Device for the radiometric calibration of infra-red measuring devices
View Patent ↗A device for the radiometric calibration of infra-red measuring devices is provided. The device is in the form of a heated metal surface that is used as a radiant surface and is coated with a high-emission material. The device includes a spherical segment, the interior of which is coated with the high-emission material and the opening of the spherical segment is used as an aperture for an infra-red device that can be arranged in the center of the aperture.
1. A device for radiometric calibration of an infrared measuring device, the device comprising:
a spherical segment having an opening coincident with an opening of the device, wherein the spherical segment is coated by a high-emission material on an inner side, wherein the spherical segment is either a hemisphere or a portion of a hemisphere,
wherein the device is in the form of a heated metal surface which serves as an emitting surface.
2. The device as claimed in claim 1 , wherein a surface on the inner side of the spherical segment has a roughened surface that is coated with a material with an emissivity >0.9.
3. The device as claimed in claim 1 , wherein the spherical segment is made of copper.
4. The device as claimed in claim 1 , further comprising:
means for temperature control of the spherical segment, wherein the means for temperature control are soldered onto an outside of the spherical segment.
5. The device as claimed in claim 4 , wherein the temperature control means is in thermal contact with the spherical segment and is an electric heater, a Peltier element, or a pipe though which a temperature-controllable liquid is routed.
6. The device as claimed in claim 4 , further comprising:
a thermocouple that is in thermal contact with the spherical segment, wherein the thermocouple is configured to measure and regulate a temperature of the emitting surface.