IP Library Granted Patent US 9,081,186
Granted Patent B2
US 9,081,186 · App. 13/678,694 · Granted Jul 14, 2015

Microscope device for generating images of a specimen using phase distribution of light

Inventor: Hiroyuki Sangu (Tokyo, JP)
Assignee: YOKOGAWA ELECTRIC CORPORATION
G02B21/06G02B21/0032G02B21/0044G02B21/0056G02B21/0076
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Quick Facts
Patent No.
US 9,081,186
App. No.
13/678,694
Granted
Jul 14, 2015
Kind
B2
Abstract

A microscope device according to the present disclosure (the present microscope device) includes: a light source configured to oscillate coherent illuminating light, the illuminating light being applied on a specimen; a detecting unit configured to detect fluorescent light from the specimen as feedback light, the specimen being irradiated with the illuminating light; a phase distribution control unit disposed in an optical path of the illuminating light, the phase distribution control unit being configured to control phase distribution of the illuminating light; a controller configured to control the phase distribution control unit to vary the phase distribution; and an image generating unit configured to operate a difference of the feedback light between before and after the phase distribution varies, to generate an image of the specimen.

Claims (28)

1. A microscope device comprising:

a light source configured to oscillate a coherent illuminating light, the illuminating light being applied on a specimen;

a detecting unit configured to detect a fluorescent light from the specimen as a feedback light, the specimen being irradiated with the illuminating light;

a phase distribution control unit disposed in an optical path of the illuminating light, the phase distribution control unit being configured to control a phase distribution of the illuminating light;

a controller configured to control the phase distribution control unit to vary the phase distribution; and

an image generating unit configured to operate a difference of the feedback light between before and after the phase distribution varies, to generate an image of the specimen.

2. The microscope device according to claim 1 , wherein

the controller is configured to:

perform a first control that controls the phase distribution control unit such that almost a whole illuminating light has a uniform phase; and

perform a second control that controls the phase distribution control unit such that the illuminating light has a phase distribution where rays of the illuminating light mutually interfere on a focal point, and

the image generating unit is configured to operate a difference between the feedback light in the first control and the feedback light in the second control, to generate an image of the specimen.

3. The microscope device according to claim 2 , further comprising

an objective lens configured to focus the illuminating light on the specimen, wherein

the phase distribution control unit is disposed in a position equivalent to a pupil including a pupil position of the objective lens.

4. The microscope device according to claim 3 , wherein

the controller is configured to control the phase distribution control unit such that rays of the illuminating light mutually interfere so as to cancel one another on the focal point.

5. The microscope device according to claim 3 , wherein

the phase distribution control unit is configured to provide a phase to correct spherical aberration, the spherical aberration being generated in the illuminating light by a refractive index difference between a refractive index of a medium of an optical path to the specimen and a refractive index of a medium of the specimen.

6. The microscope device according to claim 1 , wherein

the illuminating light is configured to scan a planar surface approximately perpendicular to an optical axis of the specimen.

7. The microscope device according to claim 1 , wherein

plural focal points in the illuminating light are projected to a planar surface approximately perpendicular to the optical axis.

8. The microscope device according to claim 7 , further comprising a pinhole array, wherein

the illuminating light passes through the pinhole array so as to project the plural focal points on the planar surface approximately perpendicular to the optical axis.

9. The microscope device according to claim 8 , wherein

the pinhole array includes a pinhole where an optical element with a lens effect is disposed.

10. The microscope device according to claim 9 , further comprising

a phase shifting unit disposed in every two pinholes of the pinhole array, the phase shifting unit being configured to vary a phase of a light.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNOR'S NAME PREVIOUSLY RECORDED ON REEL 029311 FRAME 0608. ASSIGNOR(S) HEREBY CONFIRMS THE CORRECT ASSIGNOR'S NAME IS HIROYUKI SANGU. Recorded May 1, 2015
From: SANGU, HIROYUKI
To: YOKOGAWA ELECTRIC CORPORATION
Reel/Frame 035561/0983 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 16, 2012
From: SANGUU, HIROYUKI
To: YOKOGAWA ELECTRIC CORPORATION
Reel/Frame 029311/0608 →
Priority Claims (2)
JP 2011-255192 · Nov 22, 2011 · national
JP 2012-065670 · Mar 22, 2012 · national
Continuity (1)
Related Publication 20130128346A1 · May 23, 2013