IP Library Granted Patent US 8,726,110
Granted Patent B2
US 8,726,110 · App. 13/765,194 · Granted May 13, 2014

Separate dies with interfaces and selection circuitry connected by leads

Inventor: Lee D. Whetsel (Parker, TX)
Assignee: Texas Instruments Incorporated
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Quick Facts
Patent No.
US 8,726,110
App. No.
13/765,194
Granted
May 13, 2014
Kind
B2
Abstract

An IC includes an IEEE 1149.1 standard test access port (TAP) interface and an additional Off-Chip TAP interface. The Off-Chip TAP interface connects to the TAP of another IC. The Off Chip TAP interface can be selected by a TAP Linking Module on the IC.

Claims (14)

1. An integrated circuit, comprising:

A. a first die that includes:

i. a first interface having a TDI input signal lead, a TCK input signal lead, a TMS input signal lead, a TRST input signal lead, and a TDO output signal lead;

ii. a second interface having a TDI output signal lead, a TCK output signal lead, a TMS output signal lead, a TRST output signal lead, and a TDO input signal lead;

iii. first test access port circuitry having a TDI input, a TCK input, a TMS input, a TRST input, and a TDO output; and

iv. first selection circuitry connected to the first interface, the second interface, and the first test access port circuitry, the first selection circuitry selectively connecting the signals on the first interface leads of the first die with the second interface leads of the first die and the inputs and output of the first test access port circuitry;

C. a second die that is separate from the first die and that includes:

i. a third interface having a TDI input signal lead, a TCK input signal lead, a TMS input signal lead, a TRST input signal lead, and a TDO output signal lead;

ii. a fourth interface having a TDI output signal lead, a TCK output signal lead, a TMS output signal lead, a TRST output signal lead, and a TDO input signal lead;

iii. second test access port circuitry having a TDI input, a TCK input, a TMS input, a TRST input, and a TDO output; and

iv. second selection circuitry connected to the third interface, the fourth interface, and the second test access port circuitry, the second selection circuitry selectively connecting the signals on the third interface leads of the second die with the fourth interface leads, and the inputs and output of the second test access port circuitry; and

D. leads connecting the signals on the second interface with the signals of the third interface.

2. The integrated circuit of claim 1 in which the first selection circuitry is linking module circuitry and the second selection circuitry is linking module circuitry.

3. The integrated circuit of claim 1 in which the first die and the second die are formed next to one another on the same substrate.

Continuity (8)
Division 13370521 · Feb 10, 2012
Division 13246251 · Sep 27, 2011
Division 12899992 · Oct 7, 2010
Division 12642222 · Dec 18, 2009
Division 12021582 · Jan 29, 2008
Division 10928239 · Aug 27, 2004
Provisional Application 60498636 · Aug 28, 2003
Related Publication 20130151916A1 · Jun 13, 2013