IP Library Granted Patent US 8,994,031
Granted Patent B2
US 8,994,031 · App. 13/742,484 · Granted Mar 31, 2015

Gallium nitride compound semiconductor light emitting element and light source provided with said light emitting element

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Quick Facts
Patent No.
US 8,994,031
App. No.
13/742,484
Granted
Mar 31, 2015
Kind
B2
Abstract

In a gallium nitride based compound semiconductor light-emitting element including an active layer, the active layer includes a well layer 104 and a barrier layer 103 , each of which is a semiconductor layer of which the growing plane is an m plane. The well layer 104 has a lower surface and an upper surface and has an In composition distribution in which the composition of In changes according to a distance from the lower surface in a thickness direction of the well layer 104 . The In composition of the well layer 104 becomes a local minimum at a level that is defined by a certain distance from the lower surface and that portion of the well layer 104 where the In composition becomes the local minimum runs parallel to the lower surface.

Claims (25)

1. A gallium nitride based compound semiconductor light-emitting element comprising an active layer,

the active layer including a well layer and a barrier layer, each of the well layer and the barrier layer being a semiconductor layer which has an m plane as its growing plane, and

the well layer having a lower surface and an upper surface and having an In composition distribution in which the composition of In changes according to a distance from the lower surface in a thickness direction of the well layer, and

wherein the In composition of the well layer has a local minimum at a level that is defined by a certain distance from the lower surface and a portion of the well layer where the In composition has the local minimum runs parallel to the lower surface, and

the In composition of the well layer has a local minimum at multiple levels that are defined by multiple different distance from the lower surface and has a local maximum between those levels.

2. The gallium nitride based compound semiconductor light-emitting element of claim 1 , wherein the local minimum of the In composition is less than 90% of the local maximum of the In composition.

3. The gallium nitride based compound semiconductor light-emitting element of claim 1 , wherein the local maximum and the local minimum alternate with each other in a cycle that is defined by a thickness of 4 nm or less.

4. A gallium nitride based compound semiconductor light-emitting element comprising an active layer,

the active layer including a well layer and a barrier layer, each of the well layer and the barrier layer being a semiconductor layer which has an m plane as its growing plane, and

the well layer including at least one dividing layer which divides the well layer into multiple partial layers, and

wherein the In composition of the dividing layer is less than 90% of the In composition of the partial layers.

5. The gallium nitride based compound semiconductor light-emitting element of claim 4 , wherein the dividing layer divides the well layer so that the partial layers each have a thickness of 3 nm or less.

6. The gallium nitride based compound semiconductor light-emitting element of claim 4 , wherein the dividing layer is made of Al a In b Ga c N (where 0≦a≦1, 0≦b<1 and 0<c≦1).

7. The gallium nitride based compound semiconductor light-emitting element of claim 4 , wherein the dividing layer has a thickness of 0.3 nm to 0.8 nm.

8. The gallium nitride based compound semiconductor light-emitting element of claim 4 , wherein in the dividing layer, the average of the In composition at any of planes that are parallel to each other in the thickness direction is within ±10% of the average In composition of the entire dividing layer.

9. The gallium nitride based compound semiconductor light-emitting element of claim 1 , wherein the well layer is made of Al x In y Ga z N (where 0≦x<1, 0<y<1 and 0<z<1).

10. The gallium nitride based compound semiconductor light-emitting element of claim 1 , wherein the well layer has a thickness of 6 nm to 20 nm.

11. The gallium nitride based compound semiconductor light-emitting element of claim 1 , wherein the barrier layer has a thickness of 7 nm to 40 nm.

12. The gallium nitride based compound semiconductor light-emitting element of claim 1 , wherein the active layer has a multiple quantum well structure.

13. The gallium nitride based compound semiconductor light-emitting element of claim 1 , wherein the active layer includes the well layers and the barrier layers arranged between the well layers.

14. The gallium nitride based compound semiconductor light-emitting element of claim 1 , wherein the local minimum level is different from a level in the well layer at which the probability of radiative recombination of carriers is the highest.

15. A light source comprising:

the gallium nitride based compound semiconductor light-emitting element of claim 1 ; and

a wavelength changing section which includes a phosphor that changes the wavelength of light emitted from the gallium nitride based compound semiconductor light-emitting element.

16. The gallium nitride based compound semiconductor light-emitting element of claim 4 , wherein the dividing layer is different from a level in the well layer at which the probability of radiative recombination of carriers is the highest.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE ERRONEOUSLY FILED APPLICATION NUMBERS 13/384239, 13/498734, 14/116681 AND 14/301144 PREVIOUSLY RECORDED ON REEL 034194 FRAME 0143. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Dec 24, 2020
From: PANASONIC CORPORATION
To: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Reel/Frame 056788/0362 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 10, 2014
From: PANASONIC CORPORATION
To: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Reel/Frame 034194/0143 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 19, 2014
From: KATO, RYOU; YOSHIDA, SHUNJI; YOKOGAWA, TOSHIYA
To: PANASONIC CORPORATION
Reel/Frame 032001/0283 →