IP Library Granted Patent US 9,315,424
Granted Patent B2
US 9,315,424 · App. 13/682,225 · Granted Apr 19, 2016

Multi-layer plate device

Inventors: Alfred Grant Elliot (Palo Alto, CA); Brent Donald Alfred Elliot (Cupertino, CA); Frank Balma (Los Gatos, CA); Richard Erich Schuster (Milpitas, CA); Dennis George Rex (Williams, OR); Alexander Veytser (Mountain View, CA)
Assignee: Component Re-Engineering Company, Inc.
C04B37/006B23K1/0008B23K1/0016B23K1/19B23K1/20B23K35/005B23K35/286B32B9/005B32B9/04B32B9/041B32B15/20B32B18/00C04B35/645C04B37/001F16B9/00H05B1/00C04B2235/6562C04B2235/6565C04B2235/6567C04B2235/6581C04B2235/6582C04B2235/945C04B2237/121C04B2237/122C04B2237/126C04B2237/127C04B2237/34C04B2237/343C04B2237/348C04B2237/36C04B2237/365C04B2237/366C04B2237/368C04B2237/592C04B2237/61C04B2237/64C04B2237/66C04B2237/68C04B2237/704C04B2237/708C04B2237/72C04B2237/76C04B2237/765C04B2237/80C04B2237/84Y10T403/46Y10T428/31504Y10T428/31678
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Quick Facts
Patent No.
US 9,315,424
App. No.
13/682,225
Granted
Apr 19, 2016
Kind
B2
Abstract

A method for the joining of ceramic pieces with a hermetically sealed joint comprising brazing a continuous layer of joining material between the two pieces. The wetting and flow of the joining material is controlled by the selection of the joining material, the joining temperature, the time at temperature, the joining atmosphere, and other factors. The ceramic pieces may be aluminum nitride and the pieces may be brazed with an aluminum alloy under controlled atmosphere. The joint material is adapted to later withstand both the environments within a process chamber during substrate processing, and the oxygenated atmosphere which may be seen within the shaft of a heater or electrostatic chuck.

Claims (27)

1. A multi-layer ceramic plate assembly for use in semiconductor processing, said multi-layer ceramic plate assembly comprising:

an upper plate layer, said upper plate layer comprising a ceramic disc;

a lower plate layer, said lower plate layer comprising ceramic;

said upper plate layer and said lower plate layer joined together to form an interior space between said upper plate layer and said lower plate layer within an annulus of an annular joining layer, and

an annular joining layer disposed between said upper plate layer and said lower plate layer, wherein said annular joining layer joins an outer periphery of said upper plate layer to an outer periphery of said lower plate layer, wherein said joining layer comprises metallic aluminum, and wherein said joining layer hermetically seals said interior space between said upper plate layer and said lower plate layer from the exterior of said ceramic plate assemble through said joining layer, wherein said joining layer hermetically seals with a joint with a vacuum leak rate of less than 1×10E−9 sccm He/sec.

2. The multi-layer ceramic plate assembly of claim 1 wherein said upper plate layer comprises aluminum nitride.

3. The multi-layer ceramic plate assembly of claim 2 wherein said lower plate layer comprises aluminum nitride.

4. The multi-layer ceramic plate assembly of claim 1 wherein said joining layer comprises metallic aluminum of greater than 99% aluminum by weight.

5. The multi-layer ceramic plate assembly of claim 3 wherein said joining layer comprises metallic aluminum of greater than 99% aluminum by weight.

6. The multi-layer ceramic plate assembly of claim 3 further comprising a heater residing between said upper plate layer and said lower plate layer.

7. The multi-layer ceramic plate assembly of claim 3 further comprising a heater residing between said upper plate layer and said lower plate layer, said heater being substantially circular, said heater having a maximum diameter, wherein said joining layer comprises a ring around the outer periphery of said heater, said ring having an inner diameter larger than the maximum diameter of said heater.

8. The multi-layer ceramic plate assembly of claim 1 further comprising a planar electrode residing between said upper plate layer and said lower plate layer.

9. The multi-layer ceramic plate assembly of claim 3 further comprising a planar electrode residing between said upper plate layer and said lower plate layer.

10. The multi-layer ceramic plate assembly of claim 3 wherein said joining layer comprises a planar electrode disposed between said upper plate layer and said bottom plate layer.

11. A multi-layer ceramic plate assembly for use in semiconductor processing, said multi-layer ceramic plate assembly comprising:

a top plate layer, said top plate layer comprising ceramic;

one or more intermediate plate layers, said one or more intermediate plate layers comprising ceramic;

a bottom plate layer, said bottom plate layer comprising ceramic; and

a plurality of joining layers disposed between plate layers, wherein said joining layers join said plate layers, wherein one or more of said joining layers are an annular joining layer, wherein said annular joining layer joins an outer periphery of a plate layer to an outer periphery of an adjacent plate layer, wherein each of said plurality of joining layers comprises metallic aluminum, and wherein each of said joining layers hermetically seals an interior space of the ceramic plate assembly from the exterior of said ceramic plate assembly through that joining layer, wherein said joining layers hermetically seal with a joint with a vacuum leak rate of less than 1×10E−9 sccm He/sec.

12. The multi-layer ceramic plate assembly of claim 11 wherein each of said top plate layer, said one or more intermediate plate layers, and said bottom plate layer comprises aluminum nitride.

13. The multi-layer plate of claim 11 wherein each of said joining layers comprise aluminum of greater than 99% aluminum by weight.

14. The multi-layer ceramic plate assembly of claim 12 wherein each of said joining layers comprise aluminum of greater than 99% aluminum by weight.

15. The multi-layer ceramic plate assembly of claim 14 wherein each of said joining layers comprise a layer of aluminum around the outer periphery of an interface area of the adjacent plates joined by the layers.

16. The multi-layer ceramic plate assembly of claim 14 further comprising a heater residing between one of said top plate layer, said one or more intermediate plate layers, and said bottom plate layer and another of said top plate layer, said one or more intermediate plate layers, and said bottom plate layer.

17. The multi-layer ceramic plate assembly of claim 14 further comprising an electrode residing between one of said top plate layer, said one or more intermediate plate layers, and said bottom plate layer and another of said top plate layer, said one or more intermediate plate layers, and said bottom plate layer.

18. The multi-layer ceramic plate assembly of claim 12 further comprising an electrode residing between one of said top plate layer, said one or more intermediate plate layers, and said bottom plate layer and another said top plate layer, said one or more intermediate plate layers, and said bottom plate layer.

19. The multi-layer ceramic plate assembly of claim 12 further comprising a heater residing between one of said top plate layer, said one or more intermediate plate layers, and said bottom plate layer and another of said top plate layer, said one or more intermediate plate layers, and said bottom plate layer.

Assignments (4)
PATENT SECURITY AGREEMENT (SHORT FORM) Recorded Mar 3, 2021
From: WATLOW ELECTRIC MANUFACTURING COMPANY
To: BANK OF MONTREAL, AS ADMINISTRATIVE AGENT
Reel/Frame 055479/0708 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 16, 2020
From: COMPONENT RE-ENGINEERING COMPANY, INC.
To: WATLOW ELECTRIC MANUFACTURING COMPANY
Reel/Frame 053791/0283 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT ASSIGNOR NAME FRANK ELLIOT PREVIOUSLY RECORDED ON REEL 029863 FRAME 0808. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Feb 26, 2016
From: ELLIOT, ALFRED GRANT; ELLIOT, BRENT DONALD ALFRED; BALMA, FRANK; SCHUSTER, RICHARD ERICH; REX, DENNIS; VEYTSER, ALEXANDER
To: COMPONENT RE-ENGINEERING COMPANY, INC.
Reel/Frame 037927/0733 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 25, 2013
From: ELLIOT, ALFRED GRANT; ELLIOT, BRENT DONALD ALFRED; ELLIOT, FRANK; SCHUSTER, RICHARD ERICH; REX, DENNIS GEORGE; VEYTSER, ALEXANDER
To: COMPONENT RE-ENGINEERING COMPANY, INC.
Reel/Frame 029863/0808 →
Continuity (6)
Provisional Application 61565396 · Nov 30, 2011
Provisional Application 61592587 · Jan 30, 2012
Provisional Application 61605707 · Mar 1, 2012
Provisional Application 61658896 · Jun 12, 2012
Provisional Application 61707865 · Sep 28, 2012
Related Publication 20130180976A1 · Jul 18, 2013