Device for analysis of a sample on a test element
View Patent ↗An analysis device for analysis of a sample on a test element is provided that comprises at least one component configured to make electrical contact with at least one other component for electrical transmission therebetween. The at least one component generally comprises an injection-molded circuit mount, also called an MID, or molded interconnect device.
1. An analysis device for analysis of a sample on a test element, comprising at least one first component configured to make electrical contact with at least one second component for electrical transmission therebetween, wherein the first component comprises an injection-molded circuit mount, wherein the first component has at least one sprung contact lug, configured to make contact with the second component, which sprung contact lug comprises a contact lug body comprising an injection-molded plastic and a metallic electrical conductor structure, wherein the contact lug is configured to make electrical contact with a rotating second component of the analysis device.
2. The analysis device of claim 1 , wherein the electrical contact of the first component with the second component comprises a type of electrical contact selected from the group consisting of sprung contact, plug-in contact, solder contact, sliding contact and conductive-adhesive contact.
3. The analysis device of claim 1 , wherein the first component comprises a functional assembly of the analysis device, and wherein the second component comprises a printed circuit board of the analysis device.
4. The analysis device of claim 3 , wherein the functional assembly comprises a component selected from the group consisting of a barcode reader arrangement, a transport unit for test elements, a motor module, a measurement module, a positioning device for a test element magazine, a test element magazine holder which contains a sensor, and a heat-treatment device.
5. The analysis device of claim 1 , wherein the first component comprises a contact element for test element evaluation of the analysis device, and the second component comprises a test element configured to be evaluated electrochemically.
6. The analysis device of claim 5 , wherein the contact element for test element evaluation is integrated in a test element magazine.
7. A method for producing an analysis device for analysis of a sample on a test element, comprising:
producing at least one first component configured to make electrical contact with at least one second component for electrical transmission therebetween, the first component comprising a base body and a metallic conductor structure, said producing being performed according to a method for producing injection-molded circuit mounts, wherein the first component has at least one sprung contact lug, configured to make contact with the second component, which spring contact lug comprises a contact lug body comprising an injection-molded plastic and a metallic electrical conductor structure, wherein the contact lug is configured to make electrical contact with a rotating second component of the analysis device; and
positioning and mounting the first component in the analysis device.
8. The method of claim 7 , wherein the method for producing injection-molded circuit mounts comprises a method selected from the group consisting of two-component injection-molding, hot stamping, in-mold film coating and laser structuring.
9. The method of claim 7 , wherein the electrical contact of the first component with the second component comprises a type of electrical contact selected from the group consisting of sprung contact, plug-in contact, solder contact, sliding contact and conductive-adhesive contact.
10. The method of claim 7 , wherein the first component comprises a functional assembly of the analysis device, and wherein the second component comprises a printed circuit board of the analysis device.
11. The method of claim 10 , wherein the functional assembly comprises a component selected from the group consisting of a barcode reader arrangement, a transport unit for test elements, a motor module, a measurement module, a positioning device for a test element magazine, a test element magazine holder which contains a sensor, and a heat-treatment device.
12. The method of claim 7 , wherein the first component comprises a contact element for test element evaluation of the analysis device, and the second component comprises a test element configured to be evaluated electrochemically.
13. The method of claim 12 , wherein the contact element for test element evaluation is integrated in a test element magazine.