Techniques for interconnecting stacked dies using connection sites

1. An integrated circuit die, comprising:

conductive connection sites located at least on a surface of the integrated circuit die within a contiguous region thereof;

a first core circuit located outside the contiguous region; and

alignment circuitry configurable to couple a first subset of the connection sites to the first core circuit and to decouple a second subset of the connection sites from the first core circuit, the alignment circuitry additionally configurable to decouple the first subset of the connection sites from the first core circuit and to couple the second subset of the connection sites to the first core circuit.

2. The integrated circuit die of claim 1 , wherein the contiguous region is configured as a connection stripe extending across the integrated circuit die.

3. An integrated circuit die, comprising:

conductive connection sites located at least on a surface of the integrated circuit die within a contiguous region thereof;

a first core circuit located outside the contiguous region; and

alignment circuitry configurable to couple a first subset of the connection sites to the first core circuit and to decouple a second subset of the connection sites from the first core circuit, the alignment circuitry additionally configurable to decouple the second subset of the connection sites from every core circuit on the integrated circuit die.

4. An integrated circuit die, comprising:

conductive connection sites located at least on a surface of the integrated circuit die within a contiguous region thereof;

a first core circuit located outside the contiguous region;

a second core circuit; and

alignment circuitry configurable to couple a first subset of the connection sites to the first core circuit and to decouple a second subset of the connection sites from the first core circuit, the alignment circuitry additionally configurable to couple the first subset of the connection sites to the second core circuit and to couple the second subset of the connection sites to the first core circuit.

5. The integrated circuit die of claim 4 , wherein the alignment circuitry is additionally dynamically configurable to decouple the first subset of the connection sites from the second core circuit and to couple the second subset of the connection sites to the second core circuit.

6. An integrated circuit die, comprising:

connection sites located at least on a surface of the integrated circuit die;

a first core circuit;

a second core circuit; and

alignment circuitry configurable to couple the first core circuit to a first one of the connection sites and the second core circuit to a second one of the connection sites in a first alignment configuration, wherein the alignment circuitry is additionally configurable to couple the first core circuit to the second one of the connection sites and the second core circuit to the first one of the connection sites in a second alignment configuration, and wherein the connection sites are all located within a contiguous region overlapping none of the first core circuit, the second core circuit and the alignment circuitry.

7. The integrated circuit die of claim 6 , wherein the alignment circuitry comprises conductors coupled to multiplexers.

8. The integrated circuit die of claim 6 , further comprising:

arbitration circuitry that dynamically configures the alignment circuitry to couple any of the first and the second core circuits to any external device in a set of external devices through the connection sites during a process that causes the alignment circuitry to cycle through the first and the second alignment configurations, wherein the alignment circuitry couples each of the first and the second core circuits to at least one of the external devices through a subset of the connection sites in each of the first and the second alignment configurations, and wherein the alignment circuitry couples the first and the second core circuits to different external devices through different subsets of the connection sites when changing between the first and the second alignment configurations.

9. The integrated circuit die of claim 8 , wherein the arbitration circuitry causes the alignment circuitry to skip any of the first and the second alignment configurations that are not needed for the transmission of signals.

10. The integrated circuit die of claim 6 , wherein the alignment circuitry couples each of the first and the second core circuits to only a subset of the connection sites at any one time.

11. The integrated circuit die of claim 6 , wherein the alignment circuitry comprises a lateral track comprising segments of conductors and multiplexers that couple the segments of conductors together, and wherein the lateral track is configurable to conduct multiple bits of information at one time on different ones of the segments of the conductors of the lateral track.

12. The integrated circuit die of claim 6 , wherein the alignment circuitry is configurable to couple the first and the second core circuits to different subsets of the connection sites in order to couple the first and the second core circuits to connection sites of external devices having different sizes.

13. The integrated circuit die of claim 6 , wherein:

the surface is a first surface, and

the connection sites comprise through-silicon-vias that extend through the integrated circuit die from the first surface to a second surface, opposite the first surface.

14. A method comprising:

configuring alignment circuitry on an integrated circuit die according to a first alignment configuration;

transmitting signals through the alignment circuitry configured according to the first alignment configuration between a first core circuit in the integrated circuit die and a first connection site on the integrated circuit die;

configuring the alignment circuitry according to a second alignment configuration; and

transmitting signals through the alignment circuitry configured according to the second alignment configuration between the first core circuit and a second connection site on the integrated circuit die.

15. The method of claim 14 further comprising:

transmitting signals through the alignment circuitry configured according to the first alignment configuration between a second core circuit in the integrated circuit die and the second connection site; and

transmitting signals through the alignment circuitry configured according to the second alignment configuration between the second core circuit and the first connection site.

16. The method of claim 14 further comprising:

transmitting signals through the alignment circuitry configured according to the first alignment configuration between a second core circuit in the integrated circuit die and a third connection site on the integrated circuit die; and

transmitting signals through the alignment circuitry configured according to the second alignment configuration between the second core circuit and a fourth connection site on the integrated circuit die.

17. The method of claim 14 wherein the first and the second connection sites are located within a contiguous region of a surface of the integrated circuit die, and wherein the first core circuit is located outside the contiguous region.

18. The method of claim 15 wherein configuring alignment circuitry on an integrated circuit die according to a first alignment configuration further comprises configuring the alignment circuitry according to the first alignment configuration in response to a request for a first transaction from the first core circuit and in response to a request for a second transaction from the second core circuit, and

wherein configuring the alignment circuitry according to a second alignment configuration further comprises configuring the alignment circuitry according to the second alignment configuration in response to a request for a third transaction from the first core circuit and in response to a request for a fourth transaction from the second core circuit.