Disk drive adjusting digital phase locked loop over sector data with frequency induced phase error measured over preamble
View Patent ↗A disk drive is disclosed comprising a head actuated over a disk comprising a sector including a periodic pattern and sector data. The sector is read with the head to generate a read signal which is sampled at a sampling frequency with a signal sampler to generate signal samples. The signal samples representing the periodic pattern are processed to measure a frequency induced phase error based on kδ where k represents a signal sample index and δ is a fraction of 2π. The signal samples representing the sector data are processed to generate a data phase error. The data phase error is adjusted in response to the frequency induced phase error to generate an adjusted data phase error, and the signal sampler is controlled in response to the adjusted data phase error.
1. A disk drive comprising:
a disk comprising a sector comprising a periodic pattern and sector data;
a head actuated over the disk; and
control circuitry comprising a signal sampler, the control circuitry operable to:
read the sector with the head to generate a read signal;
sample the read signal at a sampling frequency with the signal sampler to generate signal samples;
process the signal samples representing the periodic pattern to measure a frequency induced phase error based on kδ, where k represents a signal sample index and δ is a fraction of 2π;
process the signal samples representing the sector data to generate a data phase error;
adjust the data phase error in response to the frequency induced phase error to generate an adjusted data phase error; and
control the signal sampler in response to the adjusted data phase error.
2. The disk drive as recited in claim 1 , wherein the control circuitry is further operable to:
interpolate a reference clock to generate an interpolated sample clock in response to the adjusted data phase error; and
control the signal sampler in response to the interpolated sample clock.
3. The disk drive as recited in claim 2 , wherein the control circuitry is operable to generate the adjusted data phase error by adding the frequency induced phase error to the data phase error.
4. The disk drive as recited in claim 2 , wherein:
δ
=
-
Δ
1
+
Δ
where Δ represents a frequency error between a frequency f 0 of the periodic pattern and a reference sampling frequency f 1 of the reference clock.
5. The disk drive as recited in claim 4 , wherein the control circuitry is further operable to process the signal samples representing the periodic pattern to measure the frequency induced phase error by at least:
measuring a first phase error φ e (k−1) at signal sample index k−1;
measuring a second phase error φ e (k) at signal sample index k; and
computing a value ξ(k) based on a difference between the first and second phase errors.
6. The disk drive as recited in claim 5 , wherein the control circuitry is further operable to integrate the values ζ(k) to generate δ(k).
7. The disk drive as recited in claim 5 , wherein the control circuitry is further operable to measure the second phase error φ e (k) at signal sample index k based at least partly on:
φ
e
(
k
)
=
ϕ
k
-
ϕ
k
-
1
2
π
(
1
+
(
k
-
1
)
·
δ
)
where φ k represents a phase estimate of one of the signal samples of the periodic pattern at signal sample index k.
8. The disk drive as recited in claim 7 , wherein the control circuitry is further operable to generate:
ϕ
k
=
-
tan
-
1
[
Y
1
Y
0
]
ϕ
k
-
1
=
-
tan
-
1
[
Y
0
Y
1
]
where Y 0 represents accumulated even-indexed signal samples of the periodic pattern and Y 1 represents accumulated odd-indexed signal samples of the periodic pattern.
9. A method of operating a disk drive comprising a head actuated over a disk comprising a sector comprising a periodic pattern and sector data, the method comprising:
reading the sector with the head to generate a read signal;
sampling the read signal at a sampling frequency with a signal sampler to generate signal samples;
processing the signal samples representing the periodic pattern to measure a frequency induced phase error based on kδ, where k represents a signal sample index and δ is a fraction of 2π;
processing the signal samples representing the sector data to generate a data phase error;
adjusting the data phase error in response to the frequency induced phase error to generate an adjusted data phase error; and
controlling the signal sampler in response to the adjusted data phase error.
10. The method as recited in claim 9 , further comprising:
interpolating a reference clock to generate an interpolated sample clock in response to the adjusted data phase error; and
controlling the signal sampler in response to the interpolated sample clock.
11. The method as recited in claim 10 , further comprising generating the adjusted data phase error by adding the frequency induced phase error to the data phase error.
12. The method as recited in claim 10 wherein:
δ
=
-
Δ
1
+
Δ
where Δ represents a frequency error between a frequency f 0 of the periodic pattern and a reference sampling frequency f 1 of the reference clock.
13. The method as recited in claim 12 , further comprising processing the signal samples representing the periodic pattern to measure the frequency induced phase error by at least:
measuring a first phase error φ e (k−1) at signal sample index k−1;
measuring a second phase error φ e (k) at signal sample index k; and
computing a value ξ(k) based on a difference between the first and second phase errors.
14. The method as recited in claim 13 , further comprising integrating the values ξ(k) to generate δ(k).
15. The method as recited in claim 13 , further comprising measuring the second phase error φ e (k) at signal sample index k based at least partly on:
φ
e
(
k
)
=
ϕ
k
-
ϕ
k
-
1
2
π
(
1
+
(
k
-
1
)
·
δ
)
where φ k represents a phase estimate of one of the signal samples of the periodic pattern at signal sample index k.
16. The method as recited in claim 15 , further comprising generating:
ϕ
k
=
-
tan
-
1
[
Y
1
Y
0
]
ϕ
k
-
1
=
-
tan
-
1
[
Y
0
Y
1
]
where Y 0 represents accumulated even-indexed signal samples of the periodic pattern and Y 1 represents accumulated odd-indexed signal samples of the periodic pattern.