Silver based conductive layer for flexible electronics
View Patent ↗Methods for making conducting stacks includes forming a doped or alloyed silver layer sandwiched between two layers of transparent conductive oxide such as indium tin oxide (ITO). The doped silver or silver alloy layer can be thin, such as between 1.5 to 20 nm and thus can be transparent. The doped silver or silver alloy can provide improved ductility property, allowing the conductive stack to be bendable. The transparent conductive oxide layers can also be thin, allowing the conductive stack to have an improved ductility property.
1. A method for making a coated article, the method comprising:
providing a substrate,
wherein the substrate comprises a transparent and flexible material;
forming a first layer over the substrate,
wherein the first layer comprises a first transparent conductive oxide material;
forming a second layer over the first layer,
wherein the second layer comprises a binary alloy, the binary alloy consisting of silver and Bi; and
forming a third layer over the second layer,
wherein the third layer comprises a second transparent conductive oxide material.
2. A method as in claim 1 wherein the first transparent conductive oxide material or the second transparent conductive oxide material comprises indium tin oxide.
3. A method as in claim 1 wherein the concentration of Bi in the binary alloy is between 0.1 wt % and 10 wt %.
4. A method as in claim 1 wherein the concentration of Bi in the binary alloy is between 0.25 wt % and 5 wt %.
5. A method as in claim 1 wherein the thickness of the second layer is between 1.5 nm to 20 nm.
6. A method as in claim 1 wherein the thickness of the second layer is between 5 nm to 12 nm.
7. A method as in claim 1 wherein the second layer consists of the alloy.
8. A method for making a coated article, the method comprising:
providing a substrate,
wherein the substrate comprises a transparent and flexible material;
forming a first layer over the substrate,
wherein the first layer comprises indium tin oxide;
forming a second layer over the first layer,
wherein the second layer comprises a binary alloy, the binary alloy consisting of silver and Bi; and
forming a third layer over the second layer,
wherein the third layer comprises indium tin oxide.
9. A method as in claim 8 wherein the concentration of Bi in the binary alloy is between 0.25 wt % and 5 wt %.
10. A method as in claim 8 wherein the thickness of the second layer is between 5 nm to 9 nm.
11. A method as in claim 8 wherein the second layer consists of the binary alloy.