Method for fabricating organic EL device and method for evaluating organic EL device
View Patent ↗An organic EL device (OELD) having a defective portion is irradiated with a laser beam; first luminance of light emitted from the OELD is measured after the OELD is irradiated with the laser beam, while supplying, to the OELD, a first amount of current with which the OELD in a normal state would emit light having luminance corresponding to a first grayscale level smaller than a reference level; the OELD is re-irradiated with the laser beam when the first luminance is smaller than a threshold; and second luminance of light emitted from the OELD is measured when the first luminance is greater than or equal to the threshold, while supplying, to the OELD, a second amount of current with which the OELD in the normal state would emit light having luminance corresponding to a second grayscale level greater than or equal to the reference level.
1. A method for fabricating an organic electroluminescence (EL) device, the method comprising:
irradiating an organic EL device having a defective portion with a laser beam;
measuring first luminance of light emitted from the organic EL device after the organic EL device is irradiated with the laser beam, while supplying, to the organic EL device, a first amount of current with which the organic EL device in a normal state would emit light having luminance corresponding to a first grayscale level smaller than a reference grayscale level;
re-irradiating the organic EL device with the laser beam when the first luminance measured in the measuring is smaller than a determination threshold; and
measuring second luminance of light emitted from the organic EL device when the first luminance measured in the measuring is greater than or equal to the determination threshold, while supplying, to the organic EL device, a second amount of current with which the organic EL device in the normal state would emit light having luminance corresponding to a second grayscale level greater than or equal to the reference grayscale level.
2. The method for fabricating the organic EL device according to claim 1 ,
wherein the determination threshold for the first luminance is 50% of luminance corresponding to the first grayscale level of the light emitted from the organic EL device in the normal state.
3. The method for fabricating the organic EL device according to claim 1 ,
wherein the first grayscale level is a grayscale level corresponding to the light emitted from the organic EL device in the normal state having a luminance of 1 cd/m 2 .
4. The method for fabricating the organic EL device according to claim 1 ,
wherein the second grayscale level is a grayscale level around a maximum grayscale level of the organic EL device.