Disk drive destabilizing magnetization of test pattern using head laser to enhance defect detection
View Patent ↗A disk drive is disclosed comprising a head actuated over a disk, wherein the head comprises a write element, a read element, and a laser operable to heat the disk while writing data to the disk. The disk is magnetized by writing a first test pattern to the disk using the write element and a first power applied to the laser. The magnetization of the first test pattern is destabilized by heating the disk using a second power applied to the laser, wherein the second power is less than the first power. After destabilizing the magnetization of the first test pattern, the first test pattern is read with the read element to generate a read signal, and the read signal is evaluated to detect a defect on the disk.
1. A disk drive comprising:
a disk;
a head actuated over the disk, wherein the head comprises a write element, a read element, and a laser operable to heat the disk while writing data to the disk; and
control circuitry operable to:
magnetize the disk by writing a first test pattern to the disk using the write element and a first power applied to the laser;
destabilize the magnetization of the first test pattern by heating the disk using a second power applied to the laser, wherein the second power is less than the first power;
after destabilizing the magnetization of the first test pattern, read the first test pattern with the read element to generate a read signal; and
evaluate the read signal to detect a defect on the disk.
2. The disk drive as recited in claim 1 , wherein destabilizing the magnetization of the first test pattern further comprises applying a magnetic field to the disk using the write element.
3. The disk drive as recited in claim 2 , wherein destabilizing the magnetization of the first test pattern comprises applying the magnetic field to the disk at a lower strength than when writing the test pattern to the disk.
4. The disk drive as recited in claim 2 , wherein destabilizing the magnetization of the first test pattern comprises writing a second test pattern over the first test pattern.
5. The disk drive as recited in claim 4 , wherein the second test pattern is different in phase from the first test pattern.
6. The disk drive as recited in claim 1 , wherein the control circuitry is further operable to:
first destabilize the magnetization of the first test pattern by heating the disk using a second power applied to the laser, wherein the second power is less than the first power;
after first destabilizing the magnetization of the first test pattern, first read the first test pattern to generate a first read signal and evaluate the first read signal to detect a first defect on the disk;
second destabilize the magnetization of the first test pattern by heating the disk using a third power applied to the laser, wherein the third power is greater than the second power; and
after second destabilizing the magnetization of the first test pattern, second read the first test pattern to generate a second read signal and evaluate the second read signal to detect a second defect on the disk.
7. The disk drive as recited in claim 6 , wherein the control circuitry is further operable to rewrite the first test pattern to the disk using the write element and the first power applied to the laser prior to second destabilizing the magnetization of the first test pattern.
8. A method of operating a disk drive comprising a head actuated over a disk, wherein the head comprises a write element, a read element, and a laser operable to heat the disk while writing data to the disk, the method comprising:
magnetizing the disk by writing a first test pattern to the disk using the write element and a first power applied to the laser;
destabilizing the magnetization of the first test pattern by heating the disk using a second power applied to the laser, wherein the second power is less than the first power;
after destabilizing the magnetization of the first test pattern, reading the first test pattern with the read element to generate a read signal; and
evaluating the read signal to detect a defect on the disk.
9. The method as recited in claim 8 , wherein destabilizing the magnetization of the first test pattern further comprises applying a magnetic field to the disk using the write element.
10. The method as recited in claim 9 , wherein destabilizing the magnetization of the first test pattern comprises applying the magnetic field to the disk at a lower strength than when writing the test pattern to the disk.
11. The method as recited in claim 9 , wherein destabilizing the magnetization of the first test pattern comprises writing a second test pattern over the first test pattern.
12. The method as recited in claim 11 , wherein the second test pattern is different in phase from the first test pattern.
13. The method as recited in claim 8 , further comprising:
first destabilizing the magnetization of the first test pattern by heating the disk using a second power applied to the laser, wherein the second power is less than the first power;
after first destabilizing the magnetization of the first test pattern, first reading the first test pattern to generate a first read signal and evaluating the first read signal to detect a first defect on the disk;
second destabilizing the magnetization of the first test pattern by heating the disk using a third power applied to the laser, wherein the third power is greater than the second power; and
after second destabilizing the magnetization of the first test pattern, second reading the first test pattern to generate a second read signal and evaluating the second read signal to detect a second defect on the disk.
14. The method as recited in claim 13 , further comprising rewriting the first test pattern to the disk using the write element and the first power applied to the laser prior to second destabilizing the magnetization of the first test pattern.