IP Library Patent Application 13724681
Patent Application
App. No. 13/724,681

REFLECTIVE SUBSTRATE AND METHOD OF MANUFACTURING THE SAME

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Quick Facts
Patent No.
US None
App. No.
13/724,681
Abstract

A reflective substrate, the transmittance of visible light of which is improved, and a method of manufacturing the same. The reflective substrate includes a glass substrate, an oxide or nitride film formed on the glass substrate, and vanadium dioxide (VO 2 ) film formed on the oxide or nitride film.

Claims (14)

1 . A reflective substrate comprising:

a base substrate; and

a thermochromic thin film formed on the base substrate,

wherein the thermochromic thin film comprises a thermochromic material and a dopant doped into the thermochromic material such that a phase transition temperature of the thermochromic thin film is lower than a phase transition temperature of the thermochromic material.

2 . The reflective substrate of claim 1 , wherein the thermochromic material comprises one selected from the group consisting of vanadium dioxide (VO 2 ), titanium oxide (III) (Ti 2 O 3 ), niobium oxide (NbO 2 ) and nickel sulfide (NiS).

3 . The reflective substrate of claim 1 , wherein the thermochromic material comprises vanadium dioxide (VO 2 ), and

wherein the dopant comprises one selected from the group consisting of molybdenum (Mo), tungsten (W), chromium (Cr), nickel (Ni) and zirconium (Zr).

4 . The reflective substrate of claim 3 , wherein the thermochromic thin film comprises the vanadium dioxide (VO 2 ) doped with 3 at % or more of the tungsten (W).

5 . The reflective substrate of claim 1 , further comprising an oxide or nitride thin film between the base substrate and the thermochromic thin film.

6 . The reflective substrate of claim 5 , wherein the oxide or nitride thin film comprises at least one selected from the group consisting of silicon dioxide (SiO 2 ), aluminum oxide (Al 2 O 3 ), niobium pentoxide (Nb 2 O 5 ), titanium dioxide (TiO 2 ), and silicon nitride (Si 3 N 4 ).

7 . The reflective substrate of claim 5 , wherein a thickness of the oxide or nitride thin film ranges from 30 nm to 80 nm.

8 . A method of manufacturing a reflective substrate comprising forming a thermochromic thin film as recited in claim 1 on a base substrate.

9 . The reflective substrate of claim 8 , wherein the thermochromic thin film is formed using a sputtering target that comprises the thermochromic material doped with the dopant.

10 . The reflective substrate of claim 8 , wherein the thermochromic thin film is formed using a sputtering target that comprises the thermochromic material and a sputtering target that comprises the dopant.

Assignments (2)
CHANGE OF NAME Recorded Jan 16, 2015
From: SAMSUNG CORNING PRECISION MATERIALS CO., LTD.
To: CORNING PRECISION MATERIALS CO., LTD.
Reel/Frame 034774/0676 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 3, 2013
From: CHOI, YONG WON; JUNG, YUNG-JIN; MOON, DONG-GUN; WOO, KWANG-JE
To: SAMSUNG CORNING PRECISION MATERIALS CO., LTD.
Reel/Frame 029603/0666 →