IP Library Granted Patent US 8,632,691
Granted Patent B2
US 8,632,691 · App. 13/702,562 · Granted Jan 21, 2014

Interface treatment method for germanium-based device

Inventors: Ru Huang (Beijing, CN); Min Li (Beijing, CN); Xia An (Beijing, CN); Ming Li (Beijing, CN); Meng Lin (Beijing, CN); Xing Zhang (Beijing, CN)
Assignee: Peking University
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Quick Facts
Patent No.
US 8,632,691
App. No.
13/702,562
Granted
Jan 21, 2014
Kind
B2
Abstract

Disclosed herein is an interface treatment method for germanium-based device, which belongs to the field of manufacturing technologies of ultra large scaled integrated (ULSI) circuits. In the method, the natural oxide layer on the surface of the germanium-based substrate is removed by using a concentrated hydrochloric acid solution having a mass percentage concentration of 15%˜36%, and dangling bonds of the surface are performed a passivation treatment by using a diluted hydrochloric acid solution having a mass percentage concentration of 5%˜10% so as to form a stable passivation layer on the surface. This method makes a good foundation for depositing a high-K (high dielectric constant) gate dielectric on the surface of the germanium-based substrate after cleaning and passivating, enhances quality of the interface between the gate dielectric and the substrate, and improves the electrical performance of germanium-based MOS device.

Claims (8)

1. An interface treatment method for a germanium-based device, comprising:

1) cleaning a germanium-based substrate;

2) removing a natural oxide layer on a surface of the germanium-based substrate by using a concentrated hydrochloric acid solution having a mass percentage concentration of 15%-36%; and

3) performing a passivation treatment for the surface of the germanium-based substrate by using a diluted hydrochloric acid solution having a mass percentage concentration of 5%-10%.

2. The method according to claim 1 , wherein, the germanium-based substrate is a bulk germanium substrate, an epitaxial germanium substrate, or a germanium-on-insulator substrate.

3. The method according to claim 1 , wherein, in step 1), the germanium-based substrate is firstly cleaned by an organic solvent, and is then boiled in a hydrochloric acid to be cleaned.

4. The method according to claim 1 , wherein, in step 2), the germanium-based substrate is soaked in the concentrated hydrochloric acid solution for 10-30 seconds and then is moved into deionized water to be rinsed circularly for 15-20 times, and then the surface of the germanium-based substrate is dried.

5. The method according to claim 1 , wherein, in step 3), the germanium-based substrate is soaked in the diluted hydrochloric acid solution for 5 minutes-30 minutes and then is moved into deionized water to be rinsed circularly for 10-15 times, and then the surface of the germanium-based substrate is dried.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 20, 2015
From: PEKING UNIVERSITY
To: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION; PEKING UNIVERSITY
Reel/Frame 035058/0817 →
CORRECT ERROR IN COVER SHEET PREVIOUSLY RECORDED ON REEL 029422, FRAME 0029 - CORRECTION TO THE SPELLING OF ASSIGNEE'S ADDRESS Recorded Dec 18, 2012
From: HUANG, RU; LI, MIN; AN, XIA; LI, MING; LIN, MENG; ZHANG, XING
To: PEKING UNIVERSITY
Reel/Frame 029495/0597 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 6, 2012
From: HUANG, RU; LI, MIN; AN, XIA; LI, MING; LIN, MENG; ZHANG, XING
To: PEKING UNIVERSITY
Reel/Frame 029422/0029 →
Priority Claims (1)
CN 2012 1 0156456 · May 18, 2012 · national
Continuity (1)
Related Publication 20130309875A1 · Nov 21, 2013