice constant;

wherein the hard bias layer includes a material having a hexagonal close-packed crystal structure having a lattice constant that is not more than fifteen percent different from a CoPt lattice constant.

12. The method of claim 11 wherein the lattice constant is not more than ten percent different from the CoPt lattice constant.

13. A method for providing a hard bias structure comprising:

providing a seed layer for a hard bias layer, the step of providing the seed layer including

providing an amorphous Ta layer; and

providing a W layer on the Ta layer, the W layer having a seed layer lattice constant and a (110) natural growth texture; and

depositing the hard bias layer for the hard bias structure on the W layer in an Ar plasma, the hard bias layer including CoPt, the (110) natural growth texture corresponding to a (10 1 0) texture for the hard bias layer, the hard bias layer having a bulk lattice constant;

wherein the step of providing the seed layer includes forming a first plasma of a first deposition gas configured to expand the seed layer lattice constant if the bulk lattice constant is greater than the seed layer lattice constant, the first deposition gas being lighter than Ar if the bulk lattice constant is greater than the seed layer lattice constant; and

wherein the Ar is lighter than the first deposition gas and is configured to expand the bulk lattice constant if the seed layer lattice constant is greater than the bulk lattice constant.

Assignments (7)
RELEASE OF SECURITY INTEREST AT REEL 038710 FRAME 0845 Recorded Feb 8, 2022
From: JPMORGAN CHASE BANK, N.A.
To: WESTERN DIGITAL (FREMONT), LLC; WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 058965/0445 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 19, 2019
From: WESTERN DIGITAL (FREMONT), LLC
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 050450/0582 →
RELEASE OF SECURITY INTEREST Recorded Mar 5, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: WESTERN DIGITAL (FREMONT), LLC
Reel/Frame 045501/0158 →
SECURITY AGREEMENT Recorded May 16, 2016
From: WESTERN DIGITAL (FREMONT), LLC
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 038744/0755 →
SECURITY AGREEMENT Recorded May 16, 2016
From: WESTERN DIGITAL (FREMONT), LLC
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 038710/0845 →
SECURITY AGREEMENT Recorded May 16, 2016
From: WESTERN DIGITAL (FREMONT), LLC
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038744/0675 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 25, 2012
From: ROY, ANUP G.; PAKALA, MAHENDRA
To: WESTERN DIGITAL (FREMONT), LLC
Reel/Frame 029023/0457 →