IP Library Granted Patent US 9,194,879
Granted Patent B2
US 9,194,879 · App. 13/728,329 · Granted Nov 24, 2015

Sample analysis apparatus

Inventors: Hong Geun Kim (Suwon-si, KR); Dong Young Kim (Daegu, KR); Chung Ung Kim (Yongin-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
G01N35/1081G01N35/00069
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,194,879
App. No.
13/728,329
Granted
Nov 24, 2015
Kind
B2
Abstract

A sample analysis apparatus is provided with a structure for stopping rotation of a disc at a precise position. The sample analysis apparatus includes a disc configured to rotate on a rotation shaft and having at least one detection zone, an optical sensing apparatus configured to detect a reaction result at the at least one detection zone, at least one position determining protrusion provided on an exterior surface of the disc, a slider movably disposed to in a radial direction relative to the disc, and a stopper mounted to the slider and configured to stop rotation of the disc by blocking the at least one position determining protrusion.

Claims (43)

1. A sample analysis apparatus comprising:

a disc configured to rotate on a rotation shaft and having at least one detection zone;

an optical sensing apparatus configured to detect a reaction result at the at least one detection zone;

at least one position determining protrusion provided on an exterior surface of the disc at a position corresponding to the at least one detection zone;

a slider disposed so as to be movable in a radial direction relative to the disc; and

a stopper mounted to the slider, and configured to stop rotation of the disc by blocking a rotational path of and contacting the at least one position determining protrusion.

2. The sample analysis apparatus of claim 1 , wherein:

the stopper is configured to stop the rotation of the disc at a position where the optical sensing apparatus is able to detect the at least one detection zone.

3. The sample analysis apparatus of claim 1 , wherein:

the disc comprises a first position determining protrusion located a first distance from the rotational shaft in a radial direction, and a second position determining protrusion located a second distance from the rotational shaft in a radial direction.

4. The sample analysis apparatus of claim 3 , wherein:

the at least one detection domain comprises a first detection zone corresponding to the first position determining protrusion and a second detection zone corresponding to the second position determining protrusion.

5. The sample analysis apparatus of claim 4 , wherein:

when the stopper stops the rotation of the disc by blocking the rotational path of the first position determining protrusion, the first detection zone is stopped at a position where the optical sensing apparatus is able to detect the first detection zone.

6. The sample analysis apparatus of claim 4 , wherein:

when the stopper stops the rotation of the disc by blocking the rotational path of the second position determining protrusion, the second detection zone is stopped at a position where the optical sensing apparatus is able to detect the second detection zone.

7. The sample analysis apparatus of claim 3 , wherein:

the slider is configured to move between the rotation shaft and an outer periphery of the disc.

8. The sample analysis apparatus of claim 1 , wherein:

the stopper comprises a securing portion configured to secure the at least one position determining protrusion.

9. The sample analysis apparatus of claim 1 , wherein:

the stopper comprises a cushion member disposed on a surface thereof that contacts the position determining protrusion.

10. The sample analysis apparatus of claim 1 , wherein:

the stopper comprises a grip unit configured to stop the position determining protrusion by pressing the position determining protrusion from opposite directions.

11. The sample analysis apparatus of claim 1 , wherein:

the slider comprises a stop detection unit configured to detect whether the position determining portion is stopped by the stopper.

12. The sample analysis apparatus of claim 11 , wherein:

the stop detection unit comprises a hinged stopper and is configured to determine whether the position determining protrusion is stopped by detecting movement of the hinged stopper.

13. The sample analysis apparatus of claim 11 , wherein:

the stop detection unit comprises a switch.

14. The sample analysis apparatus of claim 1 , wherein:

the slider comprises a position detection unit configured to detect whether the stopper is moved to a position capable of stopping the position determining protrusion.

15. The sample analysis apparatus of claim 14 , wherein:

the position detection unit comprises a light emitting portion, and a light receiving portion disposed opposite one another and such that the position determining protrusion will pass therebetween.

16. The sample analysis apparatus of claim 1 , wherein:

the optical sensing apparatus is mounted to the slider.

17. The sample analysis apparatus of claim 1 , wherein:

the optical sensing apparatus comprises a camera module configured to photograph the at least one detection zone.

18. A sample analysis apparatus comprising:

a disc configured to rotate on a rotation shaft and having at least one detection zone;

an optical sensor configured to detect the at least one detection zone;

at least one position determining protrusion provided on an exterior surface of the disc at a position corresponding to the at least one detection zone; and

a slider disposed to move between a rotational center of the disc and a external edge of the disc in a radial direction, and configured to block and contact the position determining protrusion to stop the disc at a desired position.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2022
From: SAMSUNG ELECTRONICS CO., LTD.
To: PRECISION BIOSENSOR INC.
Reel/Frame 060632/0598 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 27, 2012
From: KIM, HONG GEUN; KIM, DONG YOUNG; KIM, CHUNG UNG
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 029534/0511 →
Priority Claims (1)
KR 10-2011-0143340 · Dec 27, 2011 · national
Continuity (1)
Related Publication 20130164175A1 · Jun 27, 2013