Method and system for providing ultrapure water
View Patent ↗A method and system of providing ultrapure water for semiconductor fabrication operations is provided. The water is treated by utilizing a free radical scavenging system and a free radical removal system. The free radical scavenging system can utilize actinic radiation with a free radical precursor compound, such as ammonium persulfate. The free radical removal system can comprise use of a reducing agent. The ultrapure water may be further treated by utilizing ion exchange media and degasification apparatus. A control system can be utilized to regulate addition of the precursor compound, the intensity of the actinic radiation, and addition of the reducing agent to the water.
1. A method of treating water comprising:
providing a water to be treated having a total organic carbon (TOC) value of less than about 50 ppb;
measuring the TOC value of the water to be treated;
introducing persulfate anions to the water to be treated based in part on at least one input signal of the measured TOC value of the water to be treated;
introducing the water containing persulfate anions to a primary reactor;
exposing the persulfate anions in the water to ultraviolet light in the reactor to produce an irradiated water stream;
adjusting an intensity of the ultraviolet light based in part on at least one of an input signal selected from the group consisting of a TOC value of the water to be treated, a persulfate value of the water downstream of the reactor, and a rate of addition of persulfate anions; and
introducing a reducing agent to the irradiated water stream to reduce or neutralize residual persulfate in the irradiated water stream.
2. The method of claim 1 , further comprising exposing the irradiated water stream to ultraviolet light in a secondary reactor located downstream of the primary reactor.
3. The method of claim 1 , further comprising removing dissolved solids and dissolved gases from the irradiated water stream.
4. The method of claim 1 , further comprising removing ionic compounds from the water to be treated prior to measuring the TOC value of the water to be treated.
5. The method of claim 1 , further comprising measuring a concentration of reducing agent in the irradiated water stream down to a level that is less than 1 ppm.
6. The method of claim 1 , wherein the reducing agent is sulfur dioxide.
7. A method of providing ultrapure water to a semiconductor fabrication unit, comprising:
providing inlet water having a TOC value of less than about 25 ppb;
measuring the TOC value of the inlet water;
introducing persulfate anions into the inlet water at a rate of addition based at least partially on the TOC value of the inlet water and exposing the persulfate anions to ultraviolet light to convert the persulfate anions into persulfate radical species;
introducing the persulfate radical species to the inlet water to produce treated water having a TOC value that is less than the TOC value of the inlet water;
reducing or neutralizing residual persulfate anions in the treated water to produce the ultrapure water;
removing at least a portion of any particulates from the ultrapure water; and
delivering at least a portion of the ultrapure water to the semiconductor fabrication unit.
8. The method of claim 7 , further comprising measuring a concentration of the persulfate anions in the ultrapure water.
9. The method of claim 7 , wherein the ultrapure water comprises less than 1 ppb TOC.
10. The method of claim 8 , wherein reducing or neutralizing residual persulfate anions in the ultrapure water includes introducing a reducing agent to the ultrapure water after measuring a concentration of the persulfate anions in the ultrapure water.
11. The method of claim 10 , further comprising measuring a concentration of the reducing agent in the ultrapure water down to a level that is less than 1 ppm.
12. The method of claim 10 , wherein the reducing agent is sulfur dioxide.
13. The method of claim 1 , further comprising measuring a concentration of persulfate in the irradiated water stream.
14. The method of claim 13 , wherein measuring the concentration of persulfate in the irradiated water stream comprises measuring a first conductivity of the irradiated water stream, irradiating the irradiated water stream, and measuring a second conductivity of the irradiated water stream.
15. The method of claim 5 , wherein measuring the concentration of reducing agent in the irradiated water stream comprises measuring a first conductivity of the irradiated water stream, irradiating the irradiated water stream, and measuring a second conductivity of the irradiated water stream.
16. The method of claim 1 , wherein the irradiated water stream comprises less than 1 ppb TOC.
17. The method of claim 1 , further comprising delivering the irradiated water to a semiconductor fabrication unit.
18. The method of claim 1 , wherein the water to be treated has a flow rate that fluctuates from about 400 gpm to about 1900 gpm.
19. The method of claim 1 , wherein the TOC value of the water to be treated fluctuates over time and is in a range of from about 0.5 ppb to about 50 ppb.
20. The method of claim 15 , further comprising introducing the reducing agent to the irradiated water stream based on the measured reducing agent concentration.