Programming method of nonvolatile memory device
View Patent ↗Provided is a programming method of a nonvolatile memory device which includes a plurality of strings each including a source select transistor, a plurality of memory cells, and a drain select transistor which are connected in series between a common source line and a bit line. The programming method includes: applying a first voltage to the common source line during a first period in which a channel of a plurality of memory cells of an unselected string is floated; and applying a second voltage increased more than the first in voltage to the common source line during a second period in which a selected memory cell is programmed, when a selected word line belongs to a word line group adjacent to the common source line.
1. A programming method for a nonvolatile memory device that includes a plurality of strings, each including a source select transistor, a plurality of memory cells, and a drain select transistor that are connected in series between a common source line and a bit line, the programming method comprising:
applying a first voltage to the common source line during a first period in which a channel of a plurality of memory cells of an unselected string is floated;
applying a second voltage to an unselected bit line during the first period;
applying, when a selected word line belongs to a first word line group adjacent to the common source line, a third voltage that is greater than the first voltage to the common source line during a second period in which a selected memory cell is programmed; and
applying, when the selected word line belongs to a second word line group adjacent to the bit line, a fourth voltage that is greater than the second voltage to the unselected bit line during the second period.
2. The programming method of claim 1 , where the second period comprises:
a program voltage application period in which a program voltage is applied to the selected word line,
the third voltage is applied to the common source line during the program voltage application voltage, and
the fourth voltage is applied to the unselected bit line during the program voltage application voltage.
3. The programming method of claim 1 , where the second period comprises:
a pass voltage application period in which a pass voltage is applied to the selected word line, and
a program voltage application period in which a program voltage is applied to the selected word line, and
where the third voltage is applied to the common source line during the program voltage application period, and
where the fourth voltage is applied to the unselected bit line during the program voltage application period.
4. The programming method of claim 3 , where the third voltage is applied to the common source line during the pass voltage application period, and
the fourth voltage is applied to the unselected bit line during the pass voltage application period.
5. The programming method of claim 1 , where the first word line group comprises:
one or more word lines arranged from a side that is closest to the common source line, and
the second word line group comprises one or more word lines arranged from a side which is the most adjacent to the bit line.
6. The programming method of claim 5 , wherein the first and second word line groups are set independently of each other.
7. The programming method of claim 1 , where the first word line group is divided into first to Nth sub-groups arranged from a side that is closest to the common source line, where N is a natural number equal to or more than one,
where each of the first to Nth sub-groups comprises one or more word lines, and
where the magnitude of the third voltage decreases from the first sub-group to the N-th sub-group among the sub-groups to which the selected word line belongs.
8. The programming method of claim 1 , where the second word line group is divided into first to M-th sub-groups arranged from a side which is the most adjacent to the bit line where M is a natural number equal to or more than one,
where each of the first to M-th sub-groups comprises one or more word lines, and
where the magnitude of the fourth voltage decreases from the first sub-group to the M-th sub-group, among the sub-groups to which the selected word line belongs.