IP Library Granted Patent US 9,299,653
Granted Patent B2
US 9,299,653 · App. 13/696,862 · Granted Mar 29, 2016

Electronic component and method for producing same

Inventors: Minoru Satoh (Chuo-ku, JP); Takehiro Yamashita (Miyoshi, JP); Atsushi Nagai (Miyoshi, JP); Yasuo Adachi (Miyoshi, JP)
Assignees: TDK CORPORATION; NORITAKE CO., LTD.
H01L23/49883H01B1/16H01L24/48H01L23/15H01L24/45H01L2224/45015H01L2224/45124H01L2224/45144H01L2224/45147H01L2224/48091H01L2224/48227H01L2224/48599H01L2224/48699H01L2224/859H01L2224/85399H01L2924/0102H01L2924/0103H01L2924/0104H01L2924/014H01L2924/0105H01L2924/01005H01L2924/01006H01L2924/01012H01L2924/01013H01L2924/01014H01L2924/01025H01L2924/01028H01L2924/01029H01L2924/01033H01L2924/01038H01L2924/01041H01L2924/01045H01L2924/01046H01L2924/01047H01L2924/01072H01L2924/01073H01L2924/01074H01L2924/01078H01L2924/01079H01L2924/01082H01L2924/01322H01L2924/09701H01L2924/12044H01L2924/15787
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Quick Facts
Patent No.
US 9,299,653
App. No.
13/696,862
Granted
Mar 29, 2016
Kind
B2
Abstract

This electronic component is provided with an inorganic substrate, a conductor film formed on a surface of the substrate, and bonding wires bonded to a part of said conductor film, and wire bonding sections are formed on at least a part of the electronic component. The part of the conductor film at least forming the aforementioned wire bonding sections contains an Ag-based metal formed of Ag or an alloy having Ag as the main constituent and a metal oxide which coats said Ag-based metal and which has, as a constituent element, any of the elements selected from the group consisting of Al, Zr, Ti, Y, Ca, Mg, and Zn. The coating quantity of the metal oxide is a quantity corresponding to 0.02 to 0.1 parts by mass relative to 100 parts by mass of the aforementioned Ag-based metal.

Claims (55)

1. An electronic component comprising:

an inorganic substrate;

a wet plating-less conductor film formed on a surface of said substrate, at least a part of the conductor film having wire bonding sections; and

bonding wires directly bonded to the wire bonding sections within at least a part of the conductor film;

wherein:

the wire bonding sections contain:

an Ag-based metal formed of Ag or an alloy having Ag as a main constituent; and

a metal oxide coating said Ag-based metal and having, as a constituent element, any of the elements selected from the group consisting of Al, Zr, Ti, Y, Ca, Mg, and Zn; and

the metal oxide that coats the Ag-based metal is present in an amount in a range of from 0.02 to 0.1 parts by mass relative to 100 parts by mass of the Ag-based metal.

2. The electronic component according to claim 1 , wherein the wire bonding sections within at least a part of the conductor film further contains an inorganic oxide and/or an oxide glass as an additive.

3. The electronic component according to claim 2 , wherein:

the inorganic substrate is a crystalline ceramic substrate, and

the wire bonding sections within at least a part of the conductor film contain an inorganic oxide as the additive.

4. The electronic component according to claim 2 , wherein:

the inorganic substrate is a non-crystalline ceramic substrate having a glass component as a main constituent, and

the wire bonding sections within at least a part of the conductor film contain an oxide glass as the additive.

5. The electronic component according to claim 3 , wherein the inorganic oxide is a mixture of bismuth oxide and copper oxide, and said mixture is present in an amount in a range of from 0.5 to 5 parts by mass relative to 100 parts by mass of the Ag-based metal.

6. The electronic component according to claim 4 , wherein the oxide glass is present in an amount in a range of from 0.05 to 0.5 parts by mass relative to 100 parts by mass of the Ag-based metal.

7. The electronic component according to claim 1 , wherein the bonding wires are made from a metal having any metallic element selected from the group consisting of gold, aluminum, and copper as a main constituent element.

8. A wire bonding section-forming conductor paste comprising:

an Ag-based metal powder having an average particle diameter of 0.3 to 6.0 μm and formed of Ag or an alloy having Ag as a main constituent; and

an organic metal compound or a metal oxide coating a surface of said Ag-based metal powder and having, as a constituent element, any of the elements selected from the group consisting of Al, Zr, Ti, Y, Ca, Mg, and Zn,

wherein:

the wire bonding section-forming conductor paste is configured to form a conductor film on a surface of an inorganic substrate in which at least a part of the conductor film contains wire bonding sections to which bonding wires are directly bonded for an electronic component; and

the organic metal compound or the metal oxide that coats the Ag-based metal is present in an amount in a range of from 0.02 to 0.1 parts by mass, in terms of metal oxide, relative to 100 parts by mass of the Ag-based metal powder.

9. The conductor paste according to claim 8 , further containing an inorganic oxide powder and/or an oxide glass powder as an additive.

10. The conductor paste according to claim 9 , further containing an inorganic oxide powder and/or an oxide glass powder as an additive when an average particle diameter of the Ag-based metal powder is a diameter in a range of from 3.0 to 6.0 μm.

11. The conductor paste according to claim 9 , wherein:

the inorganic oxide powder is a mixture of bismuth oxide and copper oxide, and

said mixture is present in an amount in a range of from 0.5 to 5 parts by mass relative to 100 parts by mass of the Ag-based metal powder.

12. The conductor paste according to claim 9 , wherein the oxide glass powder is present in an amount in a range of from 0.05 to 0.5 parts by mass relative to 100 parts by mass of the Ag-based metal powder.

13. A method for producing an electronic component that comprises an inorganic substrate, a wet plating-less conductor film formed on a surface of said substrate, and bonding wires, the method comprising:

(1) preparing a wire bonding section-forming conductor paste comprising:

an Ag-based metal powder formed of Ag or an alloy having Ag as a main constituent and having an average particle diameter of 0.3 to 6.0 μm; and

an organic metal compound or a metal oxide coating a surface of the Ag-based metal powder and having, as a constituent element, any of the elements selected from the group consisting of Al, Zr, Ti, Y, Ca, Mg, and Zn; and

(2) coating the conductor paste on the surface of the inorganic substrate to form a conductor film on the surface of said inorganic substrate, at least a part of the formed conductor film containing wire bonding sections; and

(3) bonding the bonding wires directly to the wire bonding sections within at least a part of the formed conductor film;

wherein:

the organic metal compound or the metal oxide that coats the Ag-based metal powder is present in an amount in a range of from 0.02 to 0.1 parts by mass, in terms of metal oxide, relative to 100 parts by mass of the Ag-based metal powder; and

a surface of the conductor film is not subjected to wet plating.

14. The method according to claim 13 , wherein the conductor paste further contains an inorganic oxide powder and/or an oxide glass powder as an additive.

15. The method according to claim 14 , wherein the conductor paste further contains an inorganic oxide powder and/or an oxide glass powder as an additive when the average particle diameter of the Ag-based metal powder is a diameter in a range of from 3.0 to 6.0 μm.

16. The method according to claim 15 , wherein the inorganic substrate is a crystalline ceramic substrate and the conductor paste further contains an inorganic oxide powder as the additive.

17. The method according to claim 15 , wherein

the inorganic substrate is a non-crystalline ceramic substrate having a glass component as the main constituent, and

the conductor paste further contains an oxide glass powder as the additive.

18. The method according to claim 14 , wherein the inorganic oxide powder is a mixture of bismuth oxide and copper oxide and said mixture is present in an amount in a range of from 0.5 to 5 parts by mass relative to 100 parts by mass of the Ag-based metal powder.

19. The method according to claim 14 , wherein the oxide glass powder is present in an amount in a range of from 0.05 to 0.5 parts by mass relative to 100 parts by mass of the Ag-based metal powder.

20. The electronic component according to claim 1 , further comprising:

a bonding pad formed on the inorganic substrate;

wherein the bonding wires are directly bonded to the wire bonding sections within at least a part of the conductor film and the bonding pad.

21. The method according to claim 13 , wherein:

the electronic component further comprises a bonding pad formed on the inorganic substrate; and

the bonding wires are directly bonded to the wire bonding sections within at least a part of the conductor film and the bonding pad.

22. The conductor paste according to claim 8 , wherein the Ag-based metal powder has an average particle diameter in a range of from 2.0 to 6.0 μm.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 2, 2017
From: MORENO-LOPEZ, SONIA; TIMON-JIMENEZ, MARCOS
To: MOLOGEN AG
Reel/Frame 042572/0240 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 6, 2014
From: MORENO-LOPEZ, SONIA; TIMON-JIMENEZ, MARCOS
To: MOLOGEN AG
Reel/Frame 032361/0381 →
CHANGE OF ADDRESS Recorded Jun 12, 2013
From: TDK CORPORATION
To: TDK CORPORATION
Reel/Frame 030651/0687 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 8, 2012
From: SATOH, MINORU; YAMASHITA, TAKEHIRO; NAGAI, ATSUSHI; ADACHI, YASUO
To: TDK CORPORATION; NORITAKE CO., LIMITED
Reel/Frame 029300/0559 →
Priority Claims (1)
JP 2010-109596 · May 11, 2010 · national
Continuity (1)
Related Publication 20130058061A1 · Mar 7, 2013