IP Library Granted Patent US 8,859,315
Granted Patent B2
US 8,859,315 · App. 13/663,000 · Granted Oct 14, 2014

Epitaxial wafer and manufacturing method thereof

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Quick Facts
Patent No.
US 8,859,315
App. No.
13/663,000
Granted
Oct 14, 2014
Kind
B2
Abstract

A semiconductor device comprises a substrate; a conductive layer deposited on a substrate, the conductive layer being patterned to include a first pattern, the first pattern including a major surface and a plurality of grids defined in the major surface, the major surface including first lines and a connecting portion, wherein the connecting portion is connected to an electrode; and an epitaxial layer disposed on the conductive layer, covering the grids and the first line between the adjacent grids.

Claims (12)

1. A method for depositing an epitaxial layer in a semiconductor device, the method comprising:

providing a substrate;

depositing a conductive layer on the substrate;

patterning the conductive layer to include a first pattern and a second pattern, the first pattern and the second pattern including a major surface and a plurality of grids defined in the major surface, the-first pattern including a plurality of first lines between adjacent grids and a connecting portion, wherein the second pattern including at least two first patterns, each of the at least two first patterns being separated by a second line, the connecting portion is being connected to an electrode and adjacent to the second line, wherein the first lines have a different width than the second lines; and

depositing an epitaxial layer on the patterned conductive layer, comprising

depositing a first layer on the patterned conductive layer, the first layer including a first type of semiconductor material,

depositing an active layer on the first layer, and

depositing a second layer on the active layer, the second layer including a second type of semiconductor material, wherein the epitaxial layer covers the grids and the first lines between the grids, and wherein the second line has a width of about 5-1000 μm.

2. The method of claim 1 , wherein the first line has a width of about 1-20 μm.

3. The method of claim 1 , further comprising patterning the conductive layer to include a third pattern, the third pattern including at least two second patterns, each of the at least two second patterns being separated by a third line major surface, wherein the third line has a width of about 200-5000 μm.

4. The method of claim 3 , wherein the connecting portion is adjacent to one of the second line or the third line.

5. The method of claim 1 , wherein the shape of the grids comprises one of polygon, ellipse or circle shapes.

Assignments (2)
CHANGE OF NAME Recorded Feb 11, 2021
From: BYD MICROELECTRONICS CO., LTD.
To: BYD SEMICONDUCTOR COMPANY LIMITED
Reel/Frame 055280/0971 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 10, 2020
From: BYD COMPANY LIMITED
To: BYD MICROELECTRONICS CO., LTD.
Reel/Frame 051561/0906 →