IP Library Granted Patent US 9,271,159
Granted Patent B2
US 9,271,159 · App. 13/659,522 · Granted Feb 23, 2016

Methods, systems, and computer readable media for testing a diameter routing node

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Quick Facts
Patent No.
US 9,271,159
App. No.
13/659,522
Granted
Feb 23, 2016
Kind
B2
Abstract

According to one aspect, the subject matter described herein includes a method for testing a Diameter routing node. The method occurs a Diameter routing node. The method includes receiving, from a Diameter message generation module and via a test connection, a first Diameter message. The method also includes modifying the first Diameter message to include a test indicator parameter indicating the first Diameter message is a test message. The method further includes processing the first Diameter message. The method also includes directing the first Diameter message to an egress message manager.

Claims (46)

1. A method for testing a Diameter routing node, the method comprising:

at a Diameter routing node:

receiving, from a Diameter message generation module and via a test connection, a first Diameter message;

modifying, by the Diameter routing node, the first Diameter message to include a test indicator parameter indicating the first Diameter message is a test message;

processing the first Diameter message;

directing the first Diameter message to an egress message manager; and

at the egress message manager:

determining whether the first Diameter message is destined for a non-test-related destination using the test indicator parameter, wherein the non-test-related destination is a destination other than a test analyzer node, an operations, administration, and management (OAM) node, or the Diameter message generation module; and

in response to determining the first Diameter message is destined for the non-test-related destination, discarding the first Diameter message.

2. The method of claim 1 comprising:

in response to determining the first Diameter message is destined for a test-related destination, sending the first Diameter message or information associated with the first Diameter message to the test-related destination.

3. The method of claim 2 wherein sending the first Diameter message or information associated with the first Diameter message to the test-related destination includes extracting information from the first Diameter message, discarding the first Diameter message, and providing the extracted information to the test-related destination.

4. The method of claim 2 wherein the test-related destination is a test analyzer node, an operations, administration, and management (OAM) node, or the Diameter message generation module.

5. The method of claim 1 wherein the Diameter routing node comprises a Diameter signaling router (DSR).

6. The method of claim 1 wherein the test connection is associated with a long term evolution (LTE) interface.

7. The method of claim 1 wherein the Diameter message generation module includes a Diameter test message generator module or a Diameter peer node.

8. The method of claim 1 wherein processing the first Diameter message includes adding information to, deleting information from, or modifying information contained in the first Diameter message.

9. The method of claim 1 wherein processing the first Diameter message includes generating a second Diameter message associated with the first Diameter message.

10. The method of claim 9 wherein the second Diameter message includes a test indicator parameter indicating the second Diameter message is a test message.

11. The method of claim 10 wherein the second Diameter message is directed to the egress message manager.

12. A system for testing a Diameter routing node, the system comprising:

a Diameter routing node, the Diameter routing node comprising:

an egress message manager;

a connection module configured to receive, from a Diameter message generation module and via a test connection, a first Diameter message and to modify the first Diameter message to include a test indicator parameter indicating the first Diameter message is a test message; and

a processing module configured to process the first Diameter message and to direct the first Diameter message to the egress message manager, wherein the egress message manager determines whether the first Diameter message is destined for a non-test-related destination using the test indicator parameter, wherein the non-test-related destination is a destination other than a test analyzer node, an operations, administration, and management (OAM) node, or the Diameter message generation module and in response to determining the first Diameter message is destined for the non-test-related destination, to discard the first Diameter message.

13. The system of claim 12 wherein the egress message manager is configured, in response to determining the first Diameter message is destined for a test-related destination, to send the first Diameter message or information associated with the first Diameter message to the test-related destination.

14. The system of claim 13 wherein the egress message manager is configured to extract information from the first Diameter message, discard the first Diameter message, and provide the extracted information to the test-related destination.

15. The system of claim 13 wherein the test-related destination is a test analyzer node, an operations, administration, and management (OAM) node, or the Diameter message generation module.

16. The method of claim 1 wherein the Diameter routing node comprises a Diameter signaling router (DSR).

17. The system of claim 12 wherein the test connection is associated with a long term evolution (LTE) interface.

18. The system of claim 12 wherein the Diameter message generation module includes a Diameter test message generator module or a Diameter peer node.

19. The system of claim 12 wherein the processing module is configured to add information to, delete information from, or modify information contained in the first Diameter message.

20. The system of claim 12 wherein the processing module is configured to generate a second Diameter message associated with the first Diameter message.

21. The system of claim 20 wherein the second Diameter message includes a test indicator parameter indicating the second Diameter message is a test message.

22. The system of claim 21 wherein the processing module is configured to direct the second Diameter message to the egress message manager.

23. A non-transitory computer readable medium having stored thereon executable instructions that when executed by the processor of a computer control the computer to perform steps comprising:

receiving, from a Diameter message generation module and via a test connection, a first Diameter message;

modifying, by the Diameter routing node, the first Diameter message to include a test indicator parameter indicating the first Diameter message is a test message;

processing the first Diameter message; and

directing the first Diameter message to an egress message manager;

at the egress message manager:

determining whether the first Diameter message is destined for a non-test-related destination using the test indicator parameter, wherein the non-test-related destination is a destination other than a test analyzer node, an operations, administration, and management (OAM) node, or the Diameter message generation module; and

in response to determining the first Diameter message is destined for the non-test-related destination, discarding the first Diameter message.

24. The method of claim 1 wherein the test indicator parameter includes a test message flag in a header of the first Diameter message identifying the first Diameter message as a test message.

25. The system of claim 12 wherein the test indicator parameter includes a test message flag in a header of the first Diameter message identifying the first Diameter message as a test message.

26. The non-transitory computer readable medium of claim 23 wherein the test indicator parameter includes a test message flag in a header of the first Diameter message identifying the first Diameter message as a test message.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 24, 2013
From: KHADRI, SEETHARAMAN; RAO, SRIKANTH NANJUND; MARSICO, PETER J.
To: TEKELEC, INC.
Reel/Frame 030484/0252 →