IP Library Granted Patent US 8,837,195
Granted Patent B2
US 8,837,195 · App. 13/626,840 · Granted Sep 16, 2014

Systems and methods for reading ferroelectric memories

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,837,195
App. No.
13/626,840
Granted
Sep 16, 2014
Kind
B2
Abstract

A system and method are provided for reading ferroelectric memories in a manner that does away with a conventional requirement for inclusion of a charge or sense amplifier associated with each ferroelectric memory cell. Simple circuits are employed for modulating an AC signal that is generated and input, including wirelessly, to the circuits where a capacitance of a ferroelectric capacitor acts as a filter. Depending upon whether the ferroelectric memory (capacitor) is charged or discharged, it will have a different capacitance, which will affect the impedance that the signal sees. An ability to remotely read that signal difference, as an indication of capacitance, rather than an indication of charge, is provided to expand the use of ferroelectric memories to a broader spectrum of applications including use in RFID tags.

Claims (41)

1. A circuit for reading a ferroelectric memory cell, comprising:

a ferroelectric capacitor that stores a binary polarization state representing a single data bit in a ferroelectric memory;

an additional capacitor with a first electrode connected to a first electrode of the ferroelectric capacitor;

a resistor connected to the first electrode of the ferroelectric capacitor;

a capacitance of the ferroelectric capacitor being measured as an indication of the polarization state of the ferroelectric capacitor; and

an alternating current voltage source connected to the ferroelectric capacitor via the additional capacitor applies an alternating current voltage signal to the ferroelectric capacitor,

the capacitance of the ferroelectric capacitor being measured by referencing changes in the alternating current voltage signal.

2. The circuit of claim 1 , further comprising a first direct current voltage source connected to the ferroelectric capacitor via the resistor that applies a direct current voltage signal to the ferroelectric capacitor to alter the polarization state of the ferroelectric capacitor.

3. The circuit of claim 2 , further comprising a second direct current voltage source connected to a second electrode of the ferroelectric capacitor that applies a direct current voltage signal to the ferroelectric capacitor to alter the polarization state of the ferroelectric capacitor.

4. The circuit of claim 1 , the ferroelectric capacitor, the additional capacitor and the resistor being printed circuit components.

5. The circuit of claim 1 , the ferroelectric capacitor, the additional capacitor and the resistor being disposed on one or more flexible substrates.

6. A method of reading a ferroelectric memory, comprising:

applying an alternating current voltage signal across a ferroelectric capacitor;

measuring, with a processor, a capacitance of the ferroelectric capacitor by referencing changes in the alternating current voltage signal in at least one of a positive and negative polarization state for the ferroelectric capacitor;

outputting a result of the measuring to a user as an indication of a polarization state of the ferroelectric capacitor representing a single data bit in the ferroelectric memory; and

applying a direct current voltage signal to a ferroelectric capacitor to alter a polarization state of the ferroelectric capacitor,

the capacitance of the ferroelectric capacitor being measured with the processor as the polarization state of the ferroelectric capacitor is altered by the direct current voltage signal.

7. The method of claim 6 , the ferroelectric memory comprising a printed electronic circuit component.

8. The method of claim 6 , the ferroelectric memory being disposed on one or more flexible substrates.

9. The method of claim 6 , the applying the alternating current signal and the measuring the capacitance being done wirelessly.

10. The method of claim 9 , the wirelessly applying the alternating current voltage signal and measuring being accomplished using at least one of inductive coupling and capacitive coupling.

11. The method of claim 6 , the reading of the ferroelectric memory being non-destructive to the data stored in the ferroelectric memory before the reading.

12. The method of claim 6 , the ferroelectric memory comprising a plurality of ferroelectric capacitors and coupled respective transistors as individual memory cells, the method further comprising writing or reading the individual memory cells independently by selecting the individual memory cells through activation of the coupled respective transistors for the individual memory cells.

13. The method of claim 6 , further comprising applying one of more of differential or offset correction techniques to improve a signal to noise ratio in a measured alternating current signal.

14. A system that reads a ferroelectric memory, comprising:

a ferroelectric memory comprising a cell including a ferroelectric capacitor;

an alternating current voltage source that applies an alternating current voltage signal across the ferroelectric capacitor;

a measuring device that measures a capacitance of the ferroelectric capacitor by referencing changes in the alternating current voltage signal in at least one of a positive and negative polarization state; and

a direct current voltage source that applies a direct current voltage signal to the ferroelectric capacitor to alter a polarization state of the ferroelectric capacitor,

the capacitance of the ferroelectric capacitor being measured as the polarization state of the ferroelectric capacitor is altered by the direct current voltage signal.

15. The system of claim 14 , the ferroelectric memory comprising a printed electronic circuit component.

16. The system of claim 14 , a plurality of the components of the system being disposed on one or more flexible substrates.

17. The system of claim 14 , the alternating current voltage source wirelessly applying the alternating current voltage using at least one of inductive coupling and capacitive coupling.

18. The system of claim 14 , the ferroelectric memory comprising a plurality of ferroelectric capacitors and associated transistors as individual memory cells, the individual memory cells being independently written or read by selecting the individual memory cells through activation of the associated transistors for each of the individual memory cells.

19. A non-transitory computer-readable medium storing instructions which, when executed by a processor, cause the processor to execute the steps of a method of reading a ferroelectric memory, comprising:

applying an alternating current voltage signal across the ferroelectric capacitor;

measuring a capacitance of the ferroelectric capacitor by referencing changes in the alternating current voltage signal in at least one of a positive and negative polarization state for the ferroelectric capacitor;

outputting a result of the measuring to a user as an indication of a polarization state of the ferroelectric capacitor representing a single data bit in the ferroelectric memory; and

applying a direct current voltage signal to a ferroelectric capacitor to alter a polarization state of the ferroelectric capacitor,

the capacitance of the ferroelectric capacitor being measured as the polarization state of the ferroelectric capacitor is altered by the direct current voltage signal.

20. The non-transitory computer-readable medium of claim 19 , the applying the alternating current voltage signal and the measuring the capacitance being done wirelessly using at least one of inductive coupling and capacitive coupling.

Assignments (10)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 6, 2025
From: XEROX CORPORATION
To: GENESEE VALLEY INNOVATIONS, LLC
Reel/Frame 073842/0479 →
SECOND LIEN NOTES PATENT SECURITY AGREEMENT Recorded Jul 2, 2025
From: XEROX CORPORATION
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 071785/0550 →
FIRST LIEN NOTES PATENT SECURITY AGREEMENT Recorded Apr 11, 2025
From: XEROX CORPORATION
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 070824/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT RF 064760/0389 Recorded Feb 13, 2024
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: XEROX CORPORATION
Reel/Frame 068261/0001 →
SECURITY INTEREST Recorded Feb 13, 2024
From: XEROX CORPORATION
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 066741/0001 →
SECURITY INTEREST Recorded Nov 20, 2023
From: XEROX CORPORATION
To: JEFFERIES FINANCE LLC, AS COLLATERAL AGENT
Reel/Frame 065628/0019 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVAL OF US PATENTS 9356603, 10026651, 10626048 AND INCLUSION OF US PATENT 7167871 PREVIOUSLY RECORDED ON REEL 064038 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jun 28, 2023
From: PALO ALTO RESEARCH CENTER INCORPORATED
To: XEROX CORPORATION
Reel/Frame 064161/0001 →
SECURITY INTEREST Recorded Jun 22, 2023
From: XEROX CORPORATION
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 064760/0389 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 20, 2023
From: PALO ALTO RESEARCH CENTER INCORPORATED
To: XEROX CORPORATION
Reel/Frame 064038/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 25, 2012
From: SCHWARTZ, DAVID ERIC
To: PALO ALTO RESEARCH CENTER INCORPORATED
Reel/Frame 029024/0086 →