Detection optical system and scanning microscope
View Patent ↗Provided is a detection optical system that is provided with a dispersed-light detection function and that can increase the amount of detected light by enhancing the diffraction efficiency. A detection optical system is employed which includes a transmissive VPH diffraction grating that disperses fluorescence from a specimen into a plurality of wavelength bands; a rotating mechanism that rotates the VPH diffraction grating about an axial line that is perpendicular to an incident optical axis of the fluorescence from the specimen and an emission optical axis from the VPH diffraction grating; a light detection portion that detects the fluorescence from the specimen that has been dispersed by the VPH diffraction grating; and a correcting portion that corrects an incident position on the light detection portion in accordance with a displacement of the optical axis caused by the rotation of the VPH diffraction grating in synchronization with the rotating mechanism.
1. A detection optical system comprising:
a transmissive volume phase holographic (VPH) diffraction grating that disperses light from a specimen into a plurality of wavelength bands;
a rotating mechanism that rotates the VPH diffraction grating about an axial line that is perpendicular to an incident optical axis of the light from the specimen and an emission optical axis from the VPH diffraction grating;
a light detection portion that detects the light from the specimen that has been dispersed by the VPH diffraction grating; and
a correcting portion that corrects, in synchronization with the rotating mechanism, an incident position on the light detection portion for light from the specimen in accordance with a displacement of the emission optical axis caused by the rotation of the VPH diffraction grating,
wherein the correcting portion corrects a difference between: (i) a first emission angle, at which the light from the specimen having a predetermined wavelength is emitted from the VPH diffraction grating when the VPH diffraction grating is at a first rotation angle, and (ii) a second emission angle, at which the light from the specimen having the predetermined wavelength is emitted from the VPH diffraction grating when the VPH diffraction grating is at a second rotation angle.
2. The detection optical system according to claim 1 , wherein the correcting portion comprises:
a reflecting portion that reflects the light from the specimen; and
a reflecting-portion rotating mechanism that rotates the reflecting portion, in synchronization with the rotating mechanism, about an axial line that is parallel to a rotating axis of the VPH diffraction grating.
3. The detection optical system according to claim 2 , wherein the reflecting-portion rotating mechanism rotates the reflecting portion by an angle Δα/2 about the axial line, based on the following expression:
Δα=2 sin −1 {N (λ s t d +Δλ)/2)}−sin −1 ( Nλ s t d /2)−sin −1 {N (λ s t d /2+Δλ)}
wherein:
Δα is a displacement angle of the emission optical axis of the light from the specimen that has passed through the VPH diffraction grating,
N is a constant determined by the properties of the VPH diffraction grating,
λ s t d is a wavelength at which a maximum efficiency is achieved when the angle of the VPH diffraction grating is at a standard angle, and
Δλ is a difference between a wavelength that needs to be detected and the wavelength for which the maximum efficiency is achieved.
4. The detection optical system according to claim 1 , wherein the correcting portion comprises a light-detection-portion rotating mechanism that rotates the light detection portion by an angle Δα about a rotating axis of the VPH diffraction grating.
5. The detection optical system according to claim 4 , wherein the light-detection-portion rotating mechanism rotates the light detection portion about the rotating axis of the VPH diffraction grating, based on the following expression:
Δα=2 sin −1 {N (λ s t d +Δλ)/2)}−sin −1 ( Nλ s t d /2)−sin −1 {N (λ s t d /2+Δλ)}
wherein:
Δα is a displacement angle of the emission optical axis of the light from the specimen that has passed through the VPH diffraction grating,
N is a constant determined by the properties of the VPH diffraction grating,
λ s t d is a wavelength at which a maximum efficiency is achieved when the angle of the VPH diffraction grating is at a standard angle, and
Δλ is a difference between a wavelength that needs to be detected and the wavelength for which the maximum efficiency is achieved.
6. The detection optical system according to claim 1 , wherein the light detection portion is a multichannel photomultiplier tube.
7. The detection optical system according to claim 1 , further comprising a wavelength-selecting slit that selects a wavelength of the light that enters the light detection portion,
wherein the light detection portion is a single-channel photomultiplier tube.
8. A scanning microscope comprising:
a light source;
a scanning portion that scans light emitted from the light source onto the specimen;
an objective optical system that focuses the light scanned by the scanning portion onto the specimen and also collects light from the specimen; and
the detection optical system according to claim 1 .
9. The detection optical system according to claim 1 , wherein the light detection portion is a multichannel detector.
10. The detection optical system according to claim 1 , further comprising a wavelength-selecting slit that selects a wavelength of the light that enters the light detection portion,
wherein the light detection portion is a single-channel detector.