Gain correction for fast panel scanning

1. A method comprising:

generating a correction factor for at least one of a plurality of capacitance sensors of a mutual capacitance touch sensing array, wherein the calculating a correction factor comprises

converting a second mutual capacitance of the plurality of capacitance sensors to a second digital value at a first transmit frequency,

converting a third mutual capacitance of the plurality of capacitance sensors to a third digital value at a second transmit frequency,

comparing the second and third digital values, and

calculating the correction factor based on the comparison of the second and third digital values;

generating a current derived from a first mutual capacitance of the at least one of the plurality of capacitance sensors;

applying the correction factor to the generated current to generate a corrected current;

converting the corrected current to a first digital value; and

determining a position of at least one conductive object in proximity to the plurality of capacitance sensors based on the digital value.

2. The method claim 1 , wherein the comparison of the second and third digital values occurs during manufacturing of the plurality of capacitance sensors.

3. The method claim 1 , wherein the comparison of the second and third digital values occurs at device start up.

4. The method claim 1 , wherein the comparison of the second and third digital values generates a curve fit corresponding to differences between digital values of each of the plurality of capacitance sensors.

5. The method claim 4 , wherein the curve fit is an exponential relationship.

6. The method claim 4 , wherein the applying the correction factor to the generated current of the at least one of the plurality of capacitance sensors comprises multiplying the generated current by the calculated correction factor.

7. The method of claim 1 , wherein the correction factor is a value of an integration capacitor of a capacitance measurement circuit.

8. The method of claim 1 , wherein the correction factor is an attenuation ratio on an input of a capacitance measurement circuit.

9. An apparatus comprising:

a plurality of mutual capacitance touch sensors;

signal transmit circuitry coupled to each of the plurality of mutual capacitance sensors, the transmit circuit configurable to generate a plurality of signals, the plurality of signals having different frequencies;

signal receive circuitry coupled to each of the plurality of mutual capacitance sensors, the receive circuitry configurable to convert a current derived from the transmit signal and a first mutual capacitance to a first digital value representative of the transmit signal and the mutual capacitance of the sensor; and

processing circuitry configurable to:

receive the digital value,

apply a correction factor to the current generated by the transmit signal and the mutual capacitance of the at least one of the plurality of capacitance sensors, the correction factor generated by:

converting a second mutual capacitance at a first transmit frequency to a second digital value

converting a third mutual capacitance at a second transmit frequency to a third digital value,

comparing the second and third digital values, and

calculating the correction factor based on the comparison of the second and third digital values, and

determine a position of at least one conductive object in proximity to the plurality of capacitance sensors based on a corrected current from the generated current and the correction factor.

10. The apparatus of claim 9 , wherein the correction factor is calculated from a curve fit of the differences between the second and third digital values.

11. The apparatus of claim 10 , wherein the curve fit is an exponential relationship.

12. The apparatus of claim 11 , wherein the correction factor is calculated during device manufacturing and stored in a memory.

13. The apparatus of claim 9 , wherein the correction factor is a value of an integration capacitor of a capacitance measurement circuit.

14. The apparatus of claim 9 , wherein the correction factor is an attenuation ratio on an input of a capacitance measurement circuit.

15. A system comprising:

a mutual capacitance touch sensing array configurable to be driven at a plurality of frequencies;

mutual capacitance measurement circuitry configured to convert a current derived from the plurality of frequencies and a first mutual capacitance of each of a plurality of nodes of the mutual capacitance sensing array to digital values representative of the first mutual capacitance of each of the plurality of nodes of the mutual capacitance sensing array; and

processing circuitry configurable to:

receive the digital value representative of the transmit signal and the mutual capacitance of the sensor,

apply a correction factor to the generated current derived from the plurality of frequencies and the at least one of the plurality of capacitance sensors to produce a corrected current, the correction factor generated by:

converting a second mutual capacitance at a first transmit frequency to a second digital value,

converting a third mutual capacitance at a second transmit frequency to a third digital value,

comparing the second and third digital values, and

calculating the correction factor based on the comparison of the second and third digital values, and

determine a position of at least one conductive object in proximity to the plurality of capacitance sensors based on the digital values from the corrected current.

16. The system of claim 15 , wherein the correction factor is calculated from a curve fit of the differences between second and third digital values.

17. The system of claim 15 , wherein the correction factor is a value of an integration capacitor of a capacitance measurement circuit.

18. The system of claim 15 , wherein the correction factor is an attenuation ratio on an input of a capacitance measurement circuit.