IP Library Granted Patent US 9,121,942
Granted Patent B2
US 9,121,942 · App. 13/668,580 · Granted Sep 1, 2015

Guided wave radar delay lock loop circuit

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Quick Facts
Patent No.
US 9,121,942
App. No.
13/668,580
Granted
Sep 1, 2015
Kind
B2
Abstract

A guided wave radar level measurement instrument comprises a probe defining a transmission line for sensing material level. A probe interface circuit is connected to the probe for generating pulses on the transmission line and receiving reflected signals from the transmission line. The probe interface circuit comprises a transmit pulse generator for generating a transmit pulse, a sample pulse generator for generating a sample pulse, and a delay lock loop for controlling the transmit and sample pulse generators. The delay lock loop is controlled by a pulse repetition frequency having a duty cycle less than 50%.

Claims (27)

1. A guided wave radar level measurement instrument comprising:

a probe defining a transmission line for sensing material level; and

a probe interface circuit connected to the probe for generating pulses on the transmission line and receiving reflected signals from the transmission line, the probe interface circuit comprising a transmit pulse generator for generating a transmit pulse, a sample pulse generator for generating a sample pulse, and a delay lock loop for controlling the transmit and sample pulse generators, the delay lock loop being controlled by a pulse repetition frequency signal having a duty cycle less than 50%.

2. The guided wave radar level measurement instrument of claim 1 wherein the pulse repetition frequency signal has a duty cycle of about 25% on time.

3. The guided wave radar level measurement instrument of claim wherein the delay lock loop uses an RC time constant to generate delay in the delay lock loop.

4. The guided wave radar level measurement instrument of claim 3 wherein the RC time constant is determined by a capacitor and a parallel combination of first and second resistors during a charge interval and by the first resistor in a discharge interval.

5. The guided wave radar level measurement instrument of claim 4 wherein the second resistor is connected in series with a switch and the switch is controlled by the pulse repetition frequency signal.

6. The guided wave radar level measurement instrument of claim 4 wherein the capacitor is charged on a high side of the pulse repetition frequency signal.

7. The guided wave radar level measurement instrument of claim 4 wherein the capacitor is charged on a low side of the pulse repetition frequency signal.

8. A guided wave radar level measurement instrument comprising:

a probe defining a transmission line for sensing material level; and

a probe interface circuit connected to the probe for generating pulses on the transmission line and receiving reflected signals from the transmission line, the probe interface circuit comprising a transmit pulse generator for generating a transmit pulse, a sample pulse generator for generating a sample pulse, and a delay lock loop for controlling the transmit and sample pulse generators, the delay lock loop using an RC time constant to generate delay in the delay lock loop with charge time of a capacitor being faster than a discharge time and the delay lock loop being controlled by a pulse repetition frequency signal having a duty cycle less than 50%.

9. The guided wave radar level measurement instrument of claim 8 wherein the pulse repetition frequency signal has a duty cycle of about 25% on time.

10. The guided wave radar level measurement instrument of claim 8 wherein the RC time constant is determined by a capacitor and a parallel combination of first and second resistors during a charge interval and by the first resistor in a discharge interval.

11. The guided wave radar level measurement instrument of claim 10 wherein the second resistor is connected in series with a switch and the switch is controlled by the pulse repetition frequency signal.

12. The guided wave radar level measurement instrument of claim 10 wherein the capacitor is charged on a high side of the pulse repetition frequency signal.

13. The guided wave radar level measurement instrument of claim 10 wherein the capacitor is charged on a low side of the pulse repetition frequency signal.

14. A time domain reflectometry measurement instrument comprising:

a probe defining a transmission line for sensing material level;

a probe interface circuit connected to the probe for generating pulses on the transmission line and receiving reflected signals from the transmission line, the probe interface circuit comprising a transmit pulse generator for generating a transmit pulse, a sample pulse generator for generating a sample pulse, and a delay lock loop for controlling the transmit and sample pulse generators, the delay lock loop being controlled by a pulse repetition frequency signal having a duty cycle less than 50%; and

a ramp generator connected to the delay lock loop to implement equivalent time sampling of the reflected signal.

15. The time domain reflectometry measurement instrument of claim 14 wherein the pulse repetition frequency signal has a duty cycle of about 25% on time.

16. The time domain reflectometry measurement instrument of claim 14 wherein the RC time constant is determined by a capacitor and a parallel combination of first and second resistors during a charge interval and by the first resistor in a discharge interval.

17. The time domain reflectometry measurement instrument of claim 16 wherein the second resistor is connected in series with a switch and the switch is controlled by the pulse repetition frequency signal.

18. The time domain reflectometry measurement instrument of claim 16 wherein the capacitor is charged on a high side of the pulse repetition frequency signal.

19. The time domain reflectometry measurement instrument of claim 16 wherein capacitor is charged on a low side of the pulse repetition frequency signal.

20. The time domain reflectometry measurement instrument of claim 14 wherein the ramp generator sets a distance between consecutive delay pulses.

Assignments (3)
CHANGE OF NAME Recorded Oct 18, 2021
From: AMETEK DE, LLC
To: AMETEK MAGNETROL USA, LLC
Reel/Frame 057841/0511 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 15, 2021
From: MAGNETROL INTERNATIONAL, INCORPORATED
To: AMETEK DE, LLC
Reel/Frame 057805/0474 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 5, 2012
From: SUSSMAN, TIMOTHY S.
To: MAGNETROL INTERNATIONAL, INCORPORATED
Reel/Frame 029240/0237 →