MICROELECTROMECHANICAL SYSTEM
A microelectromechanical system for detecting accelerations about or along an X-axis, Y-axis, and/or Z-axis, having a substrate and having a driving mass and a detection mass ( 1 ) disposed parallel to the substrate in an X-Y plane and mounted displaceably relative to the substrate. At least one slit ( 5 ) is disposed in the driving and/or detection mass ( 1 ) for compensating for distortions due to residual material stresses in the driving and/or detection mass ( 1 ).
1 . A microelectromechanical system for detecting accelerations about or along at least one axis among an X-axis, Y-axis and Z-axis, comprising:
a substrate,
a driving mass; and
a detection mass disposed parallel to the substrate in an X-Y plane and mounted displaceably relative to the substrate; and
wherein at least one slit is disposed in at least one mass of the driving mass and the detection mass for compensating for distortions due to residual material stresses in the at least one mass.
2 . The microelectromechanical system according to claim 1 , wherein the at least one slit is aligned one direction selected from the X-direction, the Y-direction and an X-Y direction.
3 . The microelectromechanical system according to claim 1 , wherein a plurality of slits are connected to each other in a crosswise manner.
4 . The microelectromechanical system according to claim 1 , wherein the at least one slit comprises a depth in the direction of the Z-axis corresponding entirely or partially to the thickness of the at least one mass.
5 . The microelectromechanical system according to claim 1 , wherein the at least one mass comprises a plurality of holes, and that some of the plurality of holes are connected to each other by the at least one slit.
6 . The microelectromechanical system according to claim 1 , wherein the at least one slit comprises a width that is less than an edge length of the plurality of holes connected to each other.
7 . The microelectromechanical system according to claim 1 , wherein the at least one slit connects together two edges or two vertices of adjacent holes.
8 . The microelectromechanical system according to claim 1 , wherein two slits are disposed adjacently and in parallel to each other in the at least one mass, and a plurality of holes without slits are disposed in the region between these two adjacent and parallel slits.
9 . The microelectromechanical system according to claim 1 , wherein the microelectromechanical system is a one-dimensional or multi-dimensional inertial sensor selected from a rate of rotation sensor acceleration sensor.