Level measurement instrument fiducial detection method
View Patent ↗A process measurement instrument includes a fiducial and is adapted for detection of the fiducial. The instrument includes an interface circuit comprising a drive circuit for transmitting a pulse signal at the fiducial and at a target of interest and a receive circuit receiving reflected echoes of the pulse signal and developing an analog receive signal representative of the reflected echoes. A processing circuit is operatively coupled to the interface circuit for receiving the analog receive signal and comprising a threshold detector detecting if the analog receive signal is above a select threshold value. A controller is operatively coupled to the processing circuit and responsive to leading and trailing edges of the reflected echo for the fiducial and determining an average of the leading and trailing edges to determine location of the fiducial.
1. A process measurement instrument including a fiducial and adapted for detection of the fiducial comprising:
an interface circuit comprising a drive circuit for transmitting a pulse signal at the fiducial and at a target of interest and a receive circuit receiving reflected echoes of the pulse signal and developing an analog receive signal representative of the reflected echoes;
a processing circuit operatively coupled to the interface circuit for receiving the analog receive signal and comprising a threshold detector detecting if the analog receive signal is above a select threshold value; and
a controller operatively coupled to the processing circuit and responsive to leading and trailing edges of the reflected echo for the fiducial and determining an average of the leading and trailing edges to determine location of the fiducial.
2. The process measurement instrument of claim 1 wherein the interface circuit is operatively coupled to a probe defining a transmission line.
3. The process measurement instrument of claim 1 wherein the interface circuit is operatively coupled to a probe defining an antenna.
4. The process measurement instrument of claim 1 wherein the controller comprises a programmed processor.
5. The process measurement instrument of claim 4 wherein the select threshold value is determined by the programmed processor.
6. The process measurement instrument of claim 1 wherein the leading and trailing edges are determined by the analog receive signal being greater than and subsequently less than the select threshold value during a fiducial detection time window.
7. The process measurement instrument of claim 1 wherein the controller determines if the fiducial echo is not received in a receive window and responsive thereto indicates a no fiducial diagnostic.
8. The process measurement instrument of claim 1 wherein the controller is responsive to leading and trailing edges of a reflected echo for a reference target and determining an average of the leading and trailing edges to determine location of the reference target.
9. The process measurement instrument of claim 1 wherein the controller is responsive to leading and trailing edges of a reflected echo for an end of a probe and determining an average of the leading and trailing edges to determine location of the end of the probe.
10. The process measurement instrument of claim 1 wherein the controller is responsive to leading and trailing edges of a reflected echo for the target of interest and determining an average of the leading and trailing edges to determine location of the target of interest.
11. A process measurement instrument including a fiducial and adapted for detection of the fiducial comprising:
an interface circuit comprising a drive circuit for transmitting a pulse signal at the fiducial and at a target of interest and a receive circuit receiving reflected echoes of the pulse signal and developing an analog receive signal representative of the reflected echoes;
a processing circuit operatively coupled to the interface circuit for receiving the analog receive signal and comprising a threshold detector detecting if the analog receive signal is above a select threshold value; and
a controller operatively coupled to the processing circuit and responsive to the reflected echo for the fiducial to determine location of a center of the reflected echo for the fiducial to determine location of the fiducial.
12. The process measurement instrument of claim 11 wherein the interface circuit is operatively coupled to a probe defining a transmission line.
13. The process measurement instrument of claim 11 wherein the interface circuit is operatively coupled to a probe defining an antenna.
14. The process measurement instrument of claim 11 wherein the controller comprises a programmed processor.
15. The process measurement instrument of claim 14 wherein the select threshold value is determined by the programmed processor.
16. The process measurement instrument of claim 11 wherein the controller determines leading and trailing edges of the reflected echo for the fiducial responsive to the analog receive signal being greater than and subsequently less than the select threshold value during a fiducial detection time window.
17. The process measurement instrument of claim 16 wherein the location of the center of the reflected echo for the fiducial comprises an average of the leading and trailing edges.
18. The process measurement instrument of claim 11 wherein the controller determines if the fiducial echo is not received in a receive window and responsive thereto indicates a no fiducial diagnostic.
19. The process measurement instrument of claim 11 wherein the controller is responsive to leading and trailing edges of a reflected echo for a reference target and determining an average of the leading and trailing edges to determine location of the reference target.
20. The process measurement instrument of claim 11 wherein the controller is responsive to leading and trailing edges of a reflected echo for an end of a probe and determining an average of the leading and trailing edges to determine location of the end of the probe.
21. The process measurement instrument of claim 11 wherein the controller is responsive to leading and trailing edges of a reflected echo for the target of interest and determining an average of the leading and trailing edges to determine location of the target of interest.
22. A method of detecting location of a fiducial for a level measurement instrument comprising:
providing an interface circuit comprising a drive circuit for transmitting a pulse signal at the fiducial and at a target of interest and a receive circuit receiving reflected echoes of the pulse signal and developing an analog receive signal representative of the reflected echoes;
providing a processing circuit operatively coupled to the sensor circuit for receiving the analog receive signal and detecting if the analog receive signal is above a select value; and
providing a controller operatively coupled to the processing circuit and responsive to leading and trailing edges of the reflected echo for the fiducial to determine location of the fiducial.
23. The method of claim 22 wherein the wherein the select value is determined by the controller.
24. The method of claim 22 wherein the controller determines leading and trailing edges of the reflected echo for the fiducial responsive to the analog receive signal being greater than and subsequently less than the select value during a fiducial detection time window.
25. The method of claim 22 wherein the controller determines an average of the leading and trailing edges representing location of a center of the reflected echo for the fiducial.
26. The method of claim 22 further comprising determining if the fiducial echo is not received in a receive window and responsive thereto indicating a no fiducial diagnostic.
27. The method of claim 22 wherein the controller is responsive to leading and trailing edges of a reflected echo for a reference target and determining an average of the leading and trailing edges to determine location of the reference target.
28. The method of claim 22 wherein the controller is responsive to leading and trailing edges of a reflected echo for an end of a probe and determining an average of the leading and trailing edges to determine location of the end of the probe.
29. The method of claim 22 wherein the controller is responsive to leading and trailing edges of a reflected echo for the target of interest and determining an average of the leading and trailing edges to determine location of the target of interest.
30. The method of claim 22 wherein the controller is responsive to leading and trailing edges of a reflected echo for a level surface and determining an average of the leading and trailing edges to determine location of the level surface.