Atomic force microscope system using selective active damping
View Patent ↗An atomic force microscope (AFM) system comprises a cantilever arm attached to a probe tip. The system controls a height of the cantilever arm to press the probe tip against a sample and then separate the probe tip from the sample, to detect a disturbance of the cantilever arm after the separation of the probe tip from the surface, and to engage active damping of the cantilever arm to suppress the disturbance.
1. A method of operating an atomic force microscope (AFM) system comprising a cantilever arm attached to a probe tip, the method comprising:
controlling a height of the cantilever arm to press the probe tip against a sample and then separate the probe tip from the sample;
detecting a vibration of the cantilever arm after the separation of the probe tip from the surface; and
engaging active damping of the cantilever arm to counteract the vibration of the cantilever to increase a rate of decay of the vibration of the cantilever arm compared to a natural damping of the cantilever arm.
2. The method of claim 1 , further comprising detecting suppression of the vibration, and disengaging the active damping upon detecting the suppression.
3. The method of claim 1 , further comprising disengaging the active damping after it has been engaged for a predetermined time.
4. The method of claim 1 , wherein detecting the vibration comprises detecting, that a deflection of the cantilever arm changes from a negative value to a positive value.
5. The method of claim 1 , wherein detecting the vibration comprises detecting that a derivative of a cantilever deflection signal exceeds a predetermined threshold.
6. The method of claim 1 , wherein controlling the height of the cantilever arm comprises operating a first piezoelectric actuator, and engaging the active damping comprises operating a second piezoelectric actuator that is separate from the first piezoelectric actuator.
7. The method of claim 1 , further comprising:
measuring an eigenmode of the cantilever arm; and
configuring a controller to perform the active damping by suppressing vibration of the cantilever arm at the eigenmode.
8. The method of claim 1 , wherein engaging the active damping comprises applying a control signal to an actuator to counteract the vibration.
9. The method of claim 8 , further comprising filtering the control signal before applying it to the actuator.
10. The method of claim 8 , further comprising applying the control signal with a relatively low gain upon initial engagement of the active damping and then increasing the gain.
11. An atomic force microscope (AFM) system, comprising:
a cantilever arm;
a probe tip attached to the cantilever arm; and
a controller configured to control a height of the cantilever arm to press the probe tip against a sample and then separate the probe tip from the sample, to detect a vibration of the cantilever arm after the separation of the probe tip from the surface, and to engage active damping of the cantilever arm to counteract the vibration of the cantilever to increase a rate of decay of the vibration of the cantilever arm compared to a natural damping of the cantilever arm.
12. The AFM system of claim 11 , further comprising:
a first actuator configured to control the height of the cantilever arm; and
a second actuator configured to control the active damping of the cantilever arm.
13. The AFM system of claim 12 , wherein the second actuator is further configured to periodically oscillate the cantilever arm during an alternating current (AC) mode operation of the AFM system.
14. The AFM system of claim 11 , wherein the controller is further configured to detect suppression of the vibration and to disengage the active damping upon detecting the suppression.
15. The AFM system of claim 11 , wherein the active damping is configured to suppress first-order eigenmode vibrations in the cantilever arm while ignoring other eigenmode vibrations.