IP Library Granted Patent US 8,697,480
Granted Patent B1
US 8,697,480 · App. 13/682,876 · Granted Apr 15, 2014

Method for treating a semiconductor

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Quick Facts
Patent No.
US 8,697,480
App. No.
13/682,876
Granted
Apr 15, 2014
Kind
B1
Abstract

Methods for treating a semiconductor material, and for making devices containing a semiconducting material, are presented. One embodiment is a method for treating a semiconductor material that includes a chalcogenide. The method comprises contacting at least a portion of the semiconductor material with a chemical agent. The chemical agent comprises a solvent, and an iodophor dissolved in the solvent.

Claims (39)

1. A method for treating a semiconductor material, comprising:

contacting at least a portion of the semiconductor material with a chemical agent, the semiconductor material comprising a chalcogenide;

wherein the chemical agent comprises

a solvent, and

an iodophor dissolved in the solvent.

2. The method of claim 1 , wherein the chemical agent comprises an iodophor selected from the group consisting of polyvinyl pyrrolidone:iodine, polyethoxy polypropoxyethanol:iodine, the nonyl phenyl ether of polyethylene glycol:iodine, and combinations thereof.

3. The method of claim 1 , wherein the chemical agent comprises an iodophor selected from the group consisting of ethylene glycol:iodine, propylene glycol:iodine, glycerine:iodine, and combinations thereof.

4. The method of claim 1 , wherein the chemical agent comprises 0.01 to 1% total iodine.

5. The method of claim 1 , wherein the chemical agent further comprises copper, silver, or gold.

6. The method of claim 1 , wherein the solvent comprises ethylene glycol, propylene glycol, glycerol, or combinations thereof.

7. The method of claim 1 , wherein the chemical agent further comprises a thickener.

8. The method of claim 7 , wherein the thickener comprises an inorganic material.

9. The method of claim 8 , wherein the inorganic material comprises aluminum oxide, fumed silica, or combinations thereof.

10. The method of claim 8 , wherein the thickener comprises an organic material.

11. The method of claim 10 , wherein the organic material comprises polyvinyl pyrrolidone, polyvinyl alcohol, or combinations thereof.

12. The method of claim 1 , wherein contacting comprises contacting at least a portion of the semiconductor material with a paste, the paste comprising the chemical agent.

13. The method of claim 1 , wherein contacting comprises contacting at least a portion of the semiconductor material with a liquid, the liquid comprising the chemical agent.

14. The method of claim 1 , further comprising heating the semiconductor material to a temperature of at least about 45 degrees Celsius.

15. The method of claim 1 , further comprising heating the semiconductor material to a temperature of at least about 65 degrees Celsius.

16. The method of claim 1 , wherein the chalcogenide comprises tellurium, selenium, or a combination thereof.

17. The method of claim 1 , wherein the semiconductor material comprises cadmium telluride.

18. The method of claim 1 , wherein the chemical agent is substantially free of copper.

19. The method of claim 1 , further comprising removing the chemical agent from the semiconductor material, and then contacting at least a portion of the semiconductor material with a contacting composition comprising a dopant.

20. The method of claim 19 , wherein the dopant comprises copper, silver, gold, or combinations thereof.

21. The method of claim 20 , wherein the dopant is present in the contacting composition at a concentration of less than about 10 parts per million.

22. The method of claim 21 , wherein the concentration of the dopant is in a range from about 10 parts per billion to about 1000 parts per billion.

23. The method of claim 1 , further comprising contacting at least a portion of the semiconductor material with a passivating agent.

24. The method of claim 23 , wherein the passivating agent comprises cadmium chloride.

25. The method of claim 1 , further comprising introducing a dopant into the semiconducting material.

26. The method of claim 25 , wherein the introducing step is performed prior to the contacting step.

27. The method of claim 25 , wherein introducing the dopant comprises contacting at least a portion of the semiconductor material with a metal salt solution comprising the dopant.

28. The method of claim 1 , further comprising disposing a layer comprising the semiconductor material on a support prior to the contacting step.

29. A method for treating a semiconductor material, comprising:

(a) contacting at least a portion of the semiconductor material with a passivating agent, wherein the semiconductor material comprises a chalcogenide;

(b) forming a first region in the semiconductor material by introducing a dopant into the semiconductor material;

(c) forming a chalcogen-rich region; and

(d) forming a second region in the semiconductor material, the second region comprising a dopant, wherein an average atomic concentration of the dopant in the second region is greater than an average atomic concentration of the dopant in the first region, and

wherein step (c) comprises

contacting at least a portion of the semiconductor material with a chemical agent; wherein the chemical agent comprises a solvent, and an iodophor dissolved in the solvent.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Feb 13, 2026
From: JPMORGAN CHASE BANK, N.A.
To: FIRST SOLAR, INC.
Reel/Frame 074858/0364 →
SECURITY INTEREST Recorded Jul 10, 2023
From: FIRST SOLAR, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 064237/0462 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 15, 2021
From: JPMORGAN CHASE BANK, N.A.
To: FIRST SOLAR, INC.
Reel/Frame 058132/0566 →
PATENT SECURITY AGREEMENT Recorded Jul 12, 2017
From: FIRST SOLAR, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 043177/0581 →
CORRECTIVE ASSIGNMENT TO CORRECT THE APPLICATION NUMBER FROM '13/301162' PREVIOUSLY RECORDED ON REEL 032045 FRAME 0657. ASSIGNOR(S) HEREBY CONFIRMS THE CORRECT APPLICATION NUMBER SHOULD BE '13/601162'. Recorded Feb 10, 2014
From: FIRST SOLAR MALAYSIA SDN. BHD.
To: FIRST SOLAR, INC.
Reel/Frame 032239/0005 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 14, 2014
From: FIRST SOLAR MALAYSIA SDN. BHD.
To: FIRST SOLAR, INC.
Reel/Frame 032045/0657 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 5, 2013
From: GENERAL ELECTRIC COMPANY
To: FIRST SOLAR MALAYSIA SDN.BHD.
Reel/Frame 031581/0457 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 21, 2012
From: FOUST, DONALD FRANKLIN
To: GENERAL ELECTRIC COMPANY
Reel/Frame 029334/0974 →